Chetana As Scott said we have been making SI models for over ten years, actually about 15 years now, based on measurements of sample devices. To do this we have assembled considerable equipment, software and expertise to accomplish this. For equipment you will need several power supplies, one for each power domain on the ICs that you will be modeling. Plus you will need a "power supply" that can perform the task of a curve tracer. Second, you will need a stimulus to control the IC under test. We use a word generator. You will have to size the features of your stimulus to match the complexity of the parts you intend to model. Third, you will need a wide band scope to digitize the waveforms for the VT tables in the model. We use 20 GHz sampling scopes for most of the parts we model. Again, you will have to look at the mix of ICs you will be modeling to determine your bandwidth needs. You will need to measure package parasitics and C_comp. I use TDR technology to do this so you will need a TDR based system also for your scope. You may want to use a VNA. You will need to develop SW to run all the test equipment and store the measurements. You will need to develop SW to convert the measurements to the IBIS file format. You will need to develop test fixture technology to be able to power the ICs, apply stimulus and make high quality measurements. You will need lots of RF "plumbing" on hand to make your measurement jobs accurate. Plumbing includes coaxial cable, terminations, attenuators, dividers, adapters, etc. You will need some commercial SW such as IConnect from Tektronix so that you can convert the TDR waveforms to pin parasitics and C_comp. You will need a method of controlling the chip's temperature. Or you could ask us for a quote and let us do work for you. But if you really want to do it yourself we can put together a system for you. Tom Dagostino Teraspeed(R) Labs 13610 SW Harness Lane Beaverton, OR 97008 503-430-1065 503-430-1285 FAX tom@teraspeed.com www.teraspeed.com Teraspeed Consulting Group LLC 121 North River Drive Narragansett, RI 02882 401-284-1827 From: owner-ibis-users@server.eda.org [mailto:owner-ibis-users@server.eda.org] On Behalf Of Chetana Raghuwanshi Sent: Thursday, March 05, 2009 2:27 AM To: 'ibis-users@server.eda.org'; 'ibis@server.eda.org' Subject: [IBIS-Users] IBIS models using Silicon Measurement data Hello All, We have been generating IBIS models using device simulation data till now. Could somebody please guide on how to develop IBIS models based on Silicon Measurement data ? Thanks in Advance, Best Regards Chetana -- This message has been scanned for viruses and dangerous content by <http://www.mailscanner.info/> MailScanner, and is believed to be clean. -- This message has been scanned for viruses and dangerous content by MailScanner, and is believed to be clean. -------------------------------------------------------------------- |For help or to subscribe/unsubscribe, e-mail majordomo@eda-stds.org |with the appropriate command message(s) in the body: | | help | subscribe ibis <optional e-mail address, if different> | subscribe ibis-users <optional e-mail address, if different> | unsubscribe ibis <optional e-mail address, if different> | unsubscribe ibis-users <optional e-mail address, if different> | |or e-mail a request to ibis-request@eda-stds.org. | |IBIS reflector archives exist under: | | http://www.eda-stds.org/pub/ibis/email_archive/ Recent | http://www.eda-stds.org/pub/ibis/users_archive/ Recent | http://www.eda-stds.org/pub/ibis/email/ E-mail since 1993Received on Thu Mar 5 09:21:56 2009
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