CONTENT OF THE EIA IBIS OPEN FORUM SUMMIT MEETING
February 4, 2010
Santa Clara, California

   .zip  Compressed
   .ppt  Power Point
   .doc  Word
   .ps   Postscript
   .pdf  Acrobat
   .txt  Text

ADMINISTRATIVE DOCUMENTS:

00readme.txt    This Document
a020410.txt     Agenda
agenda.pdf      Agenda at meeting
m020410.pdf     Minutes


PRESENTATIONS AND ACTUAL TITLES (IN ACTUAL ORDER OF PRESENTATION):

ross.zip        IBIS Activites and Future Projects  (.ppt)
ross.pdf        Bob Ross, Teraspeed Consulting Group
 
green.pdf       Top 10 Issues As Seen During IBIS Model Reviews
                Lynne Green, Greenstreak Programs

haque.pdf       IBIS Quality Checklist Rev. 2.0
                Moshiul Haque and Randy Wolff, Micron Technology
                (Presented by Randy Wolff, Micron Technology)

wang.pdf        Pin-Pair Oriented Extraction Method for Differential
                Pair IBIS Modeling
                Lance Wang, IO Methodology
             
wolff.pdf       Signal Loop Inductance in [Pin] and [Package Model]
                Randy Wolff, Micron Technology

brim.pdf        An Introduction to Model Connection Protocols
                Brad Brim, Sigrity

shlepnev.zip    Quality Metrics for S-parameter Models (.ppt)
shlepnev.pdf    Yuriy Shlepnev, Simberian

choi.pdf        SI/PI Co-Analysis and Linearity Indicator
                Myoung Joon Choi and Vishram Pandit, Intel Corporation

muranyi.pdf     IBIS-ATM Task Group Report
                Arpad Muranyi, Mentor Graphics Corporation.
westerhoff.pdf  Predicting BER with IBIS-AMI: Experiences Correlating
                SerDes Simulations and Measurement
                Todd Westerhoff*, Adge Hawes**, Michael Steinberger*,
                Kent Dramstad**, Walter Katz*, Barry Katz*,
                *Signal Integrity Software (SiSoft), and **IBM
                (Presented by Adge Hawes** and Todd Westerhoff*, **IBM
                and *SiSoft)

hawes.pdf       Conditional Expressions in IBIS-AMI
                Adge Hawes, IBM

muranyi.pdf     Growing Pains with IBIS-AMI Modeling
                Arpad Muranyi, Mentor Graphics Corporation.