CONTENT OF THE IBIS OPEN FORUM SUMMIT MEETING
May 12, 2010
Hildesheim, Germany

   .zip  Compressed
   .ppt  Power Point
   .doc  Word
   .ps   Postscript
   .pdf  Acrobat
   .txt  Text

ADMINISTRATIVE DOCUMENTS:

00readme.txt    This Document
a051210.txt     Agenda
m051210.pdf     Minutes
 
PRESENTATIONS AND ACTUAL TITLES (IN ACTUAL ORDER OF PRESENTATION):

agenda.pdf     Meeting Agenda

ross.zip       IBIS Activities (.ppt)
ross.pdf       Bob Ross, Teraspeed Consulting Group (USA)

klos.zip       IBIS Model Verification (.ppt)
klos.pdf       Hans Klos, Sintecs BV, The Netherlands

wang.pdf       More on C_comp: How to Represent C_comp in IBIS Buffer
               Model
               Lance Wang, IO Methodology, USA

giraldi.pdf    Enhanced M(pi)log Models for Power Integrity Analysis: Modeling
               from Simulation and Measurement, IBIS Data Extraction,
               Crossvalidation
               Antonio Girardi*, Igor Stievano**, Roberto Izzi*, T. Lessio*,
               Flavio Canavero**, Ivan Maio**, and Luca Rigazio**
               *Nymonyx and **Politecnico di Torino, Italy
               (Presented by Igor Stievano, Politecnico di Torino, Italy)

lenski.zip     IBIS [Driver Schedule] Modeling (.ppt)
lenski.pdf     Eckhard Lenski, Nokia "Siemens Networks, Germany

grivet-talocia.pdf
               Qualification of Tabulated Scattering Parameters
               Stefano Grivet-Talocia, Politecnico di Torino and
               IdemWorks, Italy

keshavan.pdf   IBIS-AMI and Modeling Recommendations
               Kumar Keshavan and Ken Willis, Sigriy, USA
               (Presented by Srdjan Djordjevic, Sigrity, Germany)

kirsanov.pdf   Matlab Co-simulation for IBIS-AMI Models
               Danil Kirsanov, Ansys, USA

badesha.pdf    Automating AMI Model-Generation using ESL
               (Electronic-System-Level) Design Flow
               Amolak Badesha*, Jose Luis Pino*, Manuel Luschas, and
               Antonis Orphanou**, *Agilent Technologies, and 
               **NetLogic Microsystems, USA
               (Presented by Amolak Badesh, Agilent Technologies, USA)