Subject: [IBIS-Users] Measurement deratings?
From: John Phillippe (john.phillippe@motorola.com)
Date: Wed May 28 2003 - 08:27:53 PDT
Hello,
I am wondering how people match their IBIS simulations to silicon
measurements. I read through the spec, and didn't see anything that
looked like a derating type construct. So it is my understanding that
when someone takes lab measurements of an I/O buffer, those data points
are directly inserted into the ibis file, replacing the simulated data.
Does this sound correct? Is there another way, to get simulations to
more closely match measurements?
-- John Phillippe SPS, 32 Bit Embedded Controller Division, IC Creation Motorola - 512-895-1835 Austin, TX - john.phillippe@motorola.com|------------------------------------------------------------------ |For help or to subscribe/unsubscribe, email majordomo@eda.org |with just the appropriate command message(s) in the body: | | help | subscribe ibis <optional e-mail address, if different> | subscribe ibis-users <optional e-mail address, if different> | unsubscribe ibis <optional e-mail address, if different> | unsubscribe ibis-users <optional e-mail address, if different> | |or email a written request to ibis-request@eda.org. | |IBIS reflector archives exist under: | | http://www.eda.org/pub/ibis/email_archive/ Recent | http://www.eda.org/pub/ibis/users_archive/ Recent | http://www.eda.org/pub/ibis/email/ E-mail since 1993
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