EUROPEAN IBIS SUMMIT MEETING
                           Astron Hotel/Neue Messe
                  Eggenfeldener Strasse 100, Munich Germany
                               MARCH 16, 2001

8:30    REFRESHMENTS

9:00    INTRODUCTIONS AND PROGRAM
        Bob Ross, Mentor Graphics, USA 

9:30    Experiences with and Tips for IBIS Models
        Eckhard Lenski, Siemens AG, Germany

10:00   Extraction of Key IBIS Parameters for Easier Model Selection
        John Berrie, Zuken, England and Michael Schaeder, Zuken Germany

10:30   BREAK

10:45   DOGEN, A Siemens Internal Model Tool, Extensions 1999 - 2001
        Hans Pichlmaier, Siemens AG, Germany

11:15   LVDS Modeling
        Hazem Hegazy and Mohammed Korany, Mentor Graphics, Egypt

12:00   LUNCH

13:00   SSTL-2 Modeling Experiences
        Bernhard Unger, Siemens AG, Germany

13:30   CAN (Controller Area Network) Bus Modeling
        Manfred Maurer, Siemens AG, Germany

14:00   Parasitic IC Emission Modeling
        Etienne Sicard, National Institute of Applied Science, France

14:30   EMC Models
        Christian Marot, Siemens, France

14:45   EMC Standardization Progress
        Jean Claude Perrin, Texas Instruments, France

15:00   BREAK

15:15   Modelling of Ground-Noise for Circuits with Short-Channel Transistors
        Mariusz Faferko, Fraunhofer Institute Reliability and
        Microintegration, Germany

15:45   An Electromagnetic Emission Model for Integrated Circuits
        Peter Kralicek, Fraunhofer Institute Reliability and
        Microintegration, Germany

16:15   Points of View for High Frequency IBIS Models
        Gerald Bannert, Siemens AG, Germany
  
16:30   IBIS-X and the IBIS Macro Language
        Stephen Peters and Arpad Muranyi, Intel, USA

16:55   CONCLUDING ITEMS
        Bob Ross, Mentor Graphics, USA 

17:00   END