AGENDA EUROPEAN IBIS SUMMIT MEETING
                         Concorde-Lafayette Hotel
                              Paris, France
			    February 26, 1998

 8:30   REFRESHMENTS

 9:00   Welcome, IBIS Activities
        Bob Ross, Interconnectix/Mentor Graphics, USA 
       
 9:25   IBIS Users Group
        Paul Galloway, Cadence, USA

 9:45   Use of IBIS in Alcatel
        John Fitzpatrick, Alcatel, France

 10:25  IBIS Model Development at National Semiconductor Corporation
        Syed Huq, National Semiconductor, USA
 
 10:45  BREAK

 11:00  IBIS Models, Spice vs. Measurement
        Tom Dagostino, Zeelan Technology/Mentor Graphics, USA
 
 11:30  Required IBIS Enhancements
        Gerald Bannert, Siemens, Germany
	       
 12:00  Challenges in Using IBIS in High Frequency Applications
        Prakash Radhakrishnan, Intel, USA                  

 12:30  LUNCH

 13:30  IBIS Models and EMC Simulation Standardization Status
        Christian Marot, Siemens, France
                         
 14:00  Future Component Characterization for EMI Analysis
        Werner Rissiek, Incases, Germany

 14:30  IBIS Models for EMC and High-Frequency Devices
        Razvan Ene, High Design Technology, Italy

 15:15  BREAK

 15:30  SI-Analysis with HSPICE Based on IBIS Behavioral Models
        Bernhard Unger, Siemens, Germany

 16:00  Problems in V-T Curve Modeling and Simulation
        C. Kumar, Cadence, USA

 16:30  BIRD42.3 Algorithm Considerations
        Bob Ross, Interconnectix/Mentor Graphics, USA

 16:45  GROUP DISCUSSION
        Technical Comments
        IBIS Usage Comments
        Questions About the EIA IBIS Open Forum
        Forming a European IBIS Users Group

 17:00  ADJOURN