Y'all,
This may be the paper Bob Ward describes. Does anybody have this
conference proceedings?
--Eric
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Author CANRIGHT, R.E., Jr.;
Martin Marietta Missile Syst., Orlando, FL, USA
Title Capacitance: relationships and measurements (for multiple
conductors in VLSI packages and PWB)
Source 1990 Proceedings. 40th Electronic Components and Technology
Conference (Cat. No.90CH2893-6); Part: Las Vegas, NV, USA; Part:
20-23 May 1990;
Sponsored by: IEEE; Electron. Ind. Assoc;
New York, NY, USA;
IEEE;
2 vol. xvi+1125 pp.;
1990 pp.; pp. 163-8 vol.1 pp.
Abstract Three descriptions of capacitances for multiple conductors over a
ground are discussed: the lumped-element capacitance, the two-
terminal capacitance, and Maxwell's capacitance. Equations that
completely interrelate the different descriptions of capacitance
are presented. Experimental evidence supporting the two-terminal
measurement technique is presented. AN example how the
measurement can be applied to the VLSI package is given. It is
also shown how networks of cross-coupled resistors can be measured
Subject capacitance; capacitance measurement; conductors (electric);
packaging; printed circuits; VLSI
Keyword parasite capacitance; multiple conductors; lumped-element
capacitance; two-terminal capacitance; Maxwell's capacitance;
VLSI package; networks of cross-coupled resistors
ClassCodes B2110; B0170J; B2570; B2210; B7310J
Treatment theoretical/mathematical; experimental
Language English
RecordType Conference
ControlNo. 3897358
AbstractNos. B91037970
References 6
U.S. Copyright Clearance Center Code
0569-5503/90/0000-0163$01.00
Country Pub. USA
date 1170
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Received on Fri Jan 7 10:17:05 1994
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