FILE: m051612.pdf
TITLE: Minutes
TYPE: .pdf
AUTHORLAST: 
AUTHORFIRST: 
COMPANY: IBIS Open Forum
DATE: May 16 2012
LOCATION: Sorrento, Italy

FILE: a051612.txt
TITLE: Agenda
TYPE: .txt
AUTHORLAST: 
AUTHORFIRST: 
COMPANY: IBIS Open Forum
DATE: May 16 2012
LOCATION: Sorrento, Italy

FILE: agenda.pdf
TITLE: Agenda
TYPE: .pdf
AUTHORLAST: 
AUTHORFIRST: 
COMPANY: IBIS Open Forum
DATE: May 16 2012
LOCATION: Sorrento, Italy

FILE: schutt-aine.pdf
TITLE: IBIS Modeling Using Latency Insertion Method (LIM)
TYPE: .pdf
AUTHORFIRST: Jose
AUTHORLAST: SCHUTT-AINE*, Jilin TAN**, Ping LIU**, Feras AL-HAWARI**, and Ambrish VARMA**,
COMPANY: University of Illinois at Urbana-Champaign*, Cadence Design Systems**, USA
DATE: May 16 2012 
LOCATION: Sorrento, Italy 

FILE: doriol.pdf
TITLE: SSO Noise and Conducted EMI: Modeling, Analysis, and Design Solutions
TYPE: .pdf
AUTHORFIRST: Patrice
AUTHORLAST: Joubert DORIOL#, Aurora SANNA#, Akhilesh CHANDRA##, Cristiano FORZAN#, and Davide PANDINI#
COMPANY: STMicroelectronics, Italy
DATE: May 16 2012 
LOCATION: Sorrento, Italy 

FILE: wolff.pdf
TITLE: Modeling On-Die Power Supply Decoupling
TYPE: .pdf
AUTHORFIRST: Randy
AUTHORLAST: Wolff and Lance Wang*
COMPANY: Micron Technology and IO Methodology*
DATE: May 16 2012 
LOCATION: Sorrento, Italy 

FILE: diouf.pdf
TITLE: Versatile Surrogate Models for IC Buffers
TYPE: .pdf
AUTHORFIRST: Cherif 
AUTHORLAST: DIOUF*, Mihai TELESCU*, Igor STIEVANO**, Flavio CANAVERO**, P. CLOSTRE*, and N. TANGUY*,
COMPANY: University of L'Aquila, Italy, *Universite Europeenne de Bretagne, Universite de Brest, France; **Politecnico di Torino, Italy
DATE: May 16 2012 
LOCATION: Sorrento, Italy 

FILE: grivet-talocia.pdf
TITLE: Towards Real-time S-parameter Qualification and Macromodeling
TYPE: .pdf
AUTHORFIRST: Stefano 
AUTHORLAST: GRIVET-TALOCIA
COMPANY: Politecnico di Torino, Italy
DATE: May 16 2012 
LOCATION: Sorrento, Italy 

FILE: girardi.pdf
TITLE: Impact of Accurate PDN Model on IBIS SI and PI Simulations
TYPE: .pdf
AUTHORFIRST: Antonio
AUTHORLAST: GIRARDI and Aniello VISCARDI
COMPANY: Micron Semiconductor Italia S.r.l., Italy
DATE: May 16 2012 
LOCATION: Sorrento, Italy

FILE: wolff.pdf
TITLE: DDR4 IBIS Power Integrity Simulation
TYPE: .pdf
AUTHORFIRST: Randy
AUTHORLAST: Wolff and Lance Wang
COMPANY: Micron Technology and IO Methodology, USA
DATE: May 16 2012 
LOCATION: Sorrento, Italy

FILE: wolff.zip
TITLE: DDR4 IBIS Power Integrity Simulation
TYPE: .ppt (ZIP)
AUTHORFIRST: Randy
AUTHORLAST: Wolff and Lance Wang
COMPANY: Micron Technology and IO Methodology, USA
DATE: May 16 2012 
LOCATION: Sorrento, Italy

FILE: lenski.pdf
TYPE: .pdf
TITLE: More Experiences With IBIS-AMI Models
AUTHORFIRST: Eckhard
AUTHORLAST: LENSKI
COMPANY: Nokia Siemens Networks GmbH & Co KG, Germany
DATE: May 16 2012 
LOCATION: Sorrento, Italy

FILE: dghais.pdf
TYPE: .pdf
TITLE: Efficient Table-Based I-Q Behavioral Model for High-Speed Digital Buffers/Drivers
AUTHORFIRST: Wael
AUTHORLAST: DGHAIS, Hugo TEIXEIRA, T.R. CUNHA, J.C. PEDRO
COMPANY: Universidade de Aveiro, Instituto de Telecomunicacoes, Portugal
DATE: May 16 2012 
LOCATION: Sorrento, Italy