IBIS Datasheet Checklist version 1.1, 05/07/01 ------------------------ IBIS datasheet: Component manufacturer: Component part number: Engineer verifying this component: Email address: Behavioral simulator and version: Date: Note: If answer is N or N/A, provide explanation. The user may verify items 1-9 but is unable to verify items 10-20 because the data involved are only available to the semiconductor vendor. ___ 1. Does the IBIS datasheet pass the IBIS syntax checker? (Note: Some models generate warnings for non-monotonicities that are actually part of the characteristics of the device. Other non- monotonicities are so small as to be irrelevant.) ___ 2. Is an "I/O Buffer Accuracy Report" available for this component? (http://www.vhdl.org/pub/ibis/accuracy) ___ 3. Has the modeling engineer performed a visual inspection of IV and VT curves to screen for non-monotonicity, discontinuities, and other obvious errors? ___ 4. Has the modeling engineer tested the IBIS datasheet using a behavioral simulator? ___ 5. Do MIN and MAX data exist for all keywords and sub-parameters? ___ 6. Does the IBIS datasheet include all four 50 Ohm VT tables as described in the IBIS Cookbook? ___ 7. Do the keywords Cref, Rref, Vref, and Vmeas match the values specified in the component datasheet for all output and bidirectional models? ___ 8. Does the output reach Vmeas under standard load conditions for rising and falling waveforms? ___ 9. Does the pin table match the component datasheet? ___ 10. Do the keywords Vihl and Vinh represent the unity gain points derived from the dc transfer characteristics for all inputs? ___ 11. Has the modeling engineer verified the accuracy of the C_comp subparameter? ___ 12. Has the modeling engineer verified the accuracy of the R_pkg, L_pkg, and C_pkg subparameters? ___ 13. For CMOS logic, do all MAX data represent maximum voltage, minimum temperature, and fast process? ___ 14. For CMOS logic, do all MIN data represent minimum voltage, maximum temperature, and slow process? ___ 15. For bipolar logic, do all MAX data represent maximum voltage, maximum temperature, and fast process? ___ 16. For bipolar logic, do all MIN data represent minimum voltage, minimum temperature, and slow process? ___ 17. Do the keywords dV/dt_r and dV/dt_f contain the correct 20%-80% edge rate data measured using a 50 & load as specified in IBIS? ___ 18. If the I/O buffer employs dynamic clamping, does the IBIS datasheet contain the appropriate keywords and subparameters? ___ 19. If the I/O buffer employs a multi-stage driver, does the IBIS datasheet contain the appropriate keywords and subparameters? ___ 20. If the I/O buffer design employs dynamic edge rate control, dynamic impedance control, or any form of feedback, has the modeling engineer assessed the impact of this circuitry on behavioral model accuracy? Greg Edlund Electrical Packaging IBM Server Technology Development 3605 Hwy. 52 N, Dept. HDC Rochester, MN 55901 gedlund@us.ibm.com