[IBIS-Users] Extract IBIS data from lab measurement

Dear all,
I want to extract the IV and Vt data from the chip measurement results, but
there are two problems.
1. For the Vt data, IBIS cookbook Version 4.0 and 5.0 only mention the
procedure of extract ramp rate. If I want to extract the detail Vt curve
table from the measurement results of a packaged chip, is it possible?
2. For the IV data, I successfully extract it from the measurement but the
extracted result only show agreement with original IBIS model (provided by
manufacturer) for operation region. When out of the operation region, i.e.,
in diode model, the IV characteristics I got is quite different from the
original one.
For example, the voltage operation region of my chip is [-0.5, 3.8], in this
range, the measurement value of current is reasonable. However, for the
current measured beyond this voltage range, such as [-3.3, -0.5], the
measurement result will distort severely from the original IBIS value. Could
anyone help me analyze the possible reason for the disagreement? Or is there
something wrong I may make in measurement setting? (I made the measurement
setup according to cookbook version4.0)

Thanks and regards,

Yuancheng

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