Re: Rising Waveform Loading Effects

From: Brock Hannibal <brockh@mdhost.cse.tek.com>
Date: Fri Oct 25 1996 - 13:43:49 PDT

Hi all,

Let me add a thought. Ed Boeckman asks:

"I hope someone can help me to understand how the IBIS models will
accurately produce the correct physical response with an arbitrary but
realistic loading condition, different from the test fixture, at least
to a level of accuracy close to that which would result from the
original transistor level spice model, say within 5%."

I've found that board level simulation accuracy is difficult to quantify
as a percentage number. There are a number of contributing factors such
as etch width and thickness variations along the length of the interconnect
line, cross-section variations(dielectric thickness), dielectric constant
variation with frequency, humidity, temperature, etc. Most FR-4 type boards
are themselves about 10% components. Holding the boards to a tighter tolerance
is both expensive and difficult.

It turns out that if the IBIS model is derived into a nominal resistive
load that is representative of the transmission line characteristic
impedance that the dominant effect in the simulation is usually the
transmission line formed by the interconnect.

I have verified this by actual measurement in a number of cases. This is
not to say that the model is irrelevant, only that the model's
output impedance curves and risetimes are not as critical as one might
think in predicting the performance of the system.

Brock Hannibal
Design Engineer
Tektronix, Inc.
Received on Fri Oct 25 13:55:12 1996

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