FILE: a111612.txt TITLE: Agenda TYPE: .txt AUTHORLAST: AUTHORFIRST: COMPANY: IBIS Open Forum DATE: Nov 16 2012 LOCATION: Yokohama, Japan FILE: m111612.pdf TITLE: Minutes TYPE: .pdf AUTHORLAST: AUTHORFIRST: COMPANY: IBIS Open Forum DATE: Nov 16 2012 LOCATION: Yokohama, Japan FILE: mirmak.pdf TITLE: IBIS 5.1 - An Overview TYPE: .pdf AUTHORFIRST: Michael AUTHORLAST: Mirmak COMPANY: Intel Corporation DATE: Nov 16 2012 LOCATION: Yokohama, Japan FILE: ross.pdf TITLE: IBIS Parser Update TYPE: .pdf AUTHORFIRST: Bob AUTHORLAST: Ross COMPANY: Teraspeed Consulting Group DATE: Nov 16 2012 LOCATION: Yokohama, Japan FILE: wang.pdf TITLE: IBIS Model Validation Review TYPE: .pdf AUTHORFIRST: Lance AUTHORLAST: Wang COMPANY: IO Methodology DATE: Nov 16 2012 LOCATION: Yokohama, Japan FILE: lin.pdf TITLE: Chip PDN Model for Power Aware Signal Integrity Analysis TYPE: .pdf AUTHORLAST: W.C. Lin, Raymond Y. Chen and Haisan Wang AUTHORFIRST: Jack COMPANY: Cadence Design Systems DATE: Nov 16 2012 LOCATION: Yokohama, Japan FILE: kukal.pdf TITLE: Designing DDR3 system using Static Timing Analysis in Conjunction with IBIS simulations TYPE: .pdf AUTHORLAST: Kukal, Zhangmin Zhong, Heiko Dudek AUTHORFIRST: Taranjit COMPANY: Cadence Design Systems DATE: Nov 16 2012 LOCATION: Yokohama, Japan FILE: kibe.pdf TITLE: The VOICE from Practicial Designing with SI Simulation TYPE: .pdf AUTHORLAST: Kibe AUTHORFIRST: Hironari COMPANY: Zuken DATE: Nov 16 2012 LOCATION: Yokohama, Japan FILE: maeda.pdf TITLE: S-parameter - What You Can Read, What You Have to Read TYPE: .pdf AUTHORLAST: Maeda AUTHORFIRST: Shinichi COMPANY: KEI Systems DATE: Nov 16 2012 LOCATION: Yokohama, Japan FILE: matsumura.pdf TITLE: The Application of Simulation Kit Using USB3.0 IBIS-AMI Model TYPE: .pdf AUTHORLAST: Matsumura AUTHORFIRST: Motoaki COMPANY: Fujitsu Semiconductor DATE: Nov 16 2012 LOCATION: Yokohama, Japan FILE: torigoshi.pdf TITLE: Over-clocking Model Validation TYPE: .pdf AUTHORLAST: Torigoshi AUTHORFIRST: Yasuki COMPANY: Toshiba DATE: Nov 16 2012 LOCATION: Yokohama, Japan