FILE: a022004.txt
TITLE: Agenda 
TYPE: .txt
AUTHORLAST: 
AUTHORFIRST: 
COMPANY: IBIS Open Forum
DATE: Feb 20 2004
LOCATION: Paris, France

FILE: m022004s.txt
TITLE: Summit Minutes 
TYPE: .txt
AUTHORLAST: 
AUTHORFIRST: 
COMPANY: IBIS Open Forum
DATE: Feb 20 2004
LOCATION: Paris, France

FILE: agenda.pdf    
TITLE: Agenda 
TYPE: .pdf
AUTHORLAST: 
AUTHORFIRST: 
COMPANY: IBIS Open Forum
DATE: Feb 20 2004
LOCATION: Paris, France

FILE: agenda.zip    
TITLE: Agenda 
TYPE: .ppt (ZIP)
AUTHORFIRST: 
AUTHORLAST:  
COMPANY: IBIS Open Forum
DATE: Feb 20 2004
LOCATION: Paris, France

FILE: bruening.pdf
TITLE: IBIS and EMI Screening Tools
TYPE: .pdf
AUTHORFIRST: Ralf
AUTHORLAST: Bruening
COMPANY: Zuken
DATE: Feb 20 2004
LOCATION: Paris, France

FILE: engin.pdf
TITLE: Lumped Skin Effect Model for Package Leads
TYPE: .pdf
AUTHORFIRST: A. Ege
AUTHORLAST: Engin
COMPANY: Fraunhofer Institute
DATE: Feb 20 2004
LOCATION: Paris, France

FILE: haller.zip
TITLE: IBIS Quality 
TYPE: .ppt (ZIP)
AUTHORFIRST: Robert
AUTHORLAST: Haller
COMPANY: Signal Integrity Software
DATE: Feb 20 2004
LOCATION: Paris, France

FILE: haller.pdf
TITLE: IBIS Quality 
TYPE: .pdf
AUTHORFIRST: Robert
AUTHORLAST: Haller
COMPANY: Signal Integrity Software
DATE: Feb 20 2004
LOCATION: Paris, France

FILE: klos.zip
TITLE: Verification of IBIS Models
TYPE: .ppt (ZIP)
AUTHORFIRST: Hans
AUTHORLAST: Klos
COMPANY: Sintecs BV
DATE: Feb 20 2004
LOCATION: Paris, France

FILE: klos.pdf
TITLE: Verification of IBIS Models
TYPE: .pdf
AUTHORFIRST: Hans
AUTHORLAST: Klos
COMPANY: Sintecs BV
DATE: Feb 20 2004
LOCATION: Paris, France

FILE: sicard.zip
TITLE: A Freeware Environment for IC Emission Simulations Based on ICEM and IBIS
TYPE: .ppt (ZIP)
AUTHORFIRST: Etienne
AUTHORLAST: Sicard
COMPANY: INSA
DATE: Feb 20 2004
LOCATION: Paris, France

FILE: sicard.pdf
TITLE: A Freeware Environment for IC Emission Simulations Based on ICEM and IBIS
TYPE: .pdf
AUTHORFIRST: Etienne
AUTHORLAST: Sicard
COMPANY: INSA
DATE: Feb 20 2004
LOCATION: Paris, France

FILE: lenski.zip
TITLE: IBIS Models, Current Status and Some Notes on IBIS 4.0
TYPE: .ppt (ZIP)
AUTHORFIRST: Eckhard 
AUTHORLAST: Lenski
COMPANY: Siemens AG
DATE: Feb 20 2004
LOCATION: Paris, France

FILE: lenski.pdf
TITLE: IBIS Models, Current Status and Some Notes on IBIS 4.0
TYPE: .pdf
AUTHORFIRST: Eckhard
AUTHORLAST: Lenski
COMPANY: Siemens AG
DATE: Feb 20 2004
LOCATION: Paris, France

FILE: rousseau.zip
TITLE: The Benefits of Multi-Lingual Extensions to IBIS
TYPE: .ppt (ZIP)
AUTHORFIRST: Stephane
AUTHORLAST: Rousseau
COMPANY: Mentor Graphics
DATE: Feb 20 2004
LOCATION: Paris, France

FILE: rousseau.pdf
TITLE: The Benefits of Multi-Lingual Extensions to IBIS
TYPE: .pdf
AUTHORFIRST: Stephane
AUTHORLAST: Rousseau
COMPANY: Mentor Graphics
DATE: Feb 20 2004
LOCATION: Paris, France

FILE: maurer.pdf
TITLE: Sensitivity Analysis of IBIS-Parameters with HSPICE
TYPE: .pdf
AUTHORFIRST: Manfred
AUTHORLAST: Maurer
COMPANY: Siemens AG
DATE: Feb 20 2004
LOCATION: Paris, France

FILE: stievano.zip
TITLE: Parametric Models in IBIS Multilingual Framework
TYPE: .ppt (ZIP)
AUTHORFIRST: Igor
AUTHORLAST: Steivano
COMPANY: Politecnico di Torino, Italy
DATE: Feb 20 2004
LOCATION: Paris, France

FILE: stievano.pdf
TITLE: Parametric Models in IBIS Multilingual Framework
TYPE: .pdf
AUTHORFIRST: Igor
AUTHORLAST: Steivano
COMPANY: Politecnico di Torino, Italy
DATE: Feb 20 2004
LOCATION: Paris, France