Dear Sir.
I have read some documents on the IBIS from the internet and I have
some questions to ask:
1- In the simulator you have two curves one for the Pull-up, Pull-down
and the other for the Clamp diodes, these two curves are on the same
pin I mean you can not get each of them individually so how can you
check these curves with the actual Lab measurements. ?
2- When You made these measurements in the LAB ,if you have the IC pin
always high when you apply the VCC to that pin, how can you vary the
voltage to measure the current variations?
3- Are you sure that the voltage change between -Vcc to 2Vcc will not
harm the IC pin??
4- These IC characteristics (IV ,Ramp...) is measured on the pins when
all the IC pins are free so are these C/S will not change when the IC
is connected inside the circuit or some pins within the IC itself is
connected to another pins to the same IC ??
Thanks for your cooperation.
Hany Gad.
Received on Sun Jul 27 08:50:24 1997
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