Dear all, I have a special case where the pullup of an I/O pin changes dynamically. This is how it works: 1. The I/O has a 100kOhm resistor pullup in parallel with the clamp 2. While the pin is HIGH, it can be pulled LOW externally - behaving like a open-drain I/O with a 100K pullup 3. When the pin is pulled LOW by the device - it is a strong pull-down 4. Here is the problem: When this pin is pulled HIGH from a LOW state - a strong internal pullup acts on it for (~)1us - after this time, the strong pullup is disabled and it acts like the point 2 above. Sequence: Pin is LOW -> Pulled high with a strong pullup (20Ohm) for 1us -> Strong pullup is disabled and pin acts as an open-drain I/O with an weak internal pullup Any ideas on how this pin needs to be modeled? I understand that the resistive pullup should be accounted for in the Clamp currents. However, how do I account for the fact that the pull-up table changes dynamically. Your help would be greatly appreciated. Thanks, Gaurav -- This message has been scanned for viruses and dangerous content by MailScanner, and is believed to be clean. -------------------------------------------------------------------- |For help or to subscribe/unsubscribe, e-mail majordomo@eda-stds.org |with the appropriate command message(s) in the body: | | help | subscribe ibis <optional e-mail address, if different> | subscribe ibis-users <optional e-mail address, if different> | unsubscribe ibis <optional e-mail address, if different> | unsubscribe ibis-users <optional e-mail address, if different> | |or e-mail a request to ibis-request@eda-stds.org. | |IBIS reflector archives exist under: | | http://www.eda-stds.org/pub/ibis/email_archive/ Recent | http://www.eda-stds.org/pub/ibis/users_archive/ Recent | http://www.eda-stds.org/pub/ibis/email/ E-mail since 1993Received on Tue Dec 16 19:37:07 2008
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