Re: Re[2]: IBIS Open Forum 1/6/95 Meeting Minutes

From: C. Kumar <cpk@cadence.com>
Date: Tue Jan 17 1995 - 11:04:03 PST

By standard load, I waa trying to indicate the following.

The ac v-t specifications include loads under whcih the measurements were taken.
So if the siumulations reproduce the v-t behavior at those load conditions then
they are self verifying and are pracically meaningful.

For a practically meaningful v-i verification, we have to drive a reference load with the
device and then compare the resulting v-t with some reference waveform. What is a useful refernce load. Is it daisy chain transmission line with ten loads? Or is it a simple capacitor? In the past we have been unable to come to agreement on identifying both the reference load and waveforms.

This is what I meant by refernce loads for v-i verification.
>
> Kumar,
>
> I am still not sure what you mean by "standard load". When you do a voltage
> sweep on a device, you are forcing the voltage while you are measuring the
> current. When yo do this sweep, you are actually "loading" the device with the
> voltage source. You can look at that voltage source as an ideal, 0 Ohm source
> or as a Thevenin combination of an ideal source with a series resistor. Either
> way, you are sweeping between a certain voltage range at the output of the
> device to get an I-V curve, regardless of what R is in your Thevenin circuit.
> Your I-V curve will be the same whether R in the Thevenin circuit is small or
> large. You will just have to increase the sweep range of the voltage source
> inside the Thevenin circuit for larger R values to get the same sweep range at
> the pin of the device.
>
> What is the probelem? Am I missing something obvious?
>
> Arpad
>
> ------------------------------------------------------------------------------
>
> The problem with I-V checking is that there is no "standard" load as
> with V-T curves. We already went through this i-v standard load discussion
> and dropped it because
> of controvorsey. The reason I raised it because that I think that in
> signal integrity situations the dc I-V characteristic has more has a dominant
> effect on the resulting waveforms and we have no reference to check against.
>
> >
> > Hello IBIS gurus,
> >
> > In the last minutes Kumar suggested DC checking (see quote below). I am not
> > sure what he means, but just as we can use V-T tables for AC checking,
> couldn't
> > the I-V curves be used for DC checking?
> >
> > Arpad
> > Intel Corporation
> >
> >
> > > Compliance
> > > Will pointed out that the V/T table can be used to as a type of compliance
> > > test/sanity check. Kumar would like to see a DC check as well.
> >
> > > AR Kumar: Post an EGG for DC checking.
> >
> >
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> > Subject: IBIS Open Forum 1/6/95 Meeting Minutes
> > To: Randy_L_Wilhelm@ccm.fm.intel.com, Jerry_Budelman@ccm2.jf.intel.com,
> > bWard@neosoft.com, IBIS@vhdl.org
> > Message-Id: <950113103507_2@ccm.hf.intel.com>
> > From: Derrick Duehren <Derrick_Duehren@ccm2.jf.intel.com>
> > Date: Fri, 13 Jan 95 10:35:07 PST
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> Subject: Re: IBIS Open Forum 1/6/95 Meeting Minutes
> To: ibis@vhdl.org, Arpad_Muranyi@ccm.fm.intel.com
> Message-Id: <9501171455.AA14781@hot>
> From: cpk@cadence.com (C. Kumar)
> Date: Tue, 17 Jan 95 09:55:15 -0500
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Received on Tue Jan 17 11:09:12 1995

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