------------------------------------------------------------------ A S I A N I B I S S U M M I T I N F O R M A T I O N Time/Date: 8:00 - 16:30, Friday November 12, 2010 Location: Sherwood Hotel 111 Min Sheng E Road Sec.3, Taipei, Taiwan Rooms: Ballrooms I and II (Look for signs) Sponsors: Agilent Technologies Avant Technology (IO Methodology) Foxconn Technology Group ICT-Lanto Intel Corporation Sigrity Synopsys ------------------------------------------------------------------ I B I S S U M M I T M E E T I N G A G E N D A 8:15 REFRESHMENTS & SIGN IN - Vendor Tables Open at 8:30 9:00 Welcome - Sogo Hsu (Foxconn Technology Group) - Michael Mirmak (Chair IBIS Open Forum, Intel Corporation) 9:20 Introducing IBIS Michael Mirmak (Intel Corporation) 9:35 Point Reduction Method for IBIS Curves Lance Wang (IO Methodology) 10:05 BREAK (Refreshments and Vendor Tables) 10:25 IBIS for SSO Analysis Haisan Wang, Joshua Luo, Jack Lin, and Zhangmin Zhong (Sigrity) 11:05 Correlating C_pin Capacitance with Measurements Randy Wolff (Micron Technology) 11:30 Enforced Passivity of S-parameter Sampled Frequency Data Wenliang Tseng, Sogo Hsu, Frank Y.C. Pai, and Scott C.S. Li (Foxconn Technology Group) 12:00 FREE BUFFET LUNCH (Hosted by Sponsors) - Vendor Tables 13:30 Automated AMI Model Generation & Validaton Jose Luis Pino*, Amolak Badesha*, Manuel Luschas**, Antonis Orphanou**, and Halil Civit** (*Agilent Technologies and **NetLogic Microsystems) 14:10 Extending/Leveraging IBIS Constructs to Model High-Speed I/Os and Packages using AMI, Spice, and S-Parameters (John Lin*, Feras Al-Hawari**, Taranjit Kukal**, and Ambrish Varma**, *Flextronic and **Cadence Design Systems) 14:40 BREAK (Refreshments and Vendor Tables) 15:00 IBIS-ISS: What Is It and What It Means to You Michael Mirmak (Intel Corporation) 15:30 Model Connection Protocol Extensions for Mixed Signal SiP Taranjit Kukal*, WenLiang Dai*, Brad Brim**, and Eiji Fujine*** (*Cadence Design Systems, **Sigrity, and ***Fujitsu VLSI Limited) 16:00 Concluding Items 16:30 END OF IBIS SUMMIT MEETING ------------------------------------------------------------------