IBIS and device performance

Subject: IBIS and device performance
From: Todd Westerhoff (twester@hhnetwk.com)
Date: Fri Jul 27 2001 - 11:11:10 PDT

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Hi all,

This particular question is going to both the SI and IBIS reflectors, as the
issues touch both groups.

Question 1 (for the SI-listers)

How often are people seeing IBIS models that use the [Model Spec] keyword to
list min/typ/max values for parameters like Vinl, Vinh and Vmeas? Are you
seeing this commonly, or was your response "what is he talking about"?

Question/Comment 2 (for the IBISians)

Is there any definitive, short, concise document that lists which
combinations of which IBIS parameters are meant to represent best, typical,
and worst-case component-level performance? As an example, the [max]
section of a V/I curve would clearly indicate best-case device performance,
but you'd have to combine that with the [min] value of a parameter like
c_comp. So - for best case conditions, the EDA tool and the model creator
both have to use the same set of conventions of combining parameters for
best, typical and worst case device performance.

Is there a table anywhere that defines this?

Todd.

Todd Westerhoff
SI Engineer
Hammerhead Networks
5 Federal Street
Billerica, MA 01821
twester@hhnetwk.com
ph: 978-671-5084

• Next message: Hailong Wang: "About relationshipp between R_pkg,C_pkg,L_pkg and R_dut, C_dut, L_dut"
• Previous message: Bob Ross: "IBIS BIRD72 - Accommodating PMOS and NMOS//PMOS Series FET Models"
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