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                AGENDA, EUROPEAN IBIS SUMMIT MEETING
                     Thursday, April 23, 2009

                       Novotel Nice Centre
               (across the street from Nice-Acropolis
                   Congress and Exhibition Center)
                           Nice, France

                     Room: Check at Entrance

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8:30   REFRESHMENTS & SIGN IN

9:00   WELCOME AND INTRODUCTIONS
       Ralf BRUENING, Zuken, Germany

9:10   Size Matters - Observations on Size and Complexity of
         IBIS Device Descriptions in the Last 24 Months
       Ralf BRUENING and Michael SCHAEDER, Zuken, Germany

9:40   Decoding IBISCHK: Static vs. Dynamic Waveforms
       Eckhard LENSKI, Nokia Siemens Network GmbH, Germany

10:10  The Touchstone Format For Interconnect Modeling
       Manfred MAURER, Siemens AG, Germany

10:40  BREAK (15 Minutes)

10:55  Enhanced Mpilog Model for Power Integrity Analysis
       Antonio GIRARDI*, Igor STIEVANO**, Roberto IZZI*, T. LESSIO*,
       Flavio CANAVERO**, Ivan MAIO**, and Luca RIGAZIO**
       *Numonyx and **Politecnico di Torino, Italy

11:25  First Experiences wtih ICEM Models for EMC Simulations
       Ralf BRUENING, Zuken, Germany

11:55  The Use of Optimization in Signal Integrity Performance
         Centric High Speed Digital Design Flows
       Saliou DIEYE, Agilent Technologies, France

12:25  Closing Remarks (and other short reports and/or discussion
         if schedule permits)
       Ralf BRUENING, Zuken, Germany

12:45  END OF MEETING

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REGISTRATION INFORMATION

People involved in IBIS Model development, EDA tool development, and
digital circuit design are invited to participate to the Summit
meeting. If you plan to participate, please register with the
information below:

   Name:
   E-mail address:
   Company:
   Telephone:

Send to:

   Ralf BRUENING (ralf.bruening@zuken.de)

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SPONSORS:
   Agilent Technologies, Sigrity and Zuken

LIST OF NEARBY HOTELS

   See <http://www.date-conference.com/conference/travel.htm> for
   travel directions, hotels and other information.