From owner-ibis  Mon Jul  1 07:16:19 1996
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Date: Mon,  1 Jul 1996 09:04:39 -0500 (CDT)
From: Joe Cahill <jcahill@VNET.IBM.COM>
To: ibis@vhdl.org
Subject: Closing the loop

I am no expert at tieing test specifications with design specifications,
but I would like to express some words of caution. In a nutshell testing
implies to me some sort of guarantee, guarantees imply some additional
inaccuracy, and some additional schedule time. I would rather have the
design engineer's best guess as to the performance of their devices,
when they have the design far enough along to make that determination. 

Testing to a specification means that you have to account for the tester
tolerances, the noise in the tester environment, and if you have a
sampled test scheme, some additional guardband for the non-sampled
parts. All of this to prevent 'bad' parts from testing as good. In my
experience, there is a fair amount of pressure to have the test
specification guardband the desired device performance, and to have the
published specification guardband the test specification.  Users end up
with published specifications that predict performance that is
dramatically different from the performance of the delivered parts. 

The additional time in the schedule comes because you have to involve
test organizations and some non-trivial sample of hardware before your
test specification becomes firm. Invariably the test specification
changes as the design engineer and the test organization learn about a
particular part. 

To close the loop, I would suggest you consider the hardware your
silicon modellers use to build the simulation models for the devices,
and the prototype hardware you build. 

          Joe Cahill - VLSI Development 


From owner-ibis  Tue Jul  2 10:06:01 1996
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Date: Tue, 2 Jul 1996 10:06:01 -0700 (PDT)
From: Jon Powell <jonp>
Message-Id: <199607021706.KAA05185@vhdl.vhdl.org>
To: ibis
Subject: new Pentium Pro Model

INTEL has release an updated pentium pro model
for 200Mghz Pentium Pro. New Ibis file is pent200.ibs.
pentpro.ibs is now obsolete and has (on request) been
removed from active IBIS release area. Additional
.txt files describing packaging are also available.


jon
ibis librarian

From owner-ibis  Tue Jul  2 15:55:42 1996
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Date: Tue, 2 Jul 96 15:48 PDT
From: bob@icx.com ( Bob Ross)
To: ibis@vhdl.org
Subject: IBIS Minutes 6/28/96

 DATE: July 2, 1996

 SUBJECT: 6/28/96 EIA IBIS Open Forum Minutes
 
 VOTING MEMBERS AND 1996 PARTICIPANTS LIST:
 AMP                            Hank Herrmann*, Tim Minnick, Russ Moser
 Cadence Design                 C. Kumar
 Contec CAE, Ltd.               Dileep Divekar*, Norio Matsui, Antonis Orphanou
 Cypress                        Bruce Wenniger
 Hewlett Packard, EEsof         Karl Kachigan, Henry Wu
 HyperLynx                      Kellee Crisafulli*
 INCASES                        Olaf Rethmeier*, Ralf Bruening
 Intel Corporation              Stephen Peters*, Will Hobbs*, Arpad Muranyi*,
				John Keifer, Aaron Tang, Duane Quiet,
				[Donald Telian], Jim Kruchowski
 Interconnectix, Inc.           Bob Ross, Chris Reid*
 Meta-Software                  (Sanjay Gangal)
 Mitsubushi                     Tam Cao, Hoang Nguyen
 Motorola                       Ahmed Omer
 National Semiconductor         Syed Huq*, Donald Snyder, Chune-Sin Yeh,
				Bill Aronson
 NCR (formerly ATT-GIS)         Dave Moxley*, Richard Mellitz
 NEC                            (Hiroshi Matsumoto),
 Quad Design                    Jon Powell*, Chris Rokusek*
 Texas Instruments              Roger Cline, Ben Andresen, Sri Jandhyala,
				Tareq Shahwan, Dan Phipps
 Thomson-CSF/SCTF               (Jean LeBrun)
 UniCAD Canada Ltd.             Celso Faia*
 VLSI Technology                Dick Ulmer, Sung Oh, Swami Gangadharan,
				Daniel Kim, Tom Dockery, D.C. Sessions
 Zuken-Redac                    (John Berrie)
 
 OTHER PARTICIPANTS IN 1996:
 Alcatel                        John Fitzpatrick*
 Altera                         Vadim von Brzeski
 Apteq Design System            Dan FitzPatrick 
 Compaq                         Mark Leonard
 Digital Equipment Corp.        Jeff Chu*
 EIA                            Patti Rusher*
 IC Works                       Eric Chen
 Micron Technology              Brian Johnson                       
 MicroSim                       Ralph Perez
 Molex                          Gus Panella
 North Carolina State U.        (Michael Steer)
 Oki Semiconductor              Tom Chao
 Philips Semiconductor          Mike Magdaluyo
 Rockwell Collins               Thomas Thurman
 S3, Inc.                       Sarathy Sribhashyam, Phap Duong    
 Seimans Nixdorf                Arnaud Lacariere
 Symmetry                       Andy Hughes
 Tektronix, Inc.                Brock Hannibal
 TRW & Free Model Foundation    Robert Harrison
 Veribest                       Ian Dodd, David Wiens
 VTC, Inc.                      Bob Ward
 Zeelan Technology              George Opsahl

 In the list above, attendees at the meeting are indicated by *.  Principle
 members or other active members who have not attended are in parentheses.
 Participants who have joined another organization are in square brackets.

 Upcoming Meetings: The bridge numbers for future IBIS teleconferences are as 
 follows:

      Date       Bridge Number    Reservation #    Passcode  
      7/19/96    (916) 356-9200   2-78903          6186335  
		 
 All meetings are 8:00 AM to 9:55 AM Pacific Time.  We try to have agendas out 
 7 days before each open forum and meeting minutes out within 7 days after.  
 When you call into the meeting, ask for the IBIS Open Forum hosted by Will 
 Hobbs and give the reservation number and passcode.
 
 NOTE: "AR" = Action Required.
 
 -------------------------------- MINUTES -------------------------------------

 INTRODUCTIONS
 Syed Huq chaired the meeting, and Jon Powell served as secretary.  (These
 minutes are based on Jon's and Will Hobb's notes and other inputs.)

  
 EIA MEMBERSHIP AND TREASURER'S REPORT
 Patti Rusher did not have updated figures, but estimates the treasury at
 about $6000 to $8000.  The treasurer's report was garbled due to a bug
 in Patti's program.  EIA will issue a new report soon.  AMP's invoice
 situation has been taken care of for now.


 MINUTES REPORT, MISC.
 The spelling Peivand Tehrani's last name has been corrected, and the paper
 is on page 1009 of the conference proceedings.

 The last meetings 9 AM to 1 PM times and Las Vegas, Nevada location have been
 added to the minutes.

 All previous AR's were handled including issuing BIRD36 and BIRD37 and data
 related to multi-staged driver models.
 

 MISCELLANY/ANNOUNCEMENTS
 None.


 PRESS AND WEB PAGE UPDATES
 Electronic Design, June 10, 1996, page 64, a HyperLynx introduction references
 IBIS.

 Electrical Engineering Times, June 17, 1996, pg. 86, a Veribest introduction
 references IBIS.

 Electronic News, June 17, 1996, pg. 46, Symmetry Design Systems announces
 IBIS modeling service and future models.

 The 1996 National Interface Databook, Chapter 13 on Modeling Support is
 devoted entirely to IBIS models and provides "An Introduction to IBIS
 Modeling Section" by Syed Huq, and also references many of the participating
 IBIS Committee CAE vendors and their tools.

 VLSI IBIS models are now available on the Web:

     http://www.vlsi.com/vlsi/products/ibis/ibis.html

 The EIA/IBIS web page has been enhanced to add tools selection.

 Quad Design is adding a page with hot links to all free IBIS models available
 throughout industry.

 Patti Rusher reports that the IBIS page is the second most popular EIA page.


 NEW MODELS
 None reported.


 OPENS FOR NEW ISSUES
 Secretary Position
 Series Resistor

 
 INTERNATIONAL STANDARDIZATION
 Patti Rusher Indicated that there is a project underway to gain money from
 DARPA for modeling programs.  The intention is to use the money to fill holes
 in the standards efforts, such as funding the Express Model.  This is 
 problematic since the University of Manchester can not receive US grant
 money directly.  They would have to be sub-contracted through a US company
 or university.  Some funding options exist and there may be some news in
 several weeks.

 Will Hobbs and Stephen Peters will give a presentation on modeling standards 
 at an international conference in Prague in July, 1996.

 AR - Stephen Peters and Will Hobbs will discuss the money and time for Express
 Representation with Hilary Kahn in Prague at an international standards
 conference.

 Ron Waxman has introduced IBIS as a work item into the IEC process.  So even
 without Express, the international standardization process is underway.


 SECRETARY
 Will Hobbs feels that the lack of a secretary needs resolution.  For now
 we are sharing the duty from meeting to meeting.  No one at the meeting
 indicated an interest in taking the post.  This must be a person from a
 member company since it is an official EIA committee position.

 AR - Syed Huq post a request to ibis@vhdl.org requesting volunteers.

 
 EGG11 - ABSOLUTE MAXIMUM VOLTAGE
 John Fitzpatrick of Alcatel requested a field be added to the model to specify
 the maximum voltage that can be sustained without damage.  Semiconductor 
 suppliers do not generally want to give out this information.  The issue is
 important for PCI interface components and components with split supplies.

 One use for this information would be to have the simulator pop out a warning
 if the maximum voltage limits (voltage versus time) is exceeded.  This could
 be handled on a per-model basis, as an optional parameter or parameters.  It
 might need to be a table.  Jon Powell asked if it was a non-linear table.  
 John indicated that it could be highly non-linear.

 This information could be tabulated like the other IBIS tables.  It could also
 be a single value.  Both positive and negative voltages would be tabulated.

 Kellee Chrisafulli pointed out that it may have to be power supply relative,
 such as one diode over Vcc.

 John plans to accept the comments and convert this into a BIRD.

 Several EDA vendors indicated that they would support issuing a message that
 indicates that the maximum safe levels have been exceeded.


 BIRD36 - ELECTRICAL BOARD DESCRIPTION
 Stephen Peters issued BIRD36 for an electrical board description.  Hank
 Herrmann provided several comments:
 (1) Add a NC (No Connect) in the pin list for open sided connectors
 (2) Strike the word "mated" (for unmated models)
 (3) Change minimum "rise" time to minimum "edge" time.
 (4) Set a limit on the total number of externally accessible pins.
 (5) Set a 5 character limit for the total number of pins.
 (6) Change the maximum number of characters from 5 to 8 under [Pin List]
 (7) Under [Path Description] the for node, the subparameter could be a .ibs
     model.

 The discussion involved whether IBIS would allow an .ebd file to describe a
 populated SIMM, for example.  There was a long discussion on whether this 
 should be allowed to be embedded within a .ibs file, or visa-versa (making
 the IBIS Specification very complex), or to keep it as a separate file.  The
 consensus was to keep it separate.  The golden parser will still have to check
 .ebd files.

 It would be desirable to allow a .ebd file to contain a reference to another
 .ebd file, to support situations such as SIMMs that plug into SIMMs.  Kellee
 Chrisafulli suggests we roll the BIRD such that the component can be either a
 .ibs or a .ebd file, and solicit further comments.

 Kellee was also concerned about the ambiguity of unit length.  He feels it
 should be explicitly specified to be treated as distributed LRC elements in
 the section where the length is specified.  Stephen will make this change.

 Chris Reid of Interconnectix noted that the pin number section has a potential
 problem with matrix creation when there is a mismatch between pin count and
 path count.  If a 16 pin connector has 32 pins, how do you define the matrix?
 You would want a 16 X 16 matrix, not a 32 X 32 matrix.  A few more examples
 would help.

 The specific changes were:
 (1) Add a keyword for reference designator mapping (ibs/ebd file and
     component).
 (2) Highlight that RLC are distributed.
 (3) Consider Hank's email comments.
 (4) Specify which pins are used in the matrix (or drop the matrix).  The
     matrix issue needs to be reviewed.
 (5) What are the boundaries of the model.  Where does one model end and
     another begin.

 It was suggested that Stephen roll in the suggested changes and issue BIRD36.1
 for a possible vote next meeting.

 
 BIRD35.1 - MULTI-STAGED OUTPUTS
 Jon Powell described BIRD35.1 as a method for scheduling sequences of output
 buffer characteristics.  The technical discussion was deferred until Bob Ross,
 author of BIRD35.1 can participate at the next meeting.  Jon noted the primary
 problem with this type of output is that there is no way to create a model via
 measurement.  Such buffers are usually implemented with internal delay lines
 to which measurements have no access.  Only the chip manufacturer would have
 access to this information.

 However, the conclusion was that BIRD35.1 is ready for a vote.
 

 EGG10 - PARSER ADDITIONS FOR NUMERICAL CHECKING
 Chris Rokusek stated that EGG10 checks for reasonable values in IBIS files.
 Chris has extracted all of the parameters out of an IBIS file and found some
 out of range values.  The raw data can be analyzed and discussed at the next
 meeting.  Arpad Muranyi noted that the data format of the files that were sent
 out were inaccessible to him.  (The data was retransmitted in ASCII form.)


 SERIES RESISTOR
 Arpad Muranyi suggested that we add support for series devices such as diodes
 and resistors to IBIS 3.0.  Jon Powell felt this was OK as long as the
 component could be specified as a V/I curve.


 NEXT MEETING:
 The next meeting is on Friday, July 19, 1996, 8:00 A.M. to 10:00 A.M.
 ==============================================================================
				       NOTES
 
 IBIS CHAIR: Bob Ross (503) 603-2523, Fax (503) 639-3469
	     bob@icx.com
	     Modeling Engineer, Interconnectix, Inc.
	     10220 SW Nimbus Ave, K4, Portland, OR 97223

 VICE CHAIR: Syed Huq (408) 721-4874, Fax: (408) 721-4785
	     huq@rockie.nsc.com
	     Staff Applications Engineer, National Semiconductor, M/S A-2595
	     2900 Semiconductor Drive, Santa Clara, CA 95052
 
 LIBRARIAN:  Jon Powell (805) 988-8250, Fax: (805) 988-8259
	     jonp@qdt.com
	     Transmission-Line Products Manager, Quad Design
	     1385 Del Norte Rd., Camarillo, CA 93010
 
 SECRETARY:  Vacant
 

 This meeting was conducted in accordance with the EIA Legal Guides and EIA
 Manual of Organization and Procedure.
 
 The following e-mail addresses are used:

   ibis-request@vhdl.org
       To join, change, or drop from either the IBIS Open Forum Reflector
       (ibis@vhdl.org), the IBIS Users' Group Reflector (ibis-users@vhdl.org)
       or both.  State your request.

   ibis-info@vhdl.org
       To obtain general information about IBIS, to ask specific questions
       for individual response, and to inquire about joining the EIA-IBIS
       Open Forum as a full Member.

   ibis@vhdl.org
       To send a message to the general IBIS Open Forum Reflector.  This
       is used mostly for IBIS Standardization business and future IBIS
       technical enhancements.

   ibis-users@vhdl.org
       To send a message to the IBIS Users' Group Reflector.  This is 
       used mostly for IBIS clarification, current modeling issues, and
       general user concerns.

   ibischk-bug@vhdl.org
       To report ibischk2 parser bugs.  The Bug Report Form Resides on
       vhdl.org in /pub/ibis/bugs/bugform.txt along with reported bugs.

 Information on IBIS technical contents, IBIS participants, and actual
 IBIS models are available on the IBIS Home page found by selecting the
 Electronic Information Group under:

   http://www.eia.org

 Check the pub/ibis directory on vhdl.org for more information on previous 
 discussions and results.  You can get on via ftp anonymous, "guest" login from 
 telnet or dial-in (415-335-0110), or send an e-mail request to the automatic 
 archive server, archive@vhdl.org.
 
 "IBIS Spoken Here" placards are available from Jon Powell (jonp@qdt.com) for 
 use at trade shows.
 ==============================================================================


From owner-ibis  Thu Jul  4 11:26:14 1996
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Message-Id: <m0ubszb-000GjKC@icx.com>
Date: Thu, 4 Jul 96 11:19 PDT
From: bob@icx.com ( Bob Ross)
To: ibis@vhdl.org
Subject: BIRD38 Maximum Voltage

Below is a proposal to include maximum input voltage specifications in an 
IBIS model. 

The key elements are:

   i) A new keyword [Maximum Voltage] is added per buffer model

  ii) Maximum inputed voltage tolerated as a function of time is given in
      a table

Two examples are included to explain why this information might be
useful to a board designer.
 
***********************************************************************


BIRD ID#:      38
ISSUE TITLE:   Maximum Voltage
REQUESTER:     John Fitzpatrick, Alcatel
DATE SUBMITTED:                       July 03, 1996
DATE ACCEPTED BY IBIS OPEN FORUM:     Pending

***********************************************************************

STATEMENT OF THE ISSUE:

IBIS can be extended to allow a component supplier specify maximum positive
and negative voltages (or currents) that can safely be applied to 
an I/O buffer.
These limits are expressible as a function of time to give maximum 
flexibility to board designers.

Note: Because IBIS simulation data is provided from -Vcc to 2Vcc, a
non-specialist might wrongly believe that these are the limits on
the applied voltage.

***********************************************************************

STATEMENT OF THE RESOLVED SPECIFICATIONS:

Add the following keyword after the [Model] keyword:

|=====================================================================
|
|    Keywords: [Maximum Voltage]
|
|    Required: Yes, unless the component works for all simulation points
|
| Description: Defines the maximum positive and negative voltages
|              that can safely be applied to an I/O buffer.
|
|  Sub-params: POWER_Clamp_Reference, Pullup_Reference
|
| Usage Rules: This keyword defines a table of voltage versus time points.
|              The table contains a minimum of three and a maximum of five
|              columns:            
|                  1- time
|                  2- maximum positive voltage for hi-Z state (tri-state)
|                  3- maximum negative voltage for hi-Z state 
|                  4- maximum positive voltage for lo-Z (active) state 
|                  5- maximum negative voltage for lo-Z state 
|              Entries for lo-Z (active) state are included only if the limits
|              are different than in hi-Z state (3-state).
|
|              Negative voltage are referenced to GND.
|
|              Positive voltages are referenced to either the positive supply
|              rail or to GND, according to the following rules:
|
|                If POWER_Clamp_Reference=yes then the maximum positive
|                voltage for hi-Z state is referenced to [POWER Clamp 
|                Reference].
|                Otherwise it is referenced to GND.
|
|                If maximum voltages are specified for the lo-Z (active) state:
|                 If Pullup_Reference=yes, then the maximum positive voltage
|                 for the active state is referenced to [Pullup Reference].
|                 Otherwise it is referenced to GND.
| 
|              The last entries in the table are the static absolute maximum
|              voltages. 
|
|              When a waveform exceeds a static voltage, the simulator will 
|              set time=0, then check that the rest of the waveform is 
|              within the dynamic limits given in the table. 
|
| Other Notes: 
|
|           A) How to specify/calculate maximum current
|
|              It is not possible to directly specify the maximum applied
|              current. However, as the [Pullup], [POWER Clamp], [Pulldown]
|              and [GND Clamp] are known, the input impedance (R) can be 
|              calculated. Using Ohm's law, the maximum voltage which 
|              correspond to a maximum current is easily found (I=V/R).
|
|           B) What values to specify
|
|              When specifying limits, the component supplier might take
|              into account the following situations where the static
|              maximum ratings will be exceeded:
|
|              1) Reflections:
|                 - An over- or undershoot can last for less than 20ns.
|                 - If there are no clamping diodes, the buffer should
|                   tolerate applied voltages from -Vcc to 2Vcc (CMOS buffer)
|                 - If there are clamping diodes, the buffer should tolerate
|                   applied currents from -Vcc/Z to Vcc/Z (CMOS buffer),
|                   where Z is the track impedance. Usually Z > 40 ohms.
|
|              2) Power supply failure
|                 - In a multi-supply design (e.g. mixed 5V/3V bus), a
|                   buffer should tolerate excess applied voltages(dV)
|                   and currents(I) from the time its power supply fails until
|                   all connected outputs are disabled (time Tfail later).
|                       Tfail < 50us 
|                           I < 250mA 
|                          dV < 3.3V  (e.g. 5V buffer on mixed 5V/3V bus)
|
|                 Note: The simulator will assume that the section of the
|                 [POWER clamp] table above Vcc can be used (shifted?) for all
|                 values of supply voltage from 0 to Vcc.
|
|           C) Relationship with RAIL
|              
|              The RAIL standard allows for a single-value dynamic undershoot
|              and overshoot to be specified. A single value overshoot
|              value can be extracted from an IBIS file by averaging the
|              maximum voltage over a short timeframe e.g. 20 ns.
|
|           D) Examples
|
|              The example below could represent a CMOS output, with a
|              permanent clamping diode to GND, and a clamping diode to
|              Vcc in active state only:
|
[Maximum Voltage]
|
Pullup_reference=yes
POWER_clamp_reference=no
|
|   Time        Vpos(3-state)   Vneg(3-state)   Vpos(active)  Vneg(active)
     0              7              -2             2        -2
     20ns           7              -2             2        -2
     30ns           5.5            -1.5           1.5      -1.5
     50us           NA             -1             1        -1
    100us           5.5            -0.5           0.5      -0.5
 
|
***********************************************************************

ANALYSIS PATH/DATA THAT LED TO SPECIFICATION:

The manner in which absolute maximum ratings are given in paper databooks
is extremely conservative. Typically, the board designer is expected to
guarantee that the voltage V applied to a buffer be in the range
      -0.5V < V < Vcc+0.5V. (*)

Most board designers know that these limits are often exceeded in their
designs due to reflections, without any harm being done to the component.
They would however like to have real risks flagged by a simulator.

In multiple power supply designs (e.g. mixed 3.3V/5V), it is possible
to have "5V tolerant" 3.3V buffers. But what happens if one of the
power supply fails? The designer would like to know if it is sufficient
to disable all output buffers, and if so, within what time-frame.

Some suppliers specify the absolute max voltage as a function of Vcc,
others tolerate any voltage up to a limit (usually 7V), even if Vcc
is set to 0V. The sub-parameter POWER_Clamp_Reference allows this
distinction to be taken into account.

Some 3.3V CMOS components (e.g. 74LVCxxx, 74LCXxxx) have output clamping
diodes in the active state only.  Optional columns are included to allow
this fact be taken into account.

This proposal is simply an extension of the existing absolute maximum
ratings, with the additional parameter: time. Any supplier who wishes
to be "customer-unfriendly" by continuing to specify (*) can write:

[Maximum Voltage]
|
POWER_clamp_reference=yes
|
|   Time        Vpos(3-state)   Vneg(3-state)
     0              0.5             -0.5
   
 
***********************************************************************

ANY OTHER BACKGROUND INFORMATION:

This BIRD has been inspired by the PCI bus specification.
The relevant references are (Rev 2.0):

   4.2.1.3 Maximum AC ratings and Device Protection (5V)
   4.2.2.3 Maximum AC ratings and Device Protection (3.3V)
   4.3.2   Reset
 
***********************************************************************






From owner-ibis  Tue Jul  9 00:03:08 1996
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Date: Mon, 08 Jul 1996 23:50:55 -0700
To: ibis@vhdl.org
From: Kellee Crisafulli <kellee@hyperlynx.com>
Subject: How can an author get permission to use V1.1 IBIS

Greetings,

  An author writing a book on signal integrity contacted
me with interest in putting a copy of the IBIS V1.1 specification
in his book and on a CD ROM with the BOOK.

  He is sending me a copy of an agreement to release the specification
to his publisher.

  Could our newly elected Chairperson/ vice-chair authorize this?
Please let me know and I will forward the release form to you.

  I know we can't release V2.1, but it is my understanding that V1.1
is still totally in the public domain.





 
Have a great day...Kellee Crisafulli, HyperLynx Inc.


From owner-ibis  Tue Jul  9 08:29:58 1996
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Date: Tue, 09 Jul 96 08:05:00 PDT
From: Arpad Muranyi <Arpad_Muranyi@ccm.fm.intel.com>
Message-ID: <Tue, 09 Jul 96 08:16:43 PDT_3@ccm.fm.intel.com>
To: ibis@vhdl.org
Subject: Re: How can an author get permission to use V1.1 IBIS


Text item: 

Kellee,

It would be nice if he could get permission for the V2.1 for 
printing/publishing.  I believe in promoting the latest and greatest, and not 
something that is old and/or outdated.  By the time the book will appear, we 
might even have V3.0 ready...

Is there a way to arrange for that?

Arpad
============================================================================== 


Greetings,

  An author writing a book on signal integrity contacted
me with interest in putting a copy of the IBIS V1.1 specification
in his book and on a CD ROM with the BOOK.

  He is sending me a copy of an agreement to release the specification
to his publisher.

  Could our newly elected Chairperson/ vice-chair authorize this?
Please let me know and I will forward the release form to you.

  I know we can't release V2.1, but it is my understanding that V1.1
is still totally in the public domain.


Have a great day...Kellee Crisafulli, HyperLynx Inc.

Text item: External Message Header

The following mail header is for administrative use
and may be ignored unless there are problems.

***IF THERE ARE PROBLEMS SAVE THESE HEADERS***.

Subject: How can an author get permission to use V1.1 IBIS
From: Kellee Crisafulli <kellee@hyperlynx.com>
To: ibis@vhdl.org
Date: Mon, 08 Jul 1996 23:50:55 -0700
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From owner-ibis  Tue Jul  9 09:28:16 1996
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Date: Tue, 9 Jul 96 09:21 PDT
From: bob@icx.com ( Bob Ross)
To: ibis@vhdl.org, kellee@hyperlynx.com
Subject: Re:  How can an author get permission to use V1.1 IBIS

Kellee:

Please forward or have the author forward the release form to me.
I and EIA will review it.

As Arpad noted, Version 2.1 is the current ANSI/EIA-656 Standard
and the most appropriate one to publish.  EIA owns the copyright
to this, but as a policy, will allow republication of this in
various forms such as Vendor's manuals, books, etc.  A nominal
fee is required (which will go directly into the IBIS committee
account).

People who wish to republish ANSI/EIA-656 or portions of it 
can contact EIA directly:

  Patti Rusher, Director
  EIA/Electronic Information Group
  2500 Wilson Blvd.
  Arlington, VA 22201
  (703) 907-7545

We could allow republishing Version 1.1.  While it was established
as an official release, there have been text and other subtle
changes which render it almost as a working draft status for 
the preparation of the official Version 2.1 release.  We would
require a disclaimer that the official ANSI/EIA-656 Standard
contains substantial additions and changes over the Version 1.1
release.

Bob Ross
Chair, EIA/IBIS Committee
Interconnectix, Inc.


> Date: Mon, 08 Jul 1996 23:50:55 -0700
> To: ibis@vhdl.org
> From: Kellee Crisafulli <kellee@hyperlynx.com>
> Subject: How can an author get permission to use V1.1 IBIS
> Status: R

> Greetings,

>   An author writing a book on signal integrity contacted
> me with interest in putting a copy of the IBIS V1.1 specification
> in his book and on a CD ROM with the BOOK.

>   He is sending me a copy of an agreement to release the specification
> to his publisher.

>   Could our newly elected Chairperson/ vice-chair authorize this?
> Please let me know and I will forward the release form to you.

>   I know we can't release V2.1, but it is my understanding that V1.1
> is still totally in the public domain.





>  
> Have a great day...Kellee Crisafulli, HyperLynx Inc.




From owner-ibis  Tue Jul  9 11:29:28 1996
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Message-Id: <m0udhQR-000GjPC@icx.com>
Date: Tue, 9 Jul 96 11:22 PDT
From: bob@icx.com ( Bob Ross)
To: ibis@vhdl.org
Subject: IBIS Model Contact People

IBIS Committee:

I have put a slightly updated version of contacts.txt under /pub/ibis/roster
on vhdl.org to provide some direct contact names for IBIS models.

Bob Ross
Interconnectix, Inc.

From owner-ibis  Fri Jul 12 12:28:37 1996
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Date: Fri, 12 Jul 96 12:21 PDT
From: bob@icx.com ( Bob Ross)
To: ibis@vhdl.org
Subject: IBIS AGENDA 7/19/96

                       IBIS Open Forum Meeting Agenda 
                                for 7/19/96
 
                  Bridge Number    Reservation #   Passcode
                  (916) 356-9200   2-78903         6186335 

 All meetings are 8:00 AM to 9:55 AM Pacific Time.  When you call into the 
 meeting, ask for the IBIS Open Forum hosted by Will Hobbs and give the
 Reservation Number and Passcode.
 

 8:00 Check-In, Intros, Announcements                         Ross

      - Intros of New IBIS Participants, Meeting Quorum       Ross
      - Membership Update and Treasurers Report               Rusher
      - Review of Previous Meeting's Minutes (and ARs)        Ross
      - Miscellany/Announcements                              All
      - Press & Web Page Updates                              Huq, All
      - New Models Available, Library Update                  Powell, All
      - Opens for New Issues                                  All

 8:25 Administrative and Project Discussions
 
      IEC Express Funding Progress                            Rusher

      EE Times Article                                        Ross

      New Administrative Issues                               All

 8:35 Technical Discussion

      BIRD34.1 - STORED CHARGE EFFECT                         Ross

      BIRD35.1 - MULTI-STAGED OUTPUTS                         Ross
             
      BIRD36 - ELECTRICAL BOARD DESCRIPTION                   All

      BIRD37 - ENHANCEMENT TO THE PACKAGE MODEL SPEC.         All

      BIRD38 (EGG11) -  ABSOLUTE MAXIMUM VOLTAGE              Fitzpatrick

      SERIES RESISTANCE                                       Muranyi

      EGG10 -  PARSER TESTS  1-5                              Rokusek
        
      New Technical Issues                                    All

 9:50 Wrap Up and Next Meetings Plans                         Ross

 9:55 Sign Off
 



From owner-ibis  Tue Jul 16 08:14:01 1996
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Date: Tue, 16 Jul 96 08:07:49 PDT
From: huq@rockie.nsc.com (Syed Huq)
Message-Id: <9607161507.AA03868@rockie.nsc.com>
To: ibis@vhdl.org
Subject: Officer wanted !
Cc: huq@rockie.nsc.com

IBISfans:

As you may know already, new officers for the ANSI/EIA-656 were elected in the
last DAC(Las Vegas) IBIS summit. There was one position for 'secretary' that was
not filled. This is an official position and we need a volunteer from a member
company to fill this slot. A lot of exciting things are being planned to move the
IBIS standard towards version 3.0 and International standardization too. Since
we meet regularly through teleconferences, it is quite difficult to move along 
with this much needed 'vacant' officers slot.

This is an open invitation for any member company to jump in and volunteer for this
official ANSI/EIA-656 Secretary position. Bob Ross can fill in with responsibility
issues under this position if you are curious to know.

Join us for the July 19th meeting and let's take care of this issue. All out efforts
are very much team oriented and we can all help each other out with tasks.

Meeting are conducted in accordance with the EIA Legal Guides and EIA
Manual of Organization and Procedure.

See you ..

Regards,
Syed Huq
Vice-Chair ANSI/EIA-656
National Semiconductor Corp.

From owner-ibis  Fri Jul 19 15:03:27 1996
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Date: Fri, 19 Jul 1996 17:50:11 -0400 (EDT)
From: "Peivand F. Tehrani" <peivand@ee1-gw.ee.binghamton.edu>
To: Bob Ross <bob@icx.com>
Cc: ibis@vhdl.org
Subject:  Stored Charge
In-Reply-To: <m0uhKyg-000GjSC@icx.com>
Message-Id: <Pine.A32.3.91.960719172825.14114C-100000@EMLAB1.ee.binghamton.edu>
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Hello IBIS fans,

   I was reviewing the stored charge BIRD 34.1 . I have observed the
same glitch effect even with ESD diodes removed. So I think this glitch
is not just created by the stored charge in the diodes. This glitch can
easily be observed with a simple CMOS invertor with a fast (100 psec) 
ramp as the input of the invertor, I think this glitch is because of the 
stored charge in the depletion region of upper and lower devices.
  
   I will send a simple SPICE file that I have been using to simulate this
effect. The SPICE version which I am using runs into convergence problems
if I remove Cd1 capacitor. This capacitor presents the die capacitor in 
IBIS models. After the simulation the voltage at node 2 should be probed.

Best Regards,
Peivand Tehrani.


**************************SPICE file************************



Driver Device Transitions For Gate Transition 
*************************************************************
VDD 3 0 5
*************************************************************
M1   2   1    0   0   QN   L=1.5E-6   W=136.4E-6
M2   2   1    3   3   QP   L=1.5E-6   W=341E-6
*************************************************************
.MODEL QN NMOS(LEVEL=1 VTO=1.0 TOX=250E-10 NSUB=1E16 UO=500 ) 
.MODEL QP PMOS(LEVEL=1 VTO=-1.0 TOX=250E-10 NSUB=1E16 UO=200) 
*************************************************************
VIN1   1    0  PULSE(5 0 0 .01n 0 100E-9 1E-3)
*************************************************************
Cd1    2    0   4p 
R11    2    0   50
*************************************************************
.tran .001n 1n   
.END

From owner-ibis  Tue Jul 23 08:42:52 1996
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Date: Tue, 23 Jul 96 08:35 PDT
From: bob@icx.com ( Bob Ross)
To: ibis@vhdl.org
Subject: IBIS Minutes 7/19/96

 DATE: July 23, 1996

 SUBJECT: 7/19/96 EIA IBIS Open Forum Minutes
 
 VOTING MEMBERS AND 1996 PARTICIPANTS LIST:
 AMP                            Hank Herrmann*, Tim Minnick*, Russ Moser
 Cadence Design                 C. Kumar
 Contec CAE, Ltd.               Dileep Divekar*, Norio Matsui, Antonis Orphanou
 Cypress                        Bruce Wenniger
 Hewlett Packard, EEsof         Karl Kachigan, Henry Wu
 HyperLynx                      Kellee Crisafulli
 INCASES                        Olaf Rethmeier, Ralf Bruening
 Intel Corporation              Stephen Peters*, Will Hobbs, Arpad Muranyi*,
				John Keifer, Aaron Tang, Duane Quiet,
				[Donald Telian], Jim Kruchowski
 Interconnectix, Inc.           Bob Ross*, Chris Reid
 Meta-Software                  (Sanjay Gangal)
 Mitsubushi                     Tam Cao, Hoang Nguyen
 Motorola                       Ahmed Omer*
 National Semiconductor         Syed Huq*, Donald Snyder, Chune-Sin Yeh,
				Bill Aronson
 NCR (formerly ATT-GIS)         Dave Moxley*, Richard Mellitz
 NEC                            (Hiroshi Matsumoto),
 Quad Design                    Jon Powell*, Chris Rokusek
 Texas Instruments              Roger Cline, Ben Andresen, Sri Jandhyala,
				Tareq Shahwan, Dan Phipps
 Thomson-CSF/SCTF               (Jean LeBrun)
 UniCAD Canada Ltd.             Celso Faia*
 VLSI Technology                Dick Ulmer, Sung Oh, Swami Gangadharan,
				Daniel Kim, Tom Dockery, D.C. Sessions*,
                                Hrish Patel*
 Zuken-Redac                    (John Berrie)
 
 OTHER PARTICIPANTS IN 1996:
 Alcatel                        John Fitzpatrick
 Altera                         Vadim von Brzeski
 Apteq Design System            Dan FitzPatrick 
 Compaq                         Mark Leonard
 Digital Equipment Corp.        Jeff Chu*
 EIA                            Patti Rusher*
 IC Works                       Eric Chen
 Micron Technology              Brian Johnson                       
 MicroSim                       Ralph Perez
 Molex                          Gus Panella
 North Carolina State U.        (Michael Steer)
 Oki Semiconductor              Tom Chao
 Philips Semiconductor          Mike Magdaluyo
 Rockwell Collins               Thomas Thurman
 S3, Inc.                       Sarathy Sribhashyam, Phap Duong    
 Seimans Nixdorf                Arnaud Lacariere
 Symmetry                       Andy Hughes
 Tektronix, Inc.                Brock Hannibal
 TRW & Free Model Foundation    Robert Harrison
 Veribest                       Ian Dodd, David Wiens
 VTC, Inc.                      Bob Ward
 Zeelan Technology              George Opsahl

 In the list above, attendees at the meeting are indicated by *.  Principle
 members or other active members who have not attended are in parentheses.
 Participants who have joined another organization are in square brackets.

 Upcoming Meetings: The bridge numbers for future IBIS teleconferences are as 
 follows:

      Date       Bridge Number    Reservation #    Passcode  
      8/16/96    (916) 356-9200   2-88344          6838524  
      9/6/96     (916) 356-9200   2-88345          4511183 
			 
 All meetings are 8:00 AM to 9:55 AM Pacific Time.  We try to have agendas out 
 7 days before each open forum and meeting minutes out within 7 days after.  
 When you call into the meeting, ask for the IBIS Open Forum hosted by Will 
 Hobbs and give the reservation number and passcode.
 
 NOTE: "AR" = Action Required.
 
 -------------------------------- MINUTES -------------------------------------

 INTRODUCTIONS
 Hrish Patel joined for the first time from VLSI Technology to become familiar
 with IBIS, since he will be working on IBIS models.
  

 EIA MEMBERSHIP AND TREASURER'S REPORT
 Patti Rusher's June 30, 1996 report shows $10,468.  Several thousand dollars
 of DAC meeting and other item expenses are expected to show up in the July
 31, 1996 report.  Invoices are still being tracked for DEC and Veribest
 memberships.


 MINUTES REPORT, MISC.
 No change.  All AR's have been dealt with.
 

 MISCELLANY/ANNOUNCEMENTS
 Jon Powell has agreed to handle the system administrative aspect of the
 IBIS vhdl.org account (Membership additions, deletions, response to 
 problems, questions, and posting material) while Bob Ross is on vacation
 August 1 through August 13.


 PRESS AND WEB PAGE UPDATES
 Syed Huq plans to add links in the EIA/IBIS home page to public IBIS model
 databases that Jon Powell provided.  Jon has checked this out and they 
 appear good.  (Patti Rusher reports over 2500 hits on the EIA/IBIS home 
 page.)

 AR - Syed Huq activate links to Jon Powell's page from EIA/IBIS Home page.
  
 Jon Powell has requested that anyone who knows of additional IBIS models
 available on Web sites to forward information to him.

 (Late news - Brian Johnson of Micron Technology reports that Micron models
 are available on http://www.micron.com/cgi-bin/model.  A one-time registration
 is required; no password or username is needed.)


 NEW MODELS
 The new 200 MHz PentiumPro model files have been put in the Intel directory,
 replacing the previous models.

 Jon Powell reports receiving a pending Intel directory update from Michael
 Steer.  Jon will work with Arpad on current contents.  Anyone else who
 has updated information should work with Jon.

 
 OPENS FOR NEW ISSUES
 Stephen Peters - Prague Conference Report
 Bob Ross - Secretary Position
 Bob Ross - Specification Enhancements Discussion

 
 IEC EXPRESS FUNDING PROGRESS
 Patti Rusher reports further progress in helping fund an IBIS Express model
 needed for IEC progress.  DARPA funding should go to US organizations.
 EIA itself cannot accept funding, but an auxiliary corporation "EIA Server
 Corporation" may be able to accept and distribute money.  Patti needs to
 gather all of the standards funding requests including items from DIE into
 one comprehensive proposal.  She plans to draft a proposal next week for legal
 review.


 EE TIMES ARTICLE
 EE Times has requested through Patti Rusher an IBIS article for the Sept. 2
 issue signal-integrity special report.  Bob Ross, Jon Powell and Syed Huq
 are working on the article.  The article will be basic, but will provide more
 emphasis on IBIS model sources and utilities than in other overview articles.

  
 SECRETARY
 Bob Ross followed up on the need for the IBIS Secretary position to be
 filled.  Stephen Peters suggested that the duties by split up.  Bob stated
 that the primary need is still to produce the minutes.  Several people
 already help out taking notes.  Bob will handle this aspect of the Secretary
 position until someone else volunteers.


 PRAGUE CONFERENCE
 Stephen Peters and Will Hobbs attended a European CAD Standards Conference
 from July 6 - 12, 1996.  They presented "Applying Standards to Increase 
 Model Availability - Two Case Studies, IBIS and OMF".  They took the model 
 supplier point of view.  HDL, AVHDL, Vital and OMF generated the most
 interest.

 They also had a opportunity to discuss Express funding with Hilary Kahn.
 The cost estimates remain the same.
 

 EDIF REVIEW
 Bob Ross reports he is working with Alan Williams of the University of
 Manchester concerning reporting passive R, L, C element values to simulators,
 per the IBIS Committee technical comment.

 
 BIRD34.1 - STORED CHARGE EFFECT
 Bob Ross summarized the primary assumptions that the proposed transit time
 format is similar to the Spice TT diode parameter and that the clamping 
 diodes produce the major effect in the clamping regions.  D.C. Sessions
 stated that many clamping diodes are MOS, not bipolar.  He is investigating
 the significance of this difference.  So the voltage dependent capacitor
 may be appropriate to support all technologies.  Further discussion is
 expected on BIRD34.1.

 AR - Anyone with information on stored charge effects in MOS devices provide
 it to D.C. Sessions.


 BIRD35.1 - MULTI-STAGED OUTPUTS
 Bob Ross summarized the [Rising Sequence] and [Falling Sequence] tables.
 Jon Powell reviewed the revised syntax and suggests further simplification
 based on calling stages by Model name.  This avoids introducing the numbered
 table extensions in Bob's proposal.  One concern is to truly isolate those
 subparameters which apply for the combined model, versus those that apply
 to the individual stage.  The "master driver" could still be used to 
 capture all models and parameters and sequencing in one area to avoid
 scattering the information throughout a .ibs file.

 Stephen Peters suggested a composite [Rising Waveform] and [Falling Waveform]
 be provided.  Jon stated, that if this were done, it would be for checking
 only since it contains less information than the detail needed by individual
 stages.

 AR - Bob Ross work with Jon Powell concerning syntax changes and produce
 BIRD35.2.


 BIRD36 - ELECTRICAL BOARD DESCRIPTION
 Since Stephen Peters had just returned, discussion on this was deferred.
 Bob Ross commented that he had talked with and agreed with Hank Herrmann
 on most of the points that Hank had raised.  One point of disagreement 
 regarded putting an actual (large) size limit on the number of external
 pins.  


 BIRD37 - ENHANCEMENT OT THE PACKAGE MODEL SPECIFICATION
 Bob Ross asked whether it was ready for vote.  Jon Powell suggested that
 votes on BIRDs be announced in the agenda since there are a number of
 technical issues to review.

 Bob wanted to check that new FORK term did not use the "/" terminator, 
 reserved only for the "Len .... /" syntax.  Hank Herrmann suggested the NC
 addition.  However, same functionality is provided using "Len = 0 /" null
 element.  Bob suggested that BIRD37 include the approved BIRD28.3 example
 and add the FORK subparameter to fully illustrate the syntax extension.   

 AR - Stephen Peters provide an upgraded BIRD37.1 which addresses these
 concerns for vote at the next meeting.


 BIRD38 (EGG11) - ABSOLUTE MAXIMUM VOLTAGE
 Jon Fitzpatrick was not present, so discussion was deferred.  Bob Ross 
 felt that this is a very complex specification BIRD needing further discussion.
 The extensions would definitely be optional.


 EGG10 - PARSER ADDITIONS FOR NUMERICAL CHECKING
 Bob Ross acknowledged getting the statistical data from Chris Rokusek concerning
 IBIS parameters on models stored on vhdl.org.  Chris now needs to examine
 this and provide proposed values for the parser tests 1-5.

 AR - Chris Rokusek propose tests and test limit values.  

 Stephen Peters asked whether these tests would be for Version 3.0.  Bob
 indicated that this has not been decided.  They could also be an upgrade
 to ibischk2.  Some comparison tests should be very easy.  Others such as
 those that test compatibility of V/T table voltages with V/I tables could
 require computational work.


 SERIES RESISTOR
 Arpad Muranyi discussed further the series element ideas.  It could be a
 controlled 3-terminal device with a set of tables, similar to transistor
 device characterizations.  One of the major needs is for "Quick Switch" (e.g.,
 CBT technology from Texas Instruments) devices which can connect or disconnect
 paths.  The MOS on path may be 1 to 10 ohms, but there may be additional
 analog characteristics.  Current electrical simulators do not include digital
 control logic, so Jon Powell felt the focus should be more on 2-terminal
 series elements with, perhaps, a 3.3 V and 5 V mode.  Series elements can
 include diodes, resistors, EMI filters, etc.  So, some form of I/V tables may
 still be needed.  The devices could also be modeled with an off and an on
 state.  Currently there is no IBIS support in this area.  The only EDA vendor
 support uses their own syntax.  While the Electrical Board Extensions could be
 used, a direct, simpler method is more appropriate.  

 AR - Arpad Muranyi provide a proposal in order to continue this as an agenda
 item.


 SPECIFICATION PARAMETER ENHANCEMENTS
 Bob Ross indicated that BIRD38 dealt with Specification data similar to
 Vinh and Vinl and not electrical characterization data.  There have been
 a number of requests for specification parameters, and such extensions
 are on the priority list for Version 3.0.  Bob asked for ideas.

 Ahmed Omer stated that an input delta-time limit is needed for the input
 thresholds to assure maximum energy limits are not exceeded.  

 AR - Ahmed Omer make a proposal for dealing with these energy limit.

 Bob added hystersis thresholds, CMOS style input thresholds that are a 
 percentage of Vcc, and overshoot (high and low) limits are possible 
 additions.  

 On both the input and output sides, the reference points for signal
 integrity and timing measurements can be at the DIE or at the PAD for
 different applications.  Also, timing references may be at the PAD, but
 signal integrity references may be at the DIE for standard devices, but
 at the PAD for ASICs.

 Jon Powell suggested that a committee similar to the package committee
 be formed off-line to collect the parameters.  Bob Ross plans to initiate
 a proposal.


 NEXT MEETING:
 The next meeting is on Friday, August 16, 1996, 8:00 A.M. to 9:55 A.M., four
 weeks from now because of some conflicting commitments.  BIRD37.1 is
 scheduled for vote.
 ==============================================================================
				       NOTES
 
 IBIS CHAIR: Bob Ross (503) 603-2523, Fax (503) 639-3469
	     bob@icx.com
	     Modeling Engineer, Interconnectix, Inc.
	     10220 SW Nimbus Ave, K4, Portland, OR 97223

 VICE CHAIR: Syed Huq (408) 721-4874, Fax: (408) 721-4785
	     huq@rockie.nsc.com
	     Staff Applications Engineer, National Semiconductor, M/S A-2595
	     2900 Semiconductor Drive, Santa Clara, CA 95052
 
 LIBRARIAN:  Jon Powell (805) 988-8250, Fax: (805) 988-8259
	     jonp@qdt.com
	     Transmission-Line Products Manager, Quad Design
	     1385 Del Norte Rd., Camarillo, CA 93010
 
 SECRETARY:  Vacant
 

 This meeting was conducted in accordance with the EIA Legal Guides and EIA
 Manual of Organization and Procedure.
 
 The following e-mail addresses are used:

   ibis-request@vhdl.org
       To join, change, or drop from either the IBIS Open Forum Reflector
       (ibis@vhdl.org), the IBIS Users' Group Reflector (ibis-users@vhdl.org)
       or both.  State your request.

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       To obtain general information about IBIS, to ask specific questions
       for individual response, and to inquire about joining the EIA-IBIS
       Open Forum as a full Member.

   ibis@vhdl.org
       To send a message to the general IBIS Open Forum Reflector.  This
       is used mostly for IBIS Standardization business and future IBIS
       technical enhancements.

   ibis-users@vhdl.org
       To send a message to the IBIS Users' Group Reflector.  This is 
       used mostly for IBIS clarification, current modeling issues, and
       general user concerns.

   ibischk-bug@vhdl.org
       To report ibischk2 parser bugs.  The Bug Report Form Resides on
       vhdl.org in /pub/ibis/bugs/bugform.txt along with reported bugs.

 Information on IBIS technical contents, IBIS participants, and actual
 IBIS models are available on the IBIS Home page found by selecting the
 Electronic Information Group under:

   http://www.eia.org

 Check the pub/ibis directory on vhdl.org for more information on previous 
 discussions and results.  You can get on via ftp anonymous, "guest" login from 
 telnet or dial-in (415-335-0110), or send an e-mail request to the automatic 
 archive server, archive@vhdl.org.
 
 "IBIS Spoken Here" placards are available from Jon Powell (jonp@qdt.com) for 
 use at trade shows.
 ==============================================================================


From owner-ibis  Tue Jul 23 10:50:46 1996
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Date: Tue, 23 Jul 96 10:34:00 PDT
From: Arpad Muranyi <Arpad_Muranyi@ccm.fm.intel.com>
Message-ID: <Tue, 23 Jul 96 10:40:50 PDT_1@ccm.hf.intel.com>
To: ibis@vhdl.org
Subject: Re: Stored Charge by Peivand Tehrani

Peivand,

I looked at your simulation example, and I think that you are referring to a 
phenomena as the "glitch" which is unrelated to the "kickback effect", commonly 
associated with the charge storage effects (discussed in BIRD34) of clamping 
diodes, ESD structures, etc.

In my opinion the glitch you are observing is related to the parasitic 
capacitances between Drain-Source, Gate-Source, and Gate-Drain.  When the gate 
voltage of the inverter begins to switch, there is a time period when none of 
the output transistors are (fully) on.  The changing voltage on the gate bleeds 
through the parasitic capacitances to the output untill the transistor to be 
turned on gets turned on.  Since we are talking about an inverter, this causes a
glitch that goes the opposite direction of the intended edge.  If you try to 
reproduce the same effect with a "voltage follower" circuit, you will see that 
the "glitch" will go in the same direction with the intended edge.

Arpad Muranyi
Intel Corporation
================================================================================



Author:  owner-ibis@vhdl.vhdl.org at SMTPGATE
Date:    7/19/96  5:50 PM
Priority: Normal
TO: bob@icx.com at SMTPGATE
CC: ibis@vhdl.org at SMTPGATE
BCC: Arpad Muranyi at FMCCM28
Subject: Stored Charge
------------------------------- Message Contents -------------------------------
Hello IBIS fans,

   I was reviewing the stored charge BIRD 34.1 . I have observed the
same glitch effect even with ESD diodes removed. So I think this glitch
is not just created by the stored charge in the diodes. This glitch can
easily be observed with a simple CMOS invertor with a fast (100 psec)
ramp as the input of the invertor, I think this glitch is because of the
stored charge in the depletion region of upper and lower devices.

   I will send a simple SPICE file that I have been using to simulate this
effect. The SPICE version which I am using runs into convergence problems
if I remove Cd1 capacitor. This capacitor presents the die capacitor in
IBIS models. After the simulation the voltage at node 2 should be probed.

Best Regards,
Peivand Tehrani.


**************************SPICE file************************



Driver Device Transitions For Gate Transition
*************************************************************
VDD 3 0 5
*************************************************************
M1   2   1    0   0   QN   L=1.5E-6   W=136.4E-6
M2   2   1    3   3   QP   L=1.5E-6   W=341E-6
*************************************************************
.MODEL QN NMOS(LEVEL=1 VTO=1.0 TOX=250E-10 NSUB=1E16 UO=500 )
.MODEL QP PMOS(LEVEL=1 VTO=-1.0 TOX=250E-10 NSUB=1E16 UO=200)
*************************************************************
VIN1   1    0  PULSE(5 0 0 .01n 0 100E-9 1E-3)
*************************************************************
Cd1    2    0   4p
R11    2    0   50
*************************************************************
.tran .001n 1n
.END


From owner-ibis  Tue Jul 23 11:27:39 1996
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Date: Tue, 23 Jul 96 11:20 PDT
From: bob@icx.com ( Bob Ross)
To: ibis@vhdl.org
Subject: Stored Charge by Peivand Tehrani

Peivand and IBIS Committee:

I tried your sample MOS Spice model regarding stored charge.  There
is a small negative preshoot glitch below zero volts before the
output rises to the high state.  For several reasons I believe that
these effects are related to the normal distribution of model
elements.  (Similar comment as Arpad's, which I just received.)

Bob Ross
Interconnectix, Inc.


From owner-ibis  Tue Jul 23 11:30:17 1996
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Date: Tue, 23 Jul 1996 11:19:36 -0700
Message-Id: <9607231819.AA22245@sedona>
To: ibis@vhdl.org
Subject: Re: Stored Charge by Peivand Tehrani
Mime-Version: 1.0
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Content-Transfer-Encoding: 7bit
Content-Md5: JidMHpIh+2bLnjk/FvhLeg==

Arpad,

I agree with you. 
I believe what Peivand saw is a well-known Miller effect, which
is related to the gate to drain capacitance of the CMOS inverter.

Sung

 >>From owner-ibis@vhdl.vhdl.org Tue Jul 23 11:03 MST 1996
 >>Date: Tue, 23 Jul 96 10:34:00 PDT
 >>From: Arpad Muranyi <Arpad_Muranyi@ccm.fm.intel.com>
 >>To: ibis@vhdl.org
 >>Subject: Re: Stored Charge by Peivand Tehrani
 >>
 >>Peivand,
 >>
 >>I looked at your simulation example, and I think that you are referring to a 
 >>phenomena as the "glitch" which is unrelated to the "kickback effect", 
commonly 
 >>associated with the charge storage effects (discussed in BIRD34) of clamping 
 >>diodes, ESD structures, etc.
 >>
 >>In my opinion the glitch you are observing is related to the parasitic 
 >>capacitances between Drain-Source, Gate-Source, and Gate-Drain.  When the 
gate 
 >>voltage of the inverter begins to switch, there is a time period when none of 
 >>the output transistors are (fully) on.  The changing voltage on the gate 
bleeds 
 >>through the parasitic capacitances to the output untill the transistor to be 
 >>turned on gets turned on.  Since we are talking about an inverter, this 
causes a
 >>glitch that goes the opposite direction of the intended edge.  If you try to 
 >>reproduce the same effect with a "voltage follower" circuit, you will see 
that 
 >>the "glitch" will go in the same direction with the intended edge.
 >>
 >>Arpad Muranyi
 >>Intel Corporation
 
>>==============================================================================
==
 >>
 >>
 >>
 >>Author:  owner-ibis@vhdl.vhdl.org at SMTPGATE
 >>Date:    7/19/96  5:50 PM
 >>Priority: Normal
 >>TO: bob@icx.com at SMTPGATE
 >>CC: ibis@vhdl.org at SMTPGATE
 >>BCC: Arpad Muranyi at FMCCM28
 >>Subject: Stored Charge
 >>------------------------------- Message Contents 
-------------------------------
 >>Hello IBIS fans,
 >>
 >>   I was reviewing the stored charge BIRD 34.1 . I have observed the
 >>same glitch effect even with ESD diodes removed. So I think this glitch
 >>is not just created by the stored charge in the diodes. This glitch can
 >>easily be observed with a simple CMOS invertor with a fast (100 psec)
 >>ramp as the input of the invertor, I think this glitch is because of the
 >>stored charge in the depletion region of upper and lower devices.
 >>
 >>   I will send a simple SPICE file that I have been using to simulate this
 >>effect. The SPICE version which I am using runs into convergence problems
 >>if I remove Cd1 capacitor. This capacitor presents the die capacitor in
 >>IBIS models. After the simulation the voltage at node 2 should be probed.
 >>
 >>Best Regards,
 >>Peivand Tehrani.
 >>
 >>
 >>**************************SPICE file************************
 >>
 >>
 >>
 >>Driver Device Transitions For Gate Transition
 >>*************************************************************
 >>VDD 3 0 5
 >>*************************************************************
 >>M1   2   1    0   0   QN   L=1.5E-6   W=136.4E-6
 >>M2   2   1    3   3   QP   L=1.5E-6   W=341E-6
 >>*************************************************************
 >>.MODEL QN NMOS(LEVEL=1 VTO=1.0 TOX=250E-10 NSUB=1E16 UO=500 )
 >>.MODEL QP PMOS(LEVEL=1 VTO=-1.0 TOX=250E-10 NSUB=1E16 UO=200)
 >>*************************************************************
 >>VIN1   1    0  PULSE(5 0 0 .01n 0 100E-9 1E-3)
 >>*************************************************************
 >>Cd1    2    0   4p
 >>R11    2    0   50
 >>*************************************************************
 >>.tran .001n 1n
 >>.END
 >>

From owner-ibis  Tue Jul 23 14:02:49 1996
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From: Arpad Muranyi <Arpad_Muranyi@ccm.fm.intel.com>
Message-ID: <Tue, 23 Jul 96 13:53:04 PDT_4@ccm.fm.intel.com>
To: ibis@vhdl.org
Subject: Re[2]: Stored Charge by Peivand Tehrani


Text item: 

Sung, Peivand, and IBIS fans,

Here is a simulation example for what I wrote about in my previous EMAIL.  I did
two things to Peivand's original simulation example:

1)  Added a voltage-follower circuit, which is an N-channed pullup.  A 50 Ohm
    resistor is connected between its output and GND.  Observe nodes 10 and 20
    (Gate and Source).
2)  Added a CAPOP parameter and a bunch of 0 values to turn of all (or most?)
    capacitance modeling that is given by HSPICE automatically.

(I am using HSPICE here).

To see the glitch with the non-inverting output, plot nodes 10 and 20.  Notice 
that the glitch goes in the same direction as the output is switching, that is, 
rising edge output causes a positive glitch.  (In Peivand's example the glitch 
goes negative while the output is going positive).  However, in both cases, the 
glitches follow the direction of the input signal.  This proves that the glitch 
is related the input signal through parasitic capacitances.

To see that these glitches go away without parasitic capacitance, uncomment the 
lines starting with "+ CAPOP ... " in both .MODEL statements.  The glitches 
should go away completely.

Arpad


Driver Device Transitions For Gate Transition
*************************************************************
.tran .001n 3.0n
.OPTIONS POST=1
VDD  3  0  DC=5.0V
*************************************************************
VIN1   1    0  PULSE (5 0  1.0ns 0.01ns 0.01ns 100E-9 1E-3)
M1   2   1    0   0   QN   L=1.5E-6   W=136.4E-6
M2   2   1    3   3   QP   L=1.5E-6   W=341E-6
*Cd1    2    0   4p
R11    2    0   50
*-----------------------------------------------------------*
VIN10  10   0    PULSE (0  5  1.0ns 0.01ns 0.01ns 100E-9 1E-3)
M10    3    10  20   0   QN   L=1.5E-6   W=136.4E-6
R10    20   0   50
*************************************************************
.MODEL QN NMOS(LEVEL=1 VTO=1.0 TOX=250E-10 NSUB=1E16 UO=500 )
*+ CAPOP=0 CF1=0 CF2=0 CF3=0 CF4=0 CF5=0 CF6=0 CGBEX=0
.MODEL QP PMOS(LEVEL=1 VTO=-1.0 TOX=250E-10 NSUB=1E16 UO=200)
*+ CAPOP=0 CF1=0 CF2=0 CF3=0 CF4=0 CF5=0 CF6=0 CGBEX=0
*************************************************************
*************************************************************
.END


----------------------------------------------------------------------
Arpad,

I agree with you.
I believe what Peivand saw is a well-known Miller effect, which
is related to the gate to drain capacitance of the CMOS inverter.

Sung
----------------------------------------------------------------------
 >>Hello IBIS fans,
 >>
 >>   I was reviewing the stored charge BIRD 34.1 . I have observed the
 >>same glitch effect even with ESD diodes removed. So I think this glitch
 >>is not just created by the stored charge in the diodes. This glitch can
 >>easily be observed with a simple CMOS invertor with a fast (100 psec)
 >>ramp as the input of the invertor, I think this glitch is because of the
 >>stored charge in the depletion region of upper and lower devices.
 >>
 >>   I will send a simple SPICE file that I have been using to simulate this
 >>effect. The SPICE version which I am using runs into convergence problems
 >>if I remove Cd1 capacitor. This capacitor presents the die capacitor in
 >>IBIS models. After the simulation the voltage at node 2 should be probed.
 >>
 >>Best Regards,
 >>Peivand Tehrani.
 >>
 >>
 >>**************************SPICE file************************
 >>
 >>
 >>
 >>Driver Device Transitions For Gate Transition
 >>*************************************************************
 >>VDD 3 0 5
 >>*************************************************************
 >>M1   2   1    0   0   QN   L=1.5E-6   W=136.4E-6
 >>M2   2   1    3   3   QP   L=1.5E-6   W=341E-6
 >>*************************************************************
 >>.MODEL QN NMOS(LEVEL=1 VTO=1.0 TOX=250E-10 NSUB=1E16 UO=500 )
 >>.MODEL QP PMOS(LEVEL=1 VTO=-1.0 TOX=250E-10 NSUB=1E16 UO=200)
 >>*************************************************************
 >>VIN1   1    0  PULSE(5 0 0 .01n 0 100E-9 1E-3)
 >>*************************************************************
 >>Cd1    2    0   4p
 >>R11    2    0   50
 >>*************************************************************
 >>.tran .001n 1n
 >>.END
 >>

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From owner-ibis  Wed Jul 24 08:49:18 1996
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From: "Peivand F. Tehrani" <peivand@ee1-gw.ee.binghamton.edu>
To: Arpad Muranyi <Arpad_Muranyi@ccm.fm.intel.com>
Cc: ibis@vhdl.org
Subject: Re[3]: Stored Charge by Peivand Tehrani
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Arpad, Bob and Sung,
 
  This is a good observation, my point was that the "glitch" exists
and may propagate along a signal line. As arpad has shown, depending 
on the value of the parasitic capacitors, the loading and the gate
risetime, magnitude of this glitch will change.
  This effect is a device property and although it is small, in order 
to get accurate device simulation, it has to be modeled.
  The[xxxxing waveform]s can only provide the magnitude of this glitch 
under a certain loading condition. Note that in the invertor case, the
glitch causes the buffer low to high transition trajectory (id(m1)-id(m2) 
vs. v(2)) to jump out of the device [pullup] and [pulldown] I/V 
characteristics. This is dynamic effect and without knowing the exact 
gate transition waveform (which is the case in IBIS), the values of the
parasitic capacitors can not be extracted from the provided information.
  The glitch has a current associated with it which is provided by either
one of upper and lower devices. Without knowing the value of the parasitic
caps. it is hard to divide this current between the devices.
  Do you have any suggestions as to how I can approach this problem using
the provided IBIS information?
  
Best regards
peivand 

From owner-ibis  Thu Jul 25 12:09:01 1996
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Date: Thu, 25 Jul 96 11:53:00 PDT
From: Arpad Muranyi <Arpad_Muranyi@ccm.fm.intel.com>
Message-ID: <Thu, 25 Jul 96 11:59:27 PDT_3@ccm.fm.intel.com>
cc: ibis@vhdl.org
Subject: Re[4]: Stored Charge by Peivand Tehrani


Text item: 

Peivand,

Your observation is correct.  The problem is that this is a difficult phenomena 
to model behaviorally (as far as I know).  However, in my opinion, this effect 
is rather small, so I would not worry too much about it in system level 
simulations.

If you think this an important issue and it needs to be addressed by the IBIS 
standard, bring it up for discussion in one of the future open forum meetings.  
If it turns out that many people would like to see a solution for it, we might 
work out a way to model it.

Arpad
================================================================================
Arpad, Bob and Sung,

This is a good observation, my point was that the "glitch" exists
and may propagate along a signal line. As arpad has shown, depending
on the value of the parasitic capacitors, the loading and the gate
risetime, magnitude of this glitch will change.

This effect is a device property and although it is small, in order
to get accurate device simulation, it has to be modeled.

The[xxxxing waveform]s can only provide the magnitude of this glitch
under a certain loading condition. Note that in the invertor case, the
glitch causes the buffer low to high transition trajectory (id(m1)-id(m2)
vs. v(2)) to jump out of the device [pullup] and [pulldown] I/V
characteristics. This is dynamic effect and without knowing the exact
gate transition waveform (which is the case in IBIS), the values of the
parasitic capacitors can not be extracted from the provided information.

The glitch has a current associated with it which is provided by either
one of upper and lower devices. Without knowing the value of the parasitic
caps. it is hard to divide this current between the devices.

Do you have any suggestions as to how I can approach this problem using
the provided IBIS information?

Best regards
peivand

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Subject: Re[3]: Stored Charge by Peivand Tehrani
Cc: ibis@vhdl.org
To: Arpad Muranyi <Arpad_Muranyi@ccm.fm.intel.com>
From: "Peivand F. Tehrani" <peivand@ee1-gw.ee.binghamton.edu>
Date: Wed, 24 Jul 1996 11:34:58 -0400 (EDT)
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To: ibis@vhdl.org
Subject: Modeling Principles for Developers and Users
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"Everything should be made as simple as possible,
 but not any simpler."
 - Albert Einstein

"A model of a physical device is a mahtematical
 entity with precise laws relating its variables.
 The model is always distinct from the physical
 device, though its behavior ordinarily approximates
 that of the physical device represented. Thus a
 model is never strictly equivalent to the device
 it represents."
 - John Linvill

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Date: Wed, 31 Jul 96 15:22 PDT
From: bob@icx.com ( Bob Ross)
To: ibis@vhdl.org
Subject: EGG12 SPECIFICATION ADDITONS

To IBISians

(Since I will be on vacation through August 13, I will not be responding
to any comments on this.)

Here is a brief note to start discussion on Specification additions
to IBIS for Version 3.0

With respect to input thresholds, we currently support the model
subparameters:

  Vinl
  Vinh

They support fixed values of thresholds for all columns.  However,
some technologies have different thresholds for the min and max
columns.

So I propose adding the optional input thresholds

  Vinl_min
  Vinl_max

  Vinh_min
  Vinh_max

for the min and max columns.  This is similar to the V_fixture_min
and V_fixture_max extensions for [Rising Waveform] and [Falling
Waveform] keywords.

These additions solve the problem of thresholds being a percentage
of the voltage range (as in CMOS technology) and as an offset 
from a voltage rails (as in PECL).  In all cases, voltage values
need to be calculated.  This avoids new notation for percentage
threshold and offset threshold.

This does not deal with hystersis.

Other parameters for discussion include hard coded overshoot 
and undershoot values and selections of measurement locations
(die, pin).

Bob Ross
Interconnectix, Inc.


