(All .pdf presentations now compressed as .Z) (Unless noted, all uncompressed .ppt are remove and available as compressed .zip files) CONTENTS OF THE EUROPEAN IBIS OPEN FORUM SUMMIT MEETING March 16, 2001 Munich, Germany .zip Compressed .ppt Power Point .doc Word .ps Postscript .pdf Acrobat .txt Text ADMINISTRATIVE DOCUMENTS: 00readme.txt This Document a031601.txt Agenda m031601.txt Minutes (to be uploaded) poster.pdf European IBIS Summit Meeting Poster PRESENTATIONS AND ACTUAL TITLES (IN ACTUAL ORDER OF PRESENTATION): ----------- ross.zip/pdf.Z IBIS PROGRAM TODAY (.ppt) Bob Ross (Mentor Graphics, USA) lenski.zip/pdf.Z EXPERIENCES WITH AND TIPS FOR IBIS MODELS (.ppt) Eckhard Lenski (Siemens AG, Germany) berrie.zip/pdf.Z EXTRACTION OF KEY IBIS PARAMETERS FOR EASIER MODEL SELECTION (.ppt) John Berrie (Zuken, England) and Michael Schaeder (Zuken, Germany) Presented by John Berrie (Zuken, England) pichlmaier.zip/pdf.Z DOGEN, A SIEMENS INTERNAL MODEL TOOL, EXTENSIONS 1999 - 2001 (.ppt) Hans Pichlmaier (Siemens AG, Germany) hegazy.zip/pdf.Z LVDS MODELING (.ppt) (With updates presented at the European IBIS Summit) Hazem Hegazy and Mohammed Korany (Mentor Graphics, Egypt) Presented by Mohammed Korany (Mentor Graphics, Egypt) unger.zip/pdf.Z SSTL_2 Modeling Experiences (.ppt) Bernhard Unger (Siemens AG, Germany) maurer.zip/pdf.Z CAN BUS MODELING (.ppt) Manfred Maurer and Bernhard Unger (Siemens AG, Germany), Friedrich Haslinger (BMW Group, Germany) Presented by Manfred Maurer (Siemens AG, Germany) sicard.zip/pdf.Z EMC MODEL FOR PREDICTION OF PARASITIC EMISSION (.ppt) Etienne Sicard (National Institute of Applied Science, France) marot.zip/pdf.Z INTEGRATED CIRCUITS MODELING, ELECTRO MAGNETIC COMPATIBILITY SIMULATION ON PRINTED CIRCUIT BOARD (.ppt) Christian Marot, Siemens, France perrin.zip/pdf.Z INTEGRATED CIRCUITS MODELING, ICEM, INTEGRATED CIRCUITS ELECTROMAGNETIC MODEL, PROPOSAL: IEC62014-3 (.ppt) Jean Claude Perrin (Texas Instruments, France) and Claude Huet (EADS Airbus Industry (Aerospatiale), France) Presented by Jean Claude Perrin (Texas Instruments, France) faferko.zip/pdf MODELLING OF GROUND-NOISE FOR CIRCUITS WITH SHORT-CHANNEL TRANSISTORS (.pdf) Mariusz Faferko (Fraunhofer Institute Reliability and Microintegration (Germany) kralicek.zip/pdf AN ELECTROMAGNETIC EMMISSION MODEL FOR INTEGRATED CIRCUITS (.pdf) Peter Kralicek (Fraunhofer Institute Reliability and Microintegration (Germany) bannert.zip/pdf.Z POINTS OF VIEW FOR HIGH FREQUENCY IBIS MODELS (.ppt) Gerald Bannert (Siemens AG, Germany) peters.zip/pdf.Z IBIS-X and the IBIS Macro Language (.ppt) Stephen Peters and Arpad Muranyi (Intel, USA) Presented by Arpad Muranyi (Intel, USA)