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To: ibis@vhdl.org
Subject: BIRD #3
Date: Thu, 04 Nov 1993 16:40:31 -0800
From: Stephen Peters <speters@ichips.intel.com>

Hello fellow IBISains --

     As promised during the last open forum meeting I started
to write a revised BIRD for ECL.  However....as I tried to
address the issues concerning clamp-diodes references, specifing
voltage rails, etc. it became apparent that I was trying to
kill two stones with one BIRD.  Therefore, BIRD #3 has become
a proposal that deals with the whole issue of handling multi-
supply devices and specifing devices that don't follow the
standard pullup/pulldown reference paradigm.  BIRD #4 will
follow shortly, and it deals stricly with the issue of
reducing the required voltage range when specifing ECL outputs.
I look forward to your comments.

	Best Regards,
	Stephen Peters
	Intel Corp.

----------------------------------------------------------------
	Buffer Issue Resolution Document  (BIRD)

BIRD ID#:     0003

ISSUE TITLE:  Multiple power supplies and references

REQUESTER:    Stephen Peters, Intel Corp.

DATE SUBMITTED:  Nov 4, 1993

DATE ACCEPTED BY IBIS OPEN FORUM:

******************************************************************************
******************************************************************************
STATEMENT OF THE ISSUE:  The IBIS specification currently does not address
devices that use more than one supply, or devices in which the pullups,
pulldowns, power_clamp or gnd_clamp diodes are referenced to voltages other
than that specified by the [Voltage range] keyword. This BIRD proposes
a general way in which both multiple power supplies can be defined and
V/I curve can be referenced to specific supplies. 

****************************************************************************
STATEMENT OF THE RESOLVED SPECIFICATIONS:  The specific change involves
adding four new keywords: [Pullup reference], [Pulldown reference],
[POWER_clamp reference] and [GND_clamp reference].  These keywords are
defined as shown below.  The following text replaces the current text
for the [Voltage range] keyword.

|==========================================================================
|    Keyword:  [Voltage range]
|   Required:  Yes
|Description:  Used to define the power supply voltage tolerance over which
|              the the model is intended to operate.  It also specifies the
|              default voltage rail the pullup and POWER_clamp V/I data is
|	       referenced to.
|Usage Rules:  Actual voltages (not percentages) are to be presented in the
|	       usual typ, min, max format.  "NA" is allowed for the min and
|	       max values only.
|---------------------------------------------------------------------------
| variable		typ	min	max
[Voltage range]		5.0v	4.5v	5.5v
|===========================================================================
|    Keyword:  [Pullup reference]
|   Required:  Yes, if the [Voltage range] keyword is not present.
|Description:  Used to define a voltage rail other than that defined by
|	       the [Voltage range] keyword as the reference voltage
|	       for the pullup V/I data.  
|Usage Rules:  Actual voltages (not percentages) are to be presented in the
|	       usual typ, min, max format.  "NA" is allowed for the min and
|	       max values only.
|Other Notes:  This keyword, if present, also defines the voltage range over
|	       which the min and max dV/dt_r values are derived.
|---------------------------------------------------------------------------
| variable		typ	min	max
[Pullup reference]	5.0V	4.5V	5.5V
|===========================================================================
|    Keyword:  [Pulldown reference]
|   Required:  Yes, if the [Voltage range] keyword is not present.
|Description:  Used to define a power supply rail other than 0v as the
|	       reference voltage for the pulldown V/I data.  If this keyword
|	       is not present the voltage data points in the pullup V/I table
|	       are referenced to 0v.
|Usage Rules:  Actual voltages (not percentages) are to be presented in the
|	       usual typ, min, max format.  "NA" is allowed for the min and
|	       max values only.
|Other Notes:  This keyword, if present, also defines the voltage range over
|	       which the min and max dV/dt_f values are derived.
|---------------------------------------------------------------------------
| variable		typ	min	max
[Pulldown reference]	0V	0V	0V
|===========================================================================
|    Keyword:  [POWER_clamp reference]
|   Required:  Yes, if the [Voltage range] keyword is not present.
|Description:  Used to define a voltage rail other than that defined by
|	       the [Voltage range] keyword as the reference voltage
|	       for the POWER_clamp V/I data.
|Usage Rules:  Actual voltages (not percentages) are to be presented in the
|	       usual typ, min, max format.  "NA" is allowed for the min and
|	       max values only.
|Other Notes:  Refer the "NOTES ON SPECIFYING POWER SUPPLIES" section below.
|---------------------------------------------------------------------------
| variable			typ	min	max
[POWER_clamp reference]		5.0V	4.5V	5.5V
|===========================================================================
|    Keyword:  [GND_clamp reference]
|   Required:  Yes, if the [Voltage range] keyword is not present.
|Description:  Used to define a power supply rail other than 0v as the
|	       reference voltage for the GND_clamp V/I data.  If this keyword
|	       is not present the voltage data points in the pullup V/I table
|	       are referenced to 0v.
|Usage Rules:  Actual voltages (not percentages) are to be presented in the
|	       usual typ, min, max format.  "NA" is allowed for the min and
|	       max values only.
|Other Notes:  Refer to the "NOTES ON SPECIFYING POWER SUPPLIES" section below.
|---------------------------------------------------------------------------
| variable			typ	min	max
[GND_clamp reference]		0V	0V	0V
|============================================================================
|		NOTES ON SPECIFYING POWER SUPPLIES
|  It is the intention that standard TTL and CMOS devices be specified
|  using only the [Voltage range] keyword.  However, in cases where
|  the output characteristics of a device depend on more than a single
|  supply and ground, or a pullup, pulldown or clamp structure is referenced
|  to something other than the default supplys, the additional 'reference'
|  keywords are to be used.
|      If the [Voltage range] keyword is not present then all four of the
|  other keywords must be present.  If the [Voltage range] keyword is
|  present the other keywords are optional and may or may not be used as
|  required.  It is legal (although redundant) for an optional keyword to
|  specify the same voltage as specified by the [Voltage range] keyword.

*******************************************************************************
ANALYSIS PATH/DATA THAT LED TO SPECIFICATION:  Most of the above is fairly
self-explanatory.  The key here is to realize that the four 'reference'
keywords, in effect, create separate power supply rails that override
the default [Voltage range] supply.  The intention was to create a very
general and flexible way to handle multiple supply devices and ECL.
To illustrate with some examples:

  1. An RS23 line driver has a +/- 12V output swing.  One way to specify
     this device is shown below
				typ	min	max
     [Voltage range]		12.0V	11.5V	12.5V  | fixes pullup and
						       | POWER_clamp ref
     [Pulldown reference]	-12.0V	-12.5V	-11.5V | fixes pulldown ref
     [GND_clamp reference]	-12.0V  -12.5v	-11.5V | fixes GND_clamp ref
  
     Optionally, the [Voltage range] keyword could be replaced with the
     [Pullup reference] and [POWER_clamp] reference.

  2. A device uses two supplies, a 3V supply for its I/O and a 5V supply for
     it's internal logic.  The power clamp diodes are referenced to the 5V
     supply.  Their are two equally valid ways this device can be specified.

				typ	min	max
     [Voltage range]		3.3V	3.0V	3.6V  | fixes pullup reference
     [POWER_clamp reference	5.0V	4.5V	5.5V  | fixes POWER_clamp
						      | reference
			
				typ	min	max
     [Voltage range]		5.0V	4.5V	5.5V  | fixes both pullup and
						      | POWER_clamp reference
     [Pullup reference]		3.3V	3.0V	3.6V  | overrides [Voltage
						      | range] specification
						      | on the pullup


  3. When specifying a device with an ECL type output structure, the pulldown
     curves must be referenced to the most positive supply (the same one that
     the pullup curves are referenced to).  The easiest way to do this is
     define the value of the [Voltage range] as 0v.  Both the pullup AND
     pulldown V/I curves will be referenced to 0v (remember, the pulldown
     defaults to 0v). 

				typ	min	max
     [Voltage range]		0V	0V	0V	| VCC supply
     [Pulldown reference]  	0V	0V	0V	| not really
							| required, its
							| specified for 
							| completeness
     [GND_clamp reference]	-4.5V	-3.5V	-5.5V	| ESD diode


     Alternately, one could specify the VEE supply and then override the
     default values of the pullup and pulldown references
				typ	min	max
     [Voltage range]		-4.5V	-4.0V	-5.5v	| VEE supply
     [Pullup reference]		0v	0v	0V
     [Pulldown reference]	0v	0v	0v  
     [GND_clamp reference]	-4.5V	-3.5V	-5.5V	| ESD diode

     Finally, to specify ECL logic that is used with a +5V supply
     (positive ECL) one can do the following:

				typ	min	max
     [Voltage range]		5.0V	4.5V	5.5V	| VCC supply
     [Pulldown reference]	5.0V	4.5V	5.5V	| override default

     The default references are used for the pullup and GND_clamp V/I
     curves.

  
******************************************************************************
ANY OTHER BACKGROUND INFORMATION:
******************************************************************************
From speters@ichips.intel.com  Fri Nov  5 13:39:16 1993
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To: ibis@vhdl.org
Subject: BIRD #4, ECL bird
Date: Fri, 05 Nov 1993 13:38:12 -0800
From: Stephen Peters <speters@ichips.intel.com>


Greetings again --
     As promised, here is the BIRD that deals with
specifing ECL type outputs.  Because the issue of
pulldown V/I curve reference has been addressed in the
previous BIRD (BIRD #3), this bird deals strictly with
the reduced output voltage swing issue.

	Best Regards,
	Stephen Peters

P.S. -- In my haste to get BIRD #3 finished I inadvertently 
forgot to include the following:

******************************************************************************
ANY OTHER BACKGROUND INFORMATION:  The author wishs to acknowledge Kelly
Crisafulli of Hyperlynx and Kumar of Cadence Design Systems for planting
the ideas that became this BIRD.
******************************************************************************


------------------------ cut here --------------------------------------------

                 Buffer Issue Resolution Document  (BIRD)


BIRD ID#: 	0004
ISSUE TITLE:	ECL Extensions
REQUESTER:	Stephen Peters, Intel Corp.

DATE SUBMITTED: November 5, 1993
DATE ACCEPTED BY IBIS OPEN FORUM:

*******************************************************************************
*******************************************************************************

STATEMENT OF THE ISSUE:  This proposal addresses the need to extend the
IBIS specification to include devices with Emitter Coupled Logic (ECL) 
type output structures.

The proposed changes are two in number: 
     (1) Lessening the required voltage range over which an ECL output
	 is characterized.
     (2) Explicitly specifying under what output conditions data is
	 gathered for inclusion in the pullup and pulldown tables.


*******************************************************************************

STATEMENT OF THE RESOLVED SPECIFICATIONS:  

(1) The first change is to relax (decrease) the range of voltage values
required when tabulating the V-I characteristics of an ECL output. For an
ECL device it is proposed the range be decreased to VCC (the most positive
power supply) to VCC - 2.2 volts (currently the range is from GND - POWER
to 2*POWER). Specifically, add the following to Item 2 in the "NOTES ON
DATA DERIVATION METHOD" section of the specification:

     When tabulating output data for ECL type devices, the voltage points 
     must span the range of VCC to VCC - 2.2V.  This range applies to both the
     pullup and pulldown tables.  Note that this range applies ONLY when
     characterizing an ECL output.


(3) Secondly, it is proposed to explicitly state in the specification under
what output conditions data is gathered for the pullup and pulldown tables
and that, in both cases, the voltage data is referenced to VCC.  The
proposed explanation should be placed in the 'Other Notes' section of the
text describing the [Pulldown] and [Pullup] keywords and is as follows:

     When tabulating data for ECL devices, the data in the pulldown table
     is measured with the output in the 'logic low' state.  In other words,
     the data in the table represents the V-I characteristics of the
     output when the output is at the most negative of its two logic
     levels.  Likewise, the data in the pullup table is measured with the
     output in the 'logic one' state and represents the V-I characteristics
     when the output is at the most positive logic level.  Note that in BOTH
     these cases the data is referenced to the VCC supply voltage, using
     the equation  Vtable = Vcc - Voutput.


*******************************************************************************

ANALYSIS PATH/DATA THAT LED TO SPECIFICATION:

(1)   The reason the voltage range over which an ECL output is specified
should be relaxed is that, with ECL, one is dealing with much smaller 
signal swings and terminated transmission lines.
     The rational for specifying such a large voltage range was to allow
for the case of a CMOS output driving an unterminated transmission line.
When an incident voltage wave hits the end of an unterminated line it
will reflect back to the source at double the amplitude. Thus, a CMOS
output that swings rail-to-rail could see a reflection of up to 2*VCC
(or -VCC in the negative direction).  However, with an ECL output, the
output swing is only ~800mv (typically -.9v to -1.7v) and furthermore,
because of the vary nature of ECL, any transmission lines will be
terminated with an Rt close to the lines Zo.  Even in the case where the
mismatch between Zo and Rt is 2:1, the maximum reflection is .270mv,
and the voltage range at the source due to reflections is -.6 to -2.0v.
Therefore, a range of VCC to VCC -2.2v is adequate to specify the output
under any reasonable conditions, and should be enough to allow simulators
to extrapolate the curves.


(3)  The second proposal is an effort to make perfectly clear to both the
user and the person creating an IBIS specification for a particular part
how ECL device are to be handled.


*******************************************************************************

ANY OTHER BACKGROUND INFORMATION:

*******************************************************************************


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From: Cathy Lundberg <Cathy_Lundberg@ccm.hf.intel.com>
Message-Id: <931108175309_19@ccm.hf.intel.com>
To: Will_Hobbs@ccm.hf.intel.com, ibis@vhdl.org
Cc: Cathy_Lundberg@ccm.hf.intel.com
Subject: November 5, 1993

November 5, 1993
From:           Cathy Lundberg     (503) 696-4620,  fax (503) 696-4904
                Will Hobbs    (503) 696-4369, fax (503) 696-4210
Subject:        Minutes from IBIS Open Forum 10/29/93
To:

Anacad                  Petra Osterman
AnSoft                  Henri Maramis
Cadence Design          Sandeep Khanna, Chris Reed, Pawel Chadzynski, Kumar*
Contec                  Maah Sango*, Clark Cochran
High Design Technology  Michael Smith
HyperLynx               Steve Kaufer, Kellee Crisafulli
Integrity Engineering   Greg Doyle, Wayne Olhoft
Intel Corporation       Stephen Peters*, Gary Saunders, Jim Alexander, Don 
Telian,
                        Arpad Muranyi*, Donna Rendon, Will Hobbs*,
                        Cathy Lundberg*
Interconnectix, Inc.    Bob Ross*
Intergraph              Ian Dodd
IntuSoft                Charles Hymowitz
Logic Modeling Corp.    Randy Harr*
Mentor Graphics         Greg Seltzer, Ravender Goyal
Meta-Software           Stephen Fenstermaker
MicroSim                Arthur Wong*, Meeling Wei, Jerry Brown, Graham Bell
North Carolina State University Paul Franzon
PC Ware                 Paul Munsey
Performance Signal Integrity    Vivek Raghawan, Eric Bracken*
Quad-Design             Jon Powell*
Quantic Labs            Mike Ventham*, Zhen Mu
Siemens Nixdorf         Werner Rissiek*
Texas Instruments       Bob Ward*
Thomson-CSF/SCTF        Jean Lebrun
Zeelan Technology       Hiro Moriyasu, George Opsahl*, Samie Samaan, Tay Wu

Cc:  Intel Corporation  Randy Wilhelm, Jerry Budelman, Intel IBIS team

In the list above, attendees at the 10/29 meeting are indicated by *

Future meetings:  Face to face IBIS Summit, Santa Clara, CA:  Nov. 12, 1993,    
                  8:00-5:00 PST
                  Phone number:  (916)356-9999.  Reservation Number:  130639

Please note:  If you know of someone new who wants to join the email reflector 
(ibis@lmc.com), or have updates to your email address, email to 
ibis-request@vhdl.org.


10/29 Meeting Agenda:

9:00    Check-in
9:05    Introductions of new IBIS members
9:10    10/1 Minutes Review, Opens for New Issues       Will Hobbs
9:15    Press Release, Trademark issue                  Randy Harr, Will Hobbs
9:25    Summit Planning
                Attendees
                Presenters
                Discussion Chairs, Topics
9:40    SCVs                                            Will Hobbs, All
9:45    BBS Updates                                     Siuki Chan, Randy Harr
9:50    BIRDS
                ECL, BIRD #1                            Stephen Peters
                VIH, VIL Input Threshold, Bird #2       Jon Powell
10:20   10/1 Opens
                #6 Open Side (shelved)                  Kellee Crisafulli
                #7 .pkg                                 Eric Bracken
                #8 Thresholds for Timing                Jon Powell
                #9 Monotonicity                         Kellee Crisafulli, Arpad
                                                        Muranyi
10:50   Wrap-Up
        Action Items
        Next Meeting Plans


Minutes
I.  Open Issues:

Atmel called, they will be doing IBIS models.
Motorola will do IBIS models of the PowerPC.  They may attend the summit.

No corrections to minutes.

Paul Munsey has not been paid by one company.  The group agreed that a check 
should be issued to Paul by Will from the IBIS account.

AR:  Will - issue check to Paul Munsey from the IBIS account. Update: waiting on
final confirmation of facts.

Changes to coding style would make 2.0 easier to use, and easier to write 
translators.  Jon would like people to talk to Paul about it.

We'll send out directions to get to the summit to reflector by next Monday.  A 
map will also be sent with the faxed minutes.

AR:  Cathy - send directions to get to the summit to the reflector.  DONE
AR:  Cathy - fax map to Bob Ward.  DONE

II.  Press Release:

Texas Instruments didn't get deleted from the copy and TI did appear in a couple
of places as supporting the IBIS standard.  The final release went out without 
Randy's review.  Key editors were called about the mistake and corrected copies 
were faxed to several places.  No backlash is expected at TI. 

We have a letter on letterhead from every company but Intel authorizing the 
press release.

The IBIS Overview document that will be sent out on request by Karen Kirkpatrick
at Cadence has not been sent to her yet;  It has been reviewed by various Intel 
people and Jon Powell and still needs some revision.  It is a nice overview, but
gets too specific in some areas.  For example, some simulator vendors have 
varying support for the ability to accurately model traces, so the document 
should give transmission line values instead of trace lengths, etc.  Subsequent 
to the meeting, we learned that Cadence has received a few requests yet as far 
as we know.  Robin (Intel's tech writer working on the document) is making final
revisions.  She will finish shortly and we will submit it to vhdl.org and fax it
to our standard fax list.

The press release got low coverage because of the HyperLynx press release that 
went out earlier.  Also, the press release was just on white paper, not on slick
letterhead with a packet.  The next time we issue a press release we should have
each company generate their own press release which we can then assemble 
together to send out.  We need to make sure we time it right and release the 
information at the same time.

We have some potential logos to use for IBIS.  The results of the trademark 
search are in a 50 page document that Logic Modeling has - any paying IBIS 
member can get it from them.

III.  Summit planning:

A session led by Kumar of Cadence and Eric Bracken (now Vivek Reghawan) of 
Performance Signal Integrity will discuss modeling simultaneous switching / 
ground bounce, which drivers talk to which pins, different supplies powering 
different pins, representing Vcc pins shared by buffers, timing and noise 
implications and dual supply components. 

AR:  Kumar - let Will or Cathy know your topic of discussion by 11/5.

Other potential sessions:

Data measurement and derivation methods - how semiconductor vendors derive data.
 Other semiconductor vendors have rise times characterized differently than 
Intel does.  It would be nice to have Intel, Motorola and Texas Instruments talk
about this.

In order for IBIS to be useful, semiconductor vendors need to get involved.  
Will is inviting some companies to the summit.  Others should do the same.

We would like to see foils ahead of time so we can have copies prepared.  We 
will also send out copies afterward as necessary.

November 12 IBIS conference agenda
8:00 - 5:00  SC4-150

Note: Intel will provide coffee and lunch.

8:00    All                                     Assemble, get aquainted, have   
                                                coffee
8:20    Will Hobbs      Intel                   IC vendor view of IBIS
8:45    Randy Harr      LMC                     Die 0.9 bare die spec work with 
                                                National
9:15    Bob Ross        Interconnectix          Measurement and Extraction of   
                                                buffer data
9:45    Break
10:05   Jon Powell      Quad-Design             Slew Controlled Devices
10:25   Arpad Muranyi   Intel                   V/I/T
10:40   Panel                                   Handling Dynamic                
                                                Characterization of Buffers
12:00   Lunch
1:00    Kumar           Cadence                 Implementation of IBIS models   
                                                using current controlled voltage
                                                sources
1:20    Vivek Raghawan  Performance             Package Parameters
                        Signal Integrity
1:40    Panel                                   Package Parameters
2:10    Panel                                   SSO:  Sharing of Vcc and Ground
2:45    Break
3:05    BIRD discussion, voting
4:00    Open issues, action item review, summary

BIRDs

BIRD #1
We discussed ICs in which diodes and buffer transistors are referenced to 
different voltage rails.  Stephen Peters proposed that he add support for 
multiple voltage rails to BIRD#1.  Because of the other issues that came up with
diodes on ECL parts and requirements for mixed supply parts, he decided to 
rewrite the BIRD#1 to include voltage rail statements, put it out as BIRD#3, to 
substitute for BIRD#1, and close BIRD#1.  Since the meeting, Stephen concluded 
that it was easier to revise and close BIRD#1, replaced by BIRD#3, dealing with 
ECL alone.  He has also created BIRD#4 to address multiple rails.

On the subject that Bob Ross brought up during the previous meeting regarding 
diodes on ECL parts, the clamp diodes on ECL parts are strictly for ESD 
protection and don't affect the signals in normal operating conditions.  The 
signal swings in ECL are so small that the ESD diode should never be forward 
biased.  If the diodes are turned on, the part is far beyond operating ranges.  
With the new voltage rail support in BIRD#4, the user would be able to specify 
the ESD diodes.

Kumar discussed Cadence's approach to multiple rails.  In their table called VI,
they use a keyword, "vreference" that specifies the Vcc used for that curve.  
Kumar says that this approach is very simple and works.

AR:  Kumar write up example and send to reflector. - Done.

BIRD#2

Bird 2 - there are many unresolved issues regarding input thresholds.  There was
a discussion on what the real trip point should be for logic devices and how we 
might handle non-logic devices such as resistor packs.

AR- Jon Powell  post BIRD#2 to reflector Friday afternoon.  DONE

We engaged in a discussion on monotonic behavior.  There are two aspects to be 
dealt with.  1) How should we deal with output buffers that exhibit 
non-monotonic behavior (and in what situations does this occur), and 2) Must 
data be entered in the IBIS file monotonically?

1) Non-monotonic buffer behavior:  Arpad asked, "Do we require monotonic 
behavior in curves?"  If this is a requirement, the parser must check for 
monotonicity.

Jon Powell said that customers want to model non-monotonic parts.  Non-monotonic
behavior can result from slow feedback designed to prevent parts from melting;  
thus is is more of a DC phenomenon than an AC phenomenon.  Does this pose a 
convergence problem for some simulators?  Is a DC representation of the curve 
acceptable for some devices?  Due to DC current limiting, DC measurements may 
imply non-monotonic behavior that would never actually occur under real 
switching conditions.  How do we measure in an AC manner instead of DC manner?

Behavior that is nonmonotonic due to feedback goes into the controlled slew rate
discussion, modeling the dynamic characteristics of device.  For IBIS to be 
useful, it must deal with negative resistance regions.

2)  Monotonic data entry:  We felt that in IBIS tables, voltage values should be
monotonically rising or falling, but that current values may change.   The 
parser should check whether the data is good, but it shouldn't restrict the type
of data.  A BIRD against the parser should be written at some point to add 
checks for this in rev 2.0.  No specific AR owner was identified.


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Date: Tue, 9 Nov 93 16:42:43 PST
From: maah@contec.COM
Message-Id: <9311100042.AA25561@contec.COM>
To: ibis@vhdl.org
Subject: BIRD 2

Gentle IBIS folk!

I have a few comments to make about BIRD 2 at this time. I believe we are also planning to
discuss BIRD 2 at the upcoming IBIS summit on November 12, 1993.

1. Some clarifications are needed as to why we need VINL and VINH, from the technical point
of view. It would appear that I-V data along with some ac parameters (capacitances, etc.)
should be sufficient for inputs/receivers.

2. Requiring specicifications of VINL and VINH increases the amount of data that the
vendors must supply, and this could prevent widespread acceptance of the IBIS specs. 

3. IBIS should be useful for both digital as well as analog designs, since we are only
looking at the inputs and outputs. Requiring VINL and VINH as BIRD 2 proposes 
would restrict the applicability and usefulness of IBIS to digital devices only, since
analog devices don't have VINL nor VINH.

4. Anybody who was certified as IBIS-capable/IBIS-ready can already handle inputs/receivers 
without the requirement of VINL and VINH.



Maah Sango
Contec Microelectronics USA Inc.
From bward@dadhb1.ti.com  Wed Nov 17 09:32:18 1993
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From: Bob Ward <bward@dadhb1.ti.com>
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Subject: Package parameter measurements
To: ibis@vhdl.org
Date: Wed, 17 Nov 93 11:24:35 CST
Mailer: Elm [revision: 70.85]

Hello fellow "bird" watchers -

( Actually I couldn't resist the urge, you're right the pun is bad. )

First let me congratulate everyone for a most enjoyable and productive summit!
I thought there was some truly excellent discussion there, and hope for more in 
the future.  Thanks to Intel for hosting it!

While in the course of some of the discussion, the subject came up about whether 
or not package parameters are indeed measurable or not.  We in TI have had a 
method for doing so for some time, and I have known of it but not much about it.
At the time of the meeting I said nothing about it since I wasn't sure of the 
proprietary or non-proprietary nature of it.  I have asked around and found that
it is not proprietary and has been presented at some conference or another.  I 
have requested a paper on it and am told it is being sent to me.  When I receive
it I will either summarize it, or send out a reference to it depending on what 
it is exactly.
--

=============================================================================

     __                          /             
    /  \                  /     /                     Bob Ward
   /__ /        /        /  /  /            /   MSG:  SQU       
  /    \  _    /_       /  /  /  _   __  _ /   INET:  bward@dadhb1.ti.com
 (____ / (_)_ /__)     (__(__/  (_(_/ (_(_/           713+274-4146 Voice
                                                      713+274-3911 Fax

=============================================================================
                                   ___
                                  (o o)
-------------------------------ooO-(_)-Ooo-----------------------------------

        Here I sit in endless joy, 'cause I was here before Kilroy!!!
From speters@ichips.intel.com  Wed Nov 24 16:45:17 1993
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To: ibis@vhdl.org
Subject: Ramp "time" vs. Ramp "rate"
Date: Wed, 24 Nov 1993 16:44:13 -0800
From: Stephen Peters <speters@ichips.intel.com>



Hello fellow IBISans --

     There is a inconsistancy in the wording of the specification
regarding the dV/dt_f and dV/dv_r parameters.  In section of 3 of the
"NOTES ON DATA DERIVATION METHOD" the first section that specifies the
output loading refers to ramp "rate".  The second section that outlines
the minimum and maximum conditions refers to ramp "time".  It may look
like a small point but it was causing a bit of confusion among several
modlers here as they tried to figure out what really was ment.  I don't
know if this is worth a bird on it own, but I wanted to bring it to
peoples attention.


	Best Regards,
	Stephen Peters
	Intel Corp.
From ccm!Will_Hobbs@intelhf.intel.com  Mon Nov 29 11:49:20 1993
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Date: Mon, 29 Nov 93 11:52:10 PST
From: Will Hobbs <Will_Hobbs@ccm.hf.intel.com>
Message-Id: <931129115210_5@ccm.hf.intel.com>
To: ibis@vhdl.org
Subject: Summit Minutes, Part Deux

                                    Minutes
                         Fall '93 IBIS Open Forum Summit
                           Santa Clara, CA, 11/12/93
                                   Will Hobbs
                           Part 2, Afternoon Session

     Afternoon Session

     Kumar of Cadence: Simultaneous Switching Noise, A Package Library Based
     System

     Key to modeling packaging noise is in the library: Cadence defines
     three levels in its hierarchical packaging model: I/O Cell Level (the
     circuit), Pin Level (bonding pad placement), Package Level.  Cadence
     has added a mapping file that relates an I/O model to a particular Vcc
     and ground pin.  This had been a part of the IBIS specification
     originally, but there was doubt that vendors would give out the mapping
     data, so it was dropped.

     To model Vcc, ground and signal coupling effects, the models need to
     supply Vcc information, mutual inductance and skew between switching
     times of outputs that share Vccs and grounds.

     Signal and ground mutual inductance can actually improve the ground
     bounce characteristics.  In any case, if mutual inductance has an
     effect, it is worth modeling.  The data needs to be used in the correct
     way.  If mutual inductance is included, you need to keep signals in the
     right order and make sure all are modeled; otherwise, some effects will
     not be correctly modeled.

     Cadence would like to solicit our feedback on how packaging should be
     handled; is Cadence's hierarchical approach the way we want to do it?

     Vivek Raghawan of Performance Signal Integrity: Packaging.

     Vivek's presentation was a good follow-on to Kumar's discussion.  IBIS
     as it currently exists, assumes there is no coupling between pins, that
     power and ground are at fixed potentials, and it ignores the fact that
     on-die Vdd is not equal to board Vdd, etc.

     Vivek discussed the complexity of the mutual coupling, approaching a
     complex matrix of n**2 couplings (n-= number of pins).  The size of
     this matrix can be reduced by arbitrarily limiting scope of interest to
     2 neighbor pins on a DIP, or on a PGA to 8 neighbors (but which 8?  --
     depends on routing).

     Simultaneous switching of outputs (SSO) induces ground bounce that can
     result in false triggering of receiving devices, or shift the inputs of
     the IC that is switching so the inputs falsely trigger.  They also
     create timing delays at the receiving end.

     Adding in ground planes seriously complicates modeling the ground
     potential at different points on the plane (and chip) Likewise, adding
     multiple power and ground pins (as exist on most packages) is
     complicated-- you can't blindly assume they are in parallel.  Another
     complication is that package wires go through discontinuities.

     Vivek proposes an addition to IBIS with an optional [Package] keyword.
     If present, specifies .pkg file to use.  If absent, the package models
     (Rpin, etc.) in the .ibs file is used.  A .pkg file would include a
     linear sub-circuit, with valid elements of R, L, C, K.  We need a port
     naming convention.  There was a discussion between Cadence,
     Performance, Quad, Contec and TI of the use of K (applicable to Spice)
     and RLGC(?) nXn matrix representation.  Bob Ward of TI expressed the
     fear that if we use the SPICE syntax, it will send the wrong message to
     customers, that we really want to avoid SPICE syntax as much as
     possible.  Otherwise, people may be tempted to think that SPICE is
     valid at the frequencies we are looking at, which is not the case.

     Jon Powell told us of an SSO problem at one of their customers where an
     IBIS model predicted a 0.4 nS rise time, but the actual rise time of
     the part was 2 nS, due to ground bounce delays.  This underscores the
     need for package model improvements.

     A/R Kumar: Issue a BIRD on pin mapping.

     A/R Vivek: Address how to add more complex package model including pin
     to pin coupling.

     Break

     Birds

     BIRD 2.  Jon Powell, Input Thresholds

     Jon' motivation in proposing BIRD #2 was to improve the usefulness of
     IBIS models for customers wishing to do timing analysis of their
     systems.  Models are needed for signal integrity and for static timing
     analysis.  The latter requires input threshold data, since otherwise
     you don't know what to measure the delay to.

     In general, we felt that we don't want to restrict IBIS to digital
     only, so Input thresholds have to be optional.  If digital, we could
     default to 0.8 volts for Vil and to and 2.0 volts for Vih.

     We talked about an input-type parameter, such as "input = digital",
     input_analog = analog, input_load = ....  The default input type would
     be digital and the default thresholds would be Vil = 0.8, Vih = 2.0.

     We felt the parser (or the simulator) should check for model
     input-type.  If the input is digital and the IBIS model fails to
     include the threshold data, the parser (simulator) must issue a warning
     that says no threshold is specified, and therefore the defaults for Vil
     (0.8 V) and Vih (2.0 V) are assumed.  This would allow for backward
     compatibility with IBIS 1.1 and would also allow other defaults to be
     used as appropriate.

     After this discussion, Jon volunteered to rewrite the BIRD and
     re-submit it.

     A/R Jon Powell: Re-write Bird 2 to 2.1, re-submit to the reflector for
     discussion at upcoming Open Forum telephone conferences.

     BIRD #3, Multiple Rails, Stephen Peters.

     Stephen outlined the problem that he had encountered on a multiple
     voltage processor: An output buffer was supplied by the 3.3V rail and
     the clamping diode was connected to the 5V rail.  BIRD 3 addresses this
     problem.

     Kumar discussed Cadence's approach which calls out the rail at the top
     of the V/I column.  After some discussion, we realized that Stephen's
     approach covered the same purpose and Stephen pointed out that his
     intention was to preserve as much as possible the same format already
     in IBIS.

     We briefly discussed Vcc relative versus ground relative specification,
     with no new conclusion.

     The observation was made that Gnd_clamp doesn't make sense if the low
     clamp isn't = gnd.  We suggested High_clamp and Low_clamp, to which Jon
     Powell pointed out that just clamp is probably adequate, since the
     polarity of the clamp diode is implicit in the V/I data.

     We voted on BIRD #3 and passed it.  It will be incorporated into IBIS
     Version 2.0.

     Bird #4, ECL Extension, Stephen Peters

     Stephen described BIRD #4 which supersedes BIRD #1.  In essence, this
     BIRD relaxes the range over which data is collected, and requires the
     model file to explicitly say over what range data was generated.

     This BIRD, too, passed approval and will be incorporated into IBIS
     Version 2.0.

     Open Discussion, Open Issues

     All day, we had been collecting issues to address if we had time at the
     end.  The list included devices that employ feedback, monotonicity, and
     parser improvements.

     Feedback, Will Hobbs and Bob Ward

     Bob Ward (Texas Instruments) and Will Hobbs (Intel) discussed devices
     that have feedback, with GTL as the front-runner of concern.  The
     discussion addressed the real problem posed by feedback, whose
     characteristics depend on the reflected wave.  We reached no conclusion
     other than that we needed to seriously address the problem quickly, and
     that it wasn't going to be easy to solve.

     Jon Powell requested a set of voltage waveforms at the output pin of
     GTL drivers into different loads.


     Monotonicity, General Discussion

     We clarified that one axis of data representation should be monotonic,
     such as the voltage axis on the V/I curve, but that we could not
     require that the other axis be monotonic, since we were modeling real
     components whose nature may not be monotonic.

     Parser Improvements

     We briefly touched on ways that the parser could be improved, such as
     having it check for data range compliance and monotonically represented
     tables.  Another improvement would be if the parser could alert the
     user to bad or suspicious data (.e.g., message saying 29 A in middle of
     nA data is suspicious).  Jon Powell mentioned that he had some specific
     suggestions on how to improve coding style but would wait until we
     engaged a software engineer to tackle the Golden Parser for IBIS 2.0.

     Conclusion, Final Comments

     We reviewed the goals of the summit, which the summit largely met.  All
     attendees expressed the feeling that the summit was worthwhile, and
     some suggested we get together face to face much more frequently, such
     as every 2-3 months.  We decided to get together at least twice
     annually, and when we were approaching a critical juncture on a
     particular issue we could also convene.

     The level of interest and involvement by the EDA industry remains
     extremely high, and there is a slowly increasing level of participation
     by IC vendors.  We agreed that we must engage many more IC vendors in
     IBIS if we are to achieve the level of effectiveness and acceptance in
     the electronic industry that we feel IBIS should enjoy.  It is clear
     that I/O models are increasing in importance and that our efforts serve
     a real need.  Over the last year we have tackled many challenges and
     have succeeded in establishing IBIS as an industry standard.

     At this summit, we shared a tremendous amount of information, clarified
     our joint vision of where we are going, and created some challenging
     goals for ourselves for the coming year.  I want to sincerely thank all
     those who made the effort to attend, present and participate in this
     summit, and I hope this level of participation will continue in the
     coming year as we meet in our phone conferences to tackle our
     challenges.  And, I hope to see you all at the next IBIS Open Forum
     Summit.
From ccm!Will_Hobbs@intelhf.intel.com  Mon Nov 29 11:49:11 1993
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From: Will Hobbs <Will_Hobbs@ccm.hf.intel.com>
Message-Id: <931129115207_4@ccm.hf.intel.com>
To: ibis@vhdl.org
Subject: IBIS Open Forum Summit Minutes, Part 1


          I have already fax-ed these minutes to all those who
          attended the summit, as well as many who didn't.  but to
          make sure that all those who may be interested in what
          happened at the IBIS summit, I am posting them to the ibis
          reflector.  Due to limitations in our mailing program, I've
          had to split the minutes into two parts.  This is part 1.
          Part 2 will go out under separate cover (boy, what an
          anachronism that is!).

          Regards,

          Will Hobbs
          Intel Corporation

                                    Minutes
                         Fall '93 IBIS Open Forum Summit
                           Santa Clara, CA, 11/12/93
                                   Will Hobbs
                             Part 1, Morning Session

     Attendees:

     Cadence Design Systems          Zaki Rakib, Kumar
     Contec Microelectronics         Maah Sango
     Intel Corporation               Charles Anyimi, Gregg Fortner, Will Hobbs,
                                     Arpad Muranyi, Stephen Peters
     Interconnectix Incorporated     Bob Ross
     Intergraph Electronics          Walter Katz
     Logic Modeling Corporation      Randolph Harr
     MicroSim Corporation            Arthur Wong
     Performance Signal Integrity    Vivek Raghavan
     Quad Design                     Jon Powell
     Quantic Laboratories            Mike Ventham
     Siemens Nixdorf/Cadlab          Ralf Bruening
     Texas Instruments               Bob Ward
     Zeelan Technology               Hiro Moriyasu

     Agenda
     
     AM
     All                              Assemble, get acquainted, have coffee
     Will Hobbs        Intel          IC vendor view of IBIS
     Randy Harr        LMC            Die 0.9 bare die spec work with National
     Bob Ross          Interconnectix Measurement and Extraction of buffer data
     Stephen Peters    Intel          Obtaining Model Data from Simulation
     Break
     Jon Powell        Quad-Design    Slew Controlled Devices
     Arpad Muranyi     Intel          I/V/T
     Panel                            Handling Dynamic Char. of Buffers
     
     Lunch
     
     PM
     Kumar              Cadence       Simultaneous Switching Noise:  A Package
                                      Library Based System
     Vivek Raghawan     Performance   Package Parameters
                        Signal Integrity
     Break
     BIRD discussions:
     Jon Powell         Quad Design    BIRD 2
     Stephen Peters     Intel          BIRDs 1, 3, 4
     
     Open issues, action item review, summary
     
     Summit Goals

     * Synch up, share information
     * Share Industry/Company Updates
     * Discuss current areas of exploration and needs
     * Explore technical achievements, challenges
     * Successful techniques in use today
     * Problems or unsolved mysteries
     * Resolve ambiguity
     * Close in on IBIS 2.0 Definition
     * Identify ‘94 goals
     * Extend state of the art
     * Support customers’ needs
     * Make models widely available
     * Engage more IC vendors in IBIS activities

     We accomplished many of these goals.  Specifically:

     * We reviewed the results of IBIS to date.

     * We learned ways in which various companies were generating or
     extracting model data, and shared our thoughts on how to improve this
     data gathering process.

     * We identified areas of fairly immediate future concern for IBIS, such
     as modeling switching noise, complex package interactions, feedback and
     controlled slew rate devices.

     * We brainstormed on solutions to certain technical problems.

     * We clarified some areas that had not been clear to everyone, such as
     monotonic entry of data.

     * We ratified two proposals for IBIS 2.0, one for specifying multiple
     rails, and one for relaxing voltage ranges so that ECL can be
     supported.

     * We reviewed another BIRD (specifying input thresholds) and generated
     requests for two more (related to packaging and supply noise), to focus
     on in upcoming Open Forum meetings.

     * We shared much information on specific modeling needs, customer
     expectations and demands from each company's perspective.

     * We re-affirmed the need to engage more IC Vendors in IBIS activities.

     * We renewed our friendships.

     Morning Session

     Will Hobbs: An IC Vendor's View of IBIS, Distribution of I/O models

     After we introduced ourselves, I outlined the agenda and set forth some
     of the goals I hoped could be achieved at the summit.  I then
     summarized the accomplishments of the IBIS Open Forum to date.  I
     described where models fit in the design flow of systems and
     components, outlined the three phases of model development and
     described how Intel distributes our models.  Because Intel's strongest
     efforts are focused on new products, most Intel IBIS models have not
     been distributed except under non-disclosure.  Of approximately 20 such
     models, only one, for the 82430 PCI chipset, has been generally
     released.

     Randy Harr of LMC: DIE 0.9 bare die spec work with National

     Randy Harr of Logic Modeling discussed the work LMC and National
     Semiconductor are undertaking with ARPA on the DIE MCM (Multi-Chip
     Module) specification, dealing with bare die on a substrate and
     interconnected to other die on the same substrate.

     Randy described some of the bare die work currently in progress.  IBM
     is using up to 120 die on a ceramic substrate and other customers are
     doing chip on board.  A new approach is called Chips First, in which
     cavities are created on the board with the die occupying the cavities,
     tied together through gold interconnects on an overlying layer.

     The big problem for MCM manufacturers is getting information about the
     die from the die manufacturers.  (pad locations, models, dimensions,
     etc.).  The problem is exacerbated by changes in die size and re-layout
     between steppings that they are not informed of.

     DIE = Device Information Exchange, which is now at revision 0.9, is the
     answer to this information flow problem.  LMC is working with MCM
     foundries (IBM, Motorola, nCHIP, TI, Hughes, National Semiconductor,
     MMS), EDA vendors (Mentor, Harris EDA, Intergraph, Cadence, Racal
     Redac) and bare die vendors (National Semiconductor, Intel, Micron,
     IDT, Motorola, TI).

     The group is representing DIE and IBIS in SGML (standard Generalized
     mark-up language), a data interchange format for textual information
     that allows the viewer to choose the formatting.  SGML is being heavily
     used for hypertext applications.  Mosaic is a new application that
     "turns all of Internet to an SGML file," including video, text, sound,
     etc., from across the Internet.  Any SGML document can therefore be
     viewed worldwide over Internet using Mosaic.

     To put IBIS ASCII into SGML format only requires putting the keywords
     in angle brackets instead of square ones, and a few other changes to
     mark end of file.

     Randy volunteered to help companies convert their syntax over to SGML
     format.

     There is DIE 0.9 information in vhdl.org in /pub/die/

     Randy's foils went into details on the actual format of the DIE file,
     which is organized hierarchically, with some information required and
     other information optional.  In addition to internally specified data,
     the specification allows external references to other files in other
     formats, including IBIS, BSDL, VHDL, WAVES and EDIF descriptions.

     DIE 0.9 adds a definition of what subset of IBIS data is required for
     DIE files.  Randy suggests we add that subset definition to the IBIS
     specification itself.

     Randy's presentation ended with specific recommendations for
     "improvements" to IBIS:

     1. Well defined measurement methodologies
     2. Explicit process de-rating
     3. Change the pull_up Vcc-reference to ground-reference
     4. Add I/V/T modeling to pull_up and pull_down
     5. Improve the package model so beam lead (TAB, ribbon) devices can be
        incorporated nicely
     6. Clean up and normalize syntax, possibly change to SGML style

     Note 1: At Intel, we considered item 2 originally, and chose not to
     explicitly call that out for two reasons: different processes require
     different de-ratings, and vendors may not wish to make the size of
     their process variations public knowledge.  -- Will

     Note 2: Item 1 is addressed in V1.1 of IBIS to the extent possible,
     since equipment varies from company to company.  We (the Open Forum)
     may choose at some time to put out a measurement guide that improves on
     this.  Item 3 has been discussed repeatedly and will not be changed due
     to backward compatibility issues.  Items 4 and 5 were addressed at the
     Summit, and will be subjects of further discussion and BIRDs.


     Bob Ross of Interconnectix: Measurement and Extraction of Buffer Data

     Bob's foils focused on obtaining model data by measurement of silicon,
     for both CMOS and TTL technologies.

     The measurement process is largely a database management problem.  The
     problem is in mapping data: you might not have all parts in all
     packages, so you have to figure out how to map data from a part in one
     package type into another package.  It is also an inventory control
     problem, cataloging, mapping data.

     The data comes from data books and from measurement.  Bob's remaining
     discussion focused on measurement.

     Sweep range is an issue, because some devices can be destroyed by
     sweeping beyond the rail.

     There are several defined buffer types (input, output, I/O, tri-state,
     open drain), which drives what information you collect.  Collection of
     data from measurement is a decomposition problem, of trying to sort out
     the effects of clamps from buffers etc.  The companies with whom Bob
     has worked (Zeelan and Interconnectix) do this decomposition with
     software.  One problem is selecting measurement regions with abnormal
     behavior, such as non-monotonic behavior caused by device switching or
     "jumps" in the ESD protection during sweeps.  Their software does some
     filtering of data to eliminate false abnormal behavior.  They can also
     filter for monotonic behavior.

     Many databases contain >200 data points.  They select a subset of the
     data, generally based on a fitting algorithm to make model smaller
     without sacrificing key data.

     Measuring with data book loads can often produce misleading results.
     For example, some devices connected to a 500 ohm load will exhibit
     large overshoot due to on-chip charge storage effects.  One would
     rarely or never see this in a real system.  IBIS specifies a 50 ohm
     load, but that's not always appropriate.

     The challenges in measuring data from parts include test board
     considerations; power supply selection, logic state selection, range
     selection, signal integrity problems, presence of nearby grounds, 50
     ohm transmission line environment, clean signal sources, high speed
     data acquisition hardware, load configuration, method of automatic data
     acquisition and storage.

     "Clamp data is the most significant, most under-specified data in
     dealing with signal integrity problems."

     Stephen Peters of Intel: Obtaining Model Data from Simulation

     Stephen Peters described how Intel creates IBIS data from our internal
     Spice-like simulator called TIM/CSE.  He also described how Intel
     engineers validate the data against silicon, and some of the problems
     in obtaining data.

     The model engineer acquires the I/O buffer schematic and process file
     from their respective engineers, and analyzes the schematic to see what
     portion of the design has to be modeled.  (S)he also must understand
     enough of the circuit to know which nodes to tie to what state to
     produce a rising or falling edge, a high or low state.

     The derived model is used in a simulation into standard loads; the
     actual buffer circuitry design is simulated into those loads in the
     Intel simulator, and the results are compared against simulations of
     the IBIS models run on representative commercial simulators using the
     same loads.

     When silicon becomes available, curve tracers are used with a slow
     sweep to obtain actual data which is then correlated against the data
     derived from simulation.  Corrections to the model are made if
     necessary.

     Jon Powell of Quad Design: Behavioral Models and Time-Varying Devices.

     Jon discussed the problem of modeling slew-rate controlled devices.  He
     described one method used to obtain slew control, which involves
     paralleling multiple output devices and turning them on sequentially.
     Unfortunately, the behavior of such designs is difficult to measure
     with a DC measurement methodology: transistor switching transitions are
     not predictable from DC measurement.  We therefore need a simple AC
     measurement technique.

     The other approach to controlling slew rate, using feedback, poses
     other problems.  Feedback is not adequately addressed in IBIS so far.

     Jon showed an example using a SPICE and an IBIS model: with a 50 pF
     load, IBIS and SPICE match well, but for a 50 ohm load, the
     non-feedback (IBIS) model exhibited an extremely fast rise time, while
     the SPICE version showed the correct, slower, slew rate.  (Overlap of
     turn-on and tun off was eliminated on that particular example that
     caused the difference.)

     Although DC measurement techniques fail to show the turn-on/off
     timings, by using terminated transmission lines in SPICE simulations
     you can see the turn-off and turn-on of various devices easily.

     Jon then looked at generating data from devices by using AC I/V curves:
     by driving different transmission line loads, you can generate
     different I/V data, but this is time consuming.  Conclusion:
     Preferably, I/V data should be developed from SPICE models by the IC
     manufacturer, since all semiconductor vendors have internal circuit
     modeling capabilities.

     Arpad Muranyi of Intel: Present State of IBIS Modeling, and Extending
     it to Handle I/V/T.

     Arpad focused on ramps, and how they can be specified in a non-linear
     fashion.  One problem is that at the point of transition from high to
     ramp-down, the V/I curves that are applied to the simulation are
     switched from the pull-up to the pull-down.  This could cause a step, a
     discontinuity.

     Presently, as the ramp-down occurs, the voltage that acts as a pointer
     into the V/I curve data is the difference voltage between the output
     pin and the buffer output (the curve data).  Jon said that Quad
     understands that there is a time involved in switching from the pull-up
     curve to the pull-down curve, and inserts a smoothing function to
     represent this switching transition.

     Arpad feels we need a surface plot to show how the V/I curves vary with
     respect to time.  We would need four surface plots to fully specify a
     buffer: pull-up turn-on, pull-up turn-off, pull-down turn-on, pull-down
     turn-off.  Data can be derived from SPICE fairly easily, but so far we
     haven't come up with an adequate way via measurement.  If you measure
     devices driving into a constant voltage, you cancel package
     capacitance.  If you measure into constant current, you cancel out
     inductance; measuring into a constant voltage cancels capacitive
     effects; and measuring into a constant impedance incurs effects from
     both capacitance and inductance.

     Although the point was understated, Arpad called me later to emphasize
     that he has had success with 3D modeling and that he would write up
     some details for distribution to attendees.

     Arpad's family of curves was generated by holding a voltage constant,
     then turning on and off the voltage, plotting current against time,
     then re-running at a different voltage.  Turn-off time is much faster
     than turn-on.  Turn-on time is determined by the gate R/C of the
     pre-driver.  Generally, slew rates aren't controlled by keeping the
     pull-down on partially while you are turning on the pull-up (or
     vice-versa).  Except in DC load conditions, the turn-off
     characteristics can probably be largely ignored.

     The challenges we must address: * How do we represent this surface
     data?  * How many points are needed to describe the surface?  * How can
     IBIS transport the data?  (Some assumptions can reduce the amount of
     data points.) * How can this data be measured?  (Need a fast current
     probe) * How do we deal with package effects?

     Panel discussion, chaired by Jon Powell and Arpad Muranyi: Handling
     Dynamic Characterization of Buffers

     Jon expressed dismay that some of the key drivers from the EDA industry
     were absent, notably Kellee Crisafulli of HyperLynx, and Integrity.
     For Quad, their primary interest is the device switching time (how long
     a transistor takes to turn on or off) and the delay between the turn on
     times of parallel devices.

     Stephen made the point that V/I curves vary depending on the DC point;
     Jon said that at least in Quad's case, they know how transistors turn
     on and turn off and they account for that.  If IC Vendors wanted to
     provide the more complete V/I data, you could gain 2% more accuracy,
     but at the expense of huge amounts of simulation time.

     We don't want to so complicate the gathering of data that manufacturers
     will be scared off.  We could have several levels of model so we could
     still keep it simple for those that don't want to gather the surface
     data.

     Data points could be minimized by creating a polynomial that describes
     the surface or describes the scaling factor to be applied to the V/I
     curves.

     Ground bounce simulation is the critical thing customers are after in
     wanting slew rate control information.

     Lunch

     Lunch time discussion abounded between individuals, and I wasn't taking
     notes.
From ccm!Will_Hobbs@intelhf.intel.com  Tue Nov 30 11:24:34 1993
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From: Will Hobbs <Will_Hobbs@ccm.hf.intel.com>
Message-Id: <931130112741_11@ccm.hf.intel.com>
To: ibis@vhdl.org
Subject: Meeting Reminder, 12/3


From:    Will Hobbs, (503) 696-4369; fax (503) 696-4210
         Manager, Models Engineering
         Xcceleration Tools Group
         Intel Corporation
         5200 N.E. Elam Young Parkway
         Hillsboro, Oregon 97124
         
Subject: Meeting Reminder, 12/3
Date:    November 29, 1993


When:  December 3, 1993, 9:00 AM to 11:00 PDT.
Where: Phone number, (415) 904-8944.
How:   Reservation number is 550560 (this meeting only).
       Dial direct, ask for Will Hobbs in the IBIS Open 
       Forum.

Please note:  If you know of someone new who wants to join 
the email reflector (ibis@lmc.com), or if you have updates 
to your email address, email to ibis-request@vhdl.org.


IBIS Agenda, 12/03

9:00   Check-in
9:05   Introductions of new IBIS members
9:10   11/12 Summit Minutes Review,
       Opens for New Issues                   Will Hobbs
9:15   Enlisting new IC Vendors               W. Hobbs, All
9:20   Opens from Summit
         Complex package Specifications       Vivek Raghawan
         Pin Mapping                          Kumar
         New Model Types (R-Packs, etc.)      Jon Powell
9:50   BIRDS
         VIH, VIL Input Threshold, Bird #2.1  Jon Powell
10:15  Other Opens
         How do EDA Vendors support IBIS?     W. Hobbs, All
         Open Side                            K. Crisafulli
         Spec Ambiguity (ramp time)           W. Hobbs,
                                              S. Peters
10:50  Wrap-Up
       Action Items
       Next Meeting Plans
From Mei.Wong@bunyip.metasw.com  Wed Dec  1 11:50:55 1993
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From: Mei.Wong@bunyip.metasw.com (Mei Wong)
Encoding: 177 Text
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To: ibis@lmc.com
Cc: Mei.Wong@bunyip.metasw.com
Subject: IBIS

To whom it may concern,
please add mei@metasw.com to IBIS distribution list.
Thanks.

Regards,
Mei Hsu Wong
Product Marketing Manager
Meta-Software Inc.
(408) 369-5407
From cpk@Cadence.COM  Wed Dec  1 14:26:52 1993
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Date: Wed, 1 Dec 93 17:24:03 -0500
From: cpk@cadence.com (C. Kumar)
Message-Id: <9312012224.AA22339@hot>
To: ibis@vhdl.org
Subject: BIRD #??? (yet to be issued) 
Cc: cpk@Cadence.COM

Hi guys:

I am sorry I forgot the procedure to issue a BIRD. Here is my proposal
which has to yet get the official BIRDIE seal.

------------cut-----------------------------------------------------------------

                Buffer Issue Resolution Document  (BIRD)


BIRD ID#: 	????
ISSUE TITLE:	Pwr and gnd pin mapping
REQUESTER:	C. Kumar, Cadence Design Systems

DATE SUBMITTED: December 1, 1993
DATE ACCEPTED BY IBIS OPEN FORUM:

*******************************************************************************
*******************************************************************************

STATEMENT OF THE ISSUE:  This proposal addresses the need to extend the
IBIS specification to include ground and power pin mappings.

*******************************************************************************

STATEMENT OF THE RESOLVED SPECIFICATIONS: 

The proposal is to add two more optional columns to the pin specification
statement. These columns are named gnd (for ground) and pwr (power). These
identify the power and ground pins associated with the signal pin in
question. Following is an example:

Pin]	signal_name	model_name	gnd	pwr
1	RAS0#		Buffer1		10	18
2	RAS1#		Buffer2		12	20
....
...
...
10	GND		GND1		
...
12	GND		GND2
....
18	Vcc3		PWR1
...
20	Vcc5		PWR2
*******************************************************************************

ANALYSIS PATH/DATA THAT LED TO SPECIFICATION:

1. There are devices which have multiple power and ground supplies. The 
   above format will unambiguosely identify the power and ground pins 
   associated with a given signal. Besides the suggested extension is
   evolutionary and should be easy to digest.

*****************************************************************************

ANY OTHER BACKGROUND INFORMATION:

*******************************************************************************


From ccm!Don_A_Telian@intelhf.intel.com  Wed Dec  1 15:43:49 1993
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Date: Wed, 1 Dec 93 15:47:01 PST
From: Don A Telian <Don_A_Telian@ccm.hf.intel.com>
Message-Id: <931201154701_1@ccm.hf.intel.com>
To: Arpad_Muranyi@ccm.hf.intel.com, Will_Hobbs@ccm.hf.intel.com, ibis@vhdl.org
Cc: cpk@Cadence.COM
Subject: Re: BIRD #??? (yet to be issued)

Kumar,

Many signals will reference multiple pwr or gnd pins.  How would you
handle that?  The BIRD seems to make allowance for only one pin.  Is
the bussing of "GND2" carried through its name?

Don Telian
_________________________________________________________________________

Hi guys:

I am sorry I forgot the procedure to issue a BIRD. Here is my proposal
which has to yet get the official BIRDIE seal.

------------cut---------------------------------------------------------------
---

                Buffer Issue Resolution Document  (BIRD)


BIRD ID#: 	????
ISSUE TITLE:	Pwr and gnd pin mapping
REQUESTER:	C. Kumar, Cadence Design Systems

DATE SUBMITTED: December 1, 1993
DATE ACCEPTED BY IBIS OPEN FORUM:

******************************************************************************
-*
******************************************************************************
-*

STATEMENT OF THE ISSUE:  This proposal addresses the need to extend the
IBIS specification to include ground and power pin mappings.

******************************************************************************
-*

STATEMENT OF THE RESOLVED SPECIFICATIONS:

The proposal is to add two more optional columns to the pin specification
statement. These columns are named gnd (for ground) and pwr (power). These
identify the power and ground pins associated with the signal pin in
question. Following is an example:

Pin]	signal_name	model_name	gnd	pwr
1	RAS0#		Buffer1		10	18
2	RAS1#		Buffer2		12	20
....
...
...
10	GND		GND1		
...
12	GND		GND2
....
18	Vcc3		PWR1
...
20	Vcc5		PWR2
******************************************************************************
-*

ANALYSIS PATH/DATA THAT LED TO SPECIFICATION:

1. There are devices which have multiple power and ground supplies. The
   above format will unambiguosely identify the power and ground pins
   associated with a given signal. Besides the suggested extension is
   evolutionary and should be easy to digest.

*****************************************************************************

ANY OTHER BACKGROUND INFORMATION:

******************************************************************************
-*
From cpk@Cadence.COM  Thu Dec  2 06:41:16 1993
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Date: Thu, 2 Dec 93 09:37:51 -0500
From: cpk@cadence.com (C. Kumar)
Message-Id: <9312021437.AA22631@hot>
To: Arpad_Muranyi@ccm.hf.intel.com, Will_Hobbs@ccm.hf.intel.com, ibis@vhdl.org,
        Don_A_Telian@ccm.hf.intel.com
Subject: Re: BIRD #??? (yet to be issued)


This scheme has an implied assumption. i.e. each signal can be uniquley identified with one power and one ground pin, while the package itself can have
multiple power and ground pins. It merely makes the association between signal
pin and corresponding power and ground pins  explicit.

If you have a more robust scheme can you propose it?

Thanx
- kumar
From bracken@valhalla.performance.com  Thu Dec  2 07:41:46 1993
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To: ibis@vhdl.org
Subject: Re: BIRD #??? (yet to be issued)
In-Reply-To: Your message of "Thu, 02 Dec 93 09:37:51 EST."
             <9312021437.AA22631@hot>
Date: Thu, 02 Dec 93 10:41:49 -0500
From: bracken@valhalla.performance.com


Y'all,

  Say we have:


  Pins:    11    12     13                    21    22     23
           +     +      +                     +     +      +
           |     |      |                     |     |      |
	   |     |      |                     |     |      |
  Buses:   +-----+------+-----> to a few      +-----+------+-----> to a few
	      GNDBUS1           drivers          GNDBUS2           more


In Kumar's suggested format we have:

[Pin]	signal_name	model_name	gnd	pwr
1	RAS0#		Buffer1		10	18
2	RAS1#		Buffer2		12	20
....
...
...
11	GND		GNDBUS1
12	GND		GNDBUS1
13	GND		GNDBUS1
....
21	GND		GNDBUS2
22	GND		GNDBUS2
23	GND		GNDBUS2


One problem with this (as I see it) is that the *model* names GND and POWER
are "special" (they indicate that the pin is NOT connected to an ordinary
nonlinear I-V curve model, and so we don't go looking for that model in
the .ibs file.)  In the suggested format above, we don't have any way to
tell that GNDBUS1 isn't an I-V model.

The *signal* names, of course, are sacred because they appear in the
schematic symbol for the part.  Pins that connect to separate internal
buses might just be given the same name (e.g. GND) in the schematic, and
so we can't rely on these to distinguish buses.

I suggest we instead use the two remaining columns to specify the associated
bus names; for example,

[Pin]	signal_name	model_name	gnd		pwr
1	RAS0#		Buffer1		GNDBUS1		PWRBUS1
2	RAS1#		Buffer2		GNDBUS2 	PWRBUS2
....
...
...
11	GND		GND		GNDBUS1  	NA
12	GND		GND		GNDBUS1  	NA
13	GND		GND		GNDBUS1  	NA
....
21	GND		GND		GNDBUS2  	NA
22	GND		GND		GNDBUS2  	NA
23	GND		GND		GNDBUS2		NA

It's now clear which pin is a lowly ground pin (and not an I-V model),
and it's also clear to which bus every GND pin and every driver is
connected.

Now there's no ambiguity--I think...

But what would we do with buffers that have connections to multiple 
supply voltages?

--Eric Bracken
  bracken@performance.com
From bward@dadhb1.ti.com  Thu Dec  2 07:58:17 1993
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Date: Thu, 2 Dec 1993 09:50:23 -0600
From: Bob Ward <bward@dadhb1.ti.com>
To: ibis@vhdl.org
Subject: BIRD #??? ( yet to be issued )

Ibis folks -

Don Telian beat me to it, but his concern about signal pins mapping to 
multiple power or ground pins is real.  We have chips that do just that,
with the bussing connections made both on the leadframe and on the chip.  In
fact we need to be ready to handle all the possibilities of one power/ground
pin mapping to several signals, one signal mapping to several power/ground
pairs, one to one mapping, etc.  I am not quite sure I have the answer as to 
how to do it in the ibis data tables, but I can add weight to the reality of
the requirement.

Thanks,

=============================================================================

     __                          /             
    /  \                  /     /                     Bob Ward
   /__ /        /        /  /  /            /   MSG:  SQU       
  /    \  _    /_       /  /  /  _   __  _ /   INET:  bward@dadhb1.ti.com
 (____ / (_)_ /__)     (__(__/  (_(_/ (_(_/           713+274-4146 Voice
                                                      713+274-3911 Fax

=============================================================================
                                   ___
                                  (o o)
-------------------------------ooO-(_)-Ooo-----------------------------------

        Here I sit in endless joy, 'cause I was here before Kilroy!!!
From cpk@Cadence.COM  Thu Dec  2 08:53:52 1993
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From: cpk@cadence.com (C. Kumar)
Message-Id: <9312021651.AA22719@hot>
To: ibis@vhdl.org, bracken@valhalla.performance.com
Subject: Re: BIRD #??? (yet to be issued)


I think Eric's proposal is more general while still being simple
and evolutionary. Is there anybody else who can think of even a better 
solution?

- kumar
From bward@dadhb1.ti.com  Thu Dec  2 08:56:38 1993
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From: Bob Ward <bward@dadhb1.ti.com>
To: ibis@vhdl.org
Subject: More on BIRD #???

Just One More Thing (tm)  [Promises, promises!]

So I just sent my note about adding weight to the requirement about using
multiple power and ground pin mappings, and Eric Bracken's letter showed up
that indicates I should have elaborated further on our bussing structure.  In
at least one case, we have a chip that will be particularly nasty for things
like simultaneous switching studies, even though that is one thing that ibis
models will be in demand for.

The structure in question is this:



             pwr/gnd                   pwr/gnd
                p                         p     -----------
                i                         i          |
                n                         n      leadframe
                |                         |          |
                +-+-------+------+------+-+     -----------
                  |       |      |      |      bond wire/pad
                  |       |      |      |
                +-+-+   +-+-+  +-+-+  +-+-+     -----------
                |   |   |   |  |   |  |   |          |
                d   d   d   d  d   d  d   d          |
                r   r   r   r  r   r  r   r          |
                i   i   i   i  i   i  i   i       on chip
                v   v   v   v  v   v  v   v          |
                e   e   e   e  e   e  e   e          |
                r   r   r   r  r   r  r   r          |
                |   |   |   |  |   |  |   |     -----------
                |   |   |   |  |   |  |   |      leadframe

The leadframe busses at least two, sometimes four, power or ground pins
together.  This is tapped at several points to provide connections to the
chip, where pairs of drivers are bussed together with on chip metalizing, on
both power and ground sides.  Now it seems to me that if we are trying to
determine this from external measurements made at the pins, we could if the
right combinations of simultaneous switchings were induced while the output
is monitored on the pin of interest.  But without some knowledge of the
circuit to start from, the number of measurements is potentially huge, and
the data potentially confusing.

I guess I toss this out to the group by way of saying "Help!", if anyone has
thoughts on how to handle this, I would like to hear them.  I admit to being
more than a little at a loss how to measure this in general and then also how
to specify it in ibis-isms once measured.  In specific cases it can be
asserted, and I would accept it, that it doesn't matter anyway.  That may the
situation in more cases than I think, and if that is so I am most happy to not
worry about it. But at the moment I am worried about it.  Discussion?
From bward@dadhb1.ti.com  Thu Dec  2 13:46:08 1993
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From: Bob Ward <bward@dadhb1.ti.com>
To: ibis@vhdl.org
Subject: Some more yet on the power bus question


Hi, ibis folks -
Thus saith bracken@valhalla.performance.com on 12 DEC 93 at 1538.48 hrs :
>
>Bob,
>
>  I have a few questions regarding this "complex" example:
>
>  1)  You say "in at least one case" this will occur--that makes it sound
>    like you folks don't design things this way very often.  Do you
>    see that situation changing (i.e. will more designs be done this
>    way in the forseeable future?)
>
>  2)  How fast is such a design operating?  The faster you go, the more
>    important the "details" become.
>
>  If it's a high-speed design that needs a high level of detail, then it
>  seems to me that you have the following choices:
>
>  a)  Use a SPICE subcircuit, with elements for each "leg" of this
>    topology;
>
>  b)  Measure the Z-parameters of the structure (inject an AC current
>    into each pin, and measure the resulting voltage drops
>    to every other pin.)  Do this versus frequency from DC
>    to "daylight" (or the maximum freq. of interest.)  Or, use S
>    parameters.
>
>  c)  Use RLGC matrices, with some additional information about how
>    each "leg" comes together at various nodes.  I assert that
>    this approach is tantamount to having a SPICE subcircuit,
>    but harder to read.
>
>You're quite right that the laboratory measurements become very
>difficult, even for finding the S or Z parameters.  For SPICE or RLGC
>matrices, lab work may be next to impossible.  At that point, you need
>numerical field solver software to generate the equivalent RL(G)C 
>networks.
>

We have just started this style of grouping with some faster parts in hopes
of getting less interaction between simultaneously switching drivers.  The
proof is in the testing, and if it works well, we will do more parts this
way.  Just at the moment we have done a couple that are not yet publically
announced, but are fast.  The details are indeed important.  I will not
upstage the announcement by saying just how fast is fast, but "Spice level"
simulations show the sensitivity to detail to be considerable.  I would hope
to be able to make ibis style models rather than Spice models for all the
usual reasons, less work ( maybe ), less exposure of proprietary circuitry,
etc.  The use of RLGC matrices was kicked around at the summit, and may be
the only real option for this case.  In fact it may be the primary option for
capturing leadframe parasitics in general.

I would, as I assume most of us would, like to see a more "ibis-like"
description, but that may not be possible.  I am awaiting a paper from one of
our modelling labs here concerning measurement of package parasitics to see
if the methods they discuss are applicable here.  I am told that I can share
at least a summary, if not the whole paper, with the ibis group, and I will
as soon as I receive it and make a little sense out of it.  Real heavy duty
field solving will probably become necessary before much longer to get a good
representation of package parasitics, since measurements are very delicate at
best.

The main thrust of what I am saying in my example is that "here are shades of
things to come"  and I hope we can grow ibis into a big enough and tough
enough bird to be able to handle it.


=============================================================================

     __                          /             
    /  \                  /     /                     Bob Ward
   /__ /        /        /  /  /            /   MSG:  SQU       
  /    \  _    /_       /  /  /  _   __  _ /   INET:  bward@dadhb1.ti.com
 (____ / (_)_ /__)     (__(__/  (_(_/ (_(_/           713+274-4146 Voice
                                                      713+274-3911 Fax

=============================================================================
                                   ___
                                  (o o)
-------------------------------ooO-(_)-Ooo-----------------------------------

        Here I sit in endless joy, 'cause I was here before Kilroy!!!
From lmsi!milpitas.lmc.com!randyh@UB.com  Thu Dec  2 15:31:47 1993
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Date: Thu, 2 Dec 93 15:23:11 PST
From: randyh@milpitas.lmc.com (Randy Harr)
Message-Id: <9312022323.AA02005@fiji.lmsi.com>
To: bward@dadhb1.ti.com
Subject: Re: More on BIRD #???
Cc: ibis@vhdl.org

For whatever it is worth:

We studied this issue in deciding what to do with the DIE spec work.  See the
files:

	pub/die/wrkshop2/electric.{mif,ps}    (white paper on topic)
	pub/die/wrkshop2/trans_te.{mif,ps}    (viewfoils on topic)

on vhdl.org (use same email request to archive@vhdl.org, ftp, etc. as for ibis).

We discovered and analyzed the various forms (even more detailed and
difficult than Bob Ward reports) but discovered most of the power / ground
bounce analysis tools could not handle the complexity.  We decided to
simplify to what Kumar of Cadence (or Eric's extension) is proposing --
one power and one ground pin specification per signal pad.  See the
DIE_PADS_SUPPLY_GROUPING (page 75 of the DIE Format Reference Manual ver 0.9;
in file pub/die/die0-9/die0-9.{rtf,ps} or on floppy given at Summit) for
our method of specification.  By the way, it is a Level 1 setting also!

randy harr
randyh@milpitas.lmc.com
