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please change address from herb@hws1.ma30.bull.com

to herb@hws1.ma30.zds.com

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*  Herb Kaupp                      *
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*  Zenith Data Systems             *
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From owner-ibis  Mon Oct 21 09:50:46 1996
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From: dileep@contec.Apsimtech.COM (Dileep Divekar)
Message-Id: <9610211619.AA12459@contec13.contec.COM>
To: ibis@vhdl.org, ibis-users@vhdl.org
Subject: Comments on bird 35.2 - Multi-Staged Outputs
Cc: dileep@contec.Apsimtech.COM
X-Sun-Charset: US-ASCII

I have some general comments about this bird.

I think this makes the specification quite complex and
I was just wondering if we have some idea as to how many
IC manufacturers are willing spend the resources required
to provide this level of detail.

So far, ibis specification was simulator independent.
That is, it was possible to develop a model without
having to use a simulator and also, the model developer
could pretty much predict what the characteristics will be,
from a simulator. In this case, you have to run a simulator
to see what the output characteristcs are going to be. And then
you have to adjust various i-v curves without really having
any physical clue as to how to adjust these values.
I was just curious if any one has actually attempted to develop
such a model and if so, whether they will be willing to share
their experiences as to how they did it, how much time they
spent and finally what was the difference in the final signal
integrity results.

As a general philosophical comment, one has to realize that
one should be willing to give up a certain level of detail
if one wants to use the behavioral models with all the advantages
they offer. At some point, one has to say that we can take the
behavioral model only so far and it cannot do everything.
------------------------------------------------------------
Dileep Divekar
Applied Simulation Technology, Inc.
2188 Bering Drive
San Jose, CA 95131

Phone - (408)-434-0967 x 100
Fax   - (408)-434-1003
Email - dileep@apsimtech.com
------------------------------------------------------------

From owner-ibis  Mon Oct 21 17:13:13 1996
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Date: Mon, 21 Oct 96 16:49 PDT
From: chris@icx.com ( Chris Reid)
To: ibis-users@vhdl.org, ibis@vhdl.org
Subject: Bird 35.2

Arpad,

In support of Dileep's comments, is it possible to model the
multi-stage effect with V-T curves?  In other words, if we
already have a technique for capturing the significant effects
of multi-stage drivers we should not add another method to do
the same thing.

I don't know the answer to this question, but I would like
to see a demonstration of the correct answer one way or another.
If Ibis can't model these drivers then we do need a technique
to handle them.

Chris Reid


From owner-ibis  Mon Oct 21 16:43:29 1996
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Date: Mon, 21 Oct 96 14:42:00 PDT
From: Arpad Muranyi <Arpad_Muranyi@ccm.fm.intel.com>
Message-ID: <Mon, 21 Oct 96 16:30:09 PDT_6@ccm.fm.intel.com>
To: ibis@vhdl.org, ibis-users@vhdl.org
cc: dileep@contec.Apsimtech.COM
Subject: Re: Comments on bird 35.2 - Multi-Staged Outputs


Text item: 

Dileep,

You have a lot of good points in your opinion regarding BIRD 35.2.  However, I 
think that this BIRD is very important, because there are some new features in 
some of our buffers which could not be modeled without it.

The problem is that these features are not just minute accuracy differences, 
they are very important in terms of signal integrity.  Leaving them out might 
make the difference between making it or failing.  For that reason, I believe 
the user of those models will want to see those features being modeled.

Arpad Muranyi
Intel Corporation
================================================================================

I have some general comments about this bird.

I think this makes the specification quite complex and
I was just wondering if we have some idea as to how many
IC manufacturers are willing spend the resources required
to provide this level of detail.

So far, ibis specification was simulator independent.
That is, it was possible to develop a model without
having to use a simulator and also, the model developer
could pretty much predict what the characteristics will be,
from a simulator. In this case, you have to run a simulator
to see what the output characteristcs are going to be. And then
you have to adjust various i-v curves without really having
any physical clue as to how to adjust these values.
I was just curious if any one has actually attempted to develop
such a model and if so, whether they will be willing to share
their experiences as to how they did it, how much time they
spent and finally what was the difference in the final signal
integrity results.

As a general philosophical comment, one has to realize that
one should be willing to give up a certain level of detail
if one wants to use the behavioral models with all the advantages
they offer. At some point, one has to say that we can take the
behavioral model only so far and it cannot do everything.
------------------------------------------------------------
Dileep Divekar
Applied Simulation Technology, Inc.
2188 Bering Drive
San Jose, CA 95131

Phone - (408)-434-0967 x 100
Fax   - (408)-434-1003
Email - dileep@apsimtech.com
------------------------------------------------------------

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Cc: dileep@contec.Apsimtech.COM
Subject: Comments on bird 35.2 - Multi-Staged Outputs
To: ibis@vhdl.org, ibis-users@vhdl.org
Message-Id: <9610211619.AA12459@contec13.contec.COM>
From: dileep@contec.Apsimtech.COM (Dileep Divekar)
Date: Mon, 21 Oct 1996 09:19:21 +0800
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From owner-ibis  Tue Oct 22 20:40:04 1996
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From: scotts@actel.com (Scott Schlachter)
Message-Id: <9610230330.AA03124@ricky.sun_net>
To: ibis@vhdl.org, ibis-users@vhdl.org
Subject: R_Pad?

Hello IBIS folk,

I'm participating in my companies initial developement stages of 
generating IBIS files, and currently we are simultaniously 
investigating generating them from both actual silicon, as well
as from spice netlists.  Were new to this email list, so
please excuse us if this has been discussed:

I have searched all of the documents that I could find, including 
searching through the email archives, but we are still having
trouble answering this one question:  How do we deal with a 
Pad resistance (CMOS)... R_comp would have been perfect for this.  It
seems that those who asked about R_comp in the past were told
to figure it into the R_package (or R_pin).  However, when the data
is collected from real silicon without the package (using a tester's
probe leads directly on the die's I/O pads), any resistance between the 
I/O pad and the I/O buffer circuitry gets included...  So 
the test yeilds Pull-up and Pull-down data that includes an effective
R_comp.  For those who have designs with a built-in resistance between
your pad and your I/O circuitry, how did you deal with this since the
specs don't allow for R_comp, and including this resistance in the 
R_package is (seems) impossible?  

The thing that flagged us to this problem was that our Pull-down curve
(after subtracting the Power-clamp diode data from the initial pull-down
data) gets brought down to close to 0 current when there's about a diode 
voltage above Vcc on the pin  (in our initial SPICE testing where we 
included a resistance between the I/O circuitry and the Pad).

Thanks in advance,
-Scott Schlachter
 Actel Corporation
 Sunnyvale, CA

From owner-ibis  Wed Oct 23 07:30:08 1996
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From: nahum@msil.sps.mot.com (Nachum Rozen)
Message-Id: <9610231418.AA07452@msil.sps.mot.com>
To: ibis-users@vhdl.org
Subject: Sould IBIS reflect SPEC or actual silicon?


Hello IBIS folk:

   I've got a question regarding what IBIS file should reflect:
The actual silicon parameters or spec parameters?   

  This might seem an odd question but - lets consider the 
following case as an example:  Let say that some signal is able 
to drive currents up to 10mA (this is its electrical characteristic). 
Now because of elecromigration limmitations the alowable current 
in the spec is only 5mA.  In this case, what should the IBIS file
reflect - the 10mA (the actual silicon characteristic) or thr 5mA
(the SPEC limmitation)?

  Thanks in advace.

Nahum Rozen.
Motorola Semiconductors.

From owner-ibis  Wed Oct 23 08:39:16 1996
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From: Arpad Muranyi <Arpad_Muranyi@ccm.fm.intel.com>
Message-ID: <Wed, 23 Oct 96 08:26:19 PDT_14@ccm.fm.intel.com>
To: ibis-users@vhdl.org
Subject: Re: Sould IBIS reflect SPEC or actual silicon?


Text item: 

I would vote for the actual.  Think of a SPICE model.  What does that reflect?  
It will show you what the chip does, not what the spec says.

Arpad Muranyi
Intel Corporation
==============================================================================

Hello IBIS folk:

   I've got a question regarding what IBIS file should reflect:
The actual silicon parameters or spec parameters?

  This might seem an odd question but - lets consider the
following case as an example:  Let say that some signal is able
to drive currents up to 10mA (this is its electrical characteristic).
Now because of elecromigration limmitations the alowable current
in the spec is only 5mA.  In this case, what should the IBIS file
reflect - the 10mA (the actual silicon characteristic) or thr 5mA
(the SPEC limmitation)?

  Thanks in advace.

Nahum Rozen.
Motorola Semiconductors.

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Subject: Sould IBIS reflect SPEC or actual silicon?
To: ibis-users@vhdl.org
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From: nahum@msil.sps.mot.com (Nachum Rozen)
Date: Wed, 23 Oct 96 16:18:15+020
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From owner-ibis  Wed Oct 23 09:30:33 1996
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Date: Wed, 23 Oct 96 08:47 PDT
From: chris@icx.com ( Chris Reid)
To: ibis-users@vhdl.org
Subject: Sould IBIS reflect SPEC or actual silicon?

I agree with Arpad.

The IBIS model should reflect what the device actually does
because the board designer wants to know what actually happens
when he uses the device, not what the spec says should happen.

If there is a concern about possibly damaging the device then
undershoot and overshoot limits should be specified and tested.

Chris Reid



From owner-ibis  Wed Oct 23 09:06:10 1996
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Date: Wed, 23 Oct 96 08:53:00 PDT
From: Will Hobbs <Will_Hobbs@ccm.jf.intel.com>
Message-ID: <Wed, 23 Oct 96 08:55:15 PDT_1@ccm.jf.intel.com>
To: owner-ibis@vhdl.org, ibis@vhdl.org, ibis-users@vhdl.org
Subject: Re: R_Pad?


Text item: 

IBISians,

Pad resistance is generally encompassed in the R_package. I'm surprised if this 
isn't sufficient, given the vanishinly small value of the pad resistance and its
immediate interconnection to bonding wires. However, as a tribute to Arpad 
Muranyi, the technical father of IBIS, I think an R_pad keyword would be 
terrific. And perhaps I'm wrong about whether or not there is a technical reason
to break it out, so I'll defer to those who perceive a real need.

Will

Hello IBIS folk,

I'm participating in my companies initial developement stages of 
generating IBIS files, and currently we are simultaniously 
investigating generating them from both actual silicon, as well 
as from spice netlists.  Were new to this email list, so
please excuse us if this has been discussed:

I have searched all of the documents that I could find, including 
searching through the email archives, but we are still having 
trouble answering this one question:  How do we deal with a
Pad resistance (CMOS)... R_comp would have been perfect for this.  It 
seems that those who asked about R_comp in the past were told
to figure it into the R_package (or R_pin).  However, when the data 
is collected from real silicon without the package (using a tester's
probe leads directly on the die's I/O pads), any resistance between the 
I/O pad and the I/O buffer circuitry gets included...  So
the test yeilds Pull-up and Pull-down data that includes an effective 
R_comp.  For those who have designs with a built-in resistance between 
your pad and your I/O circuitry, how did you deal with this since the 
specs don't allow for R_comp, and including this resistance in the 
R_package is (seems) impossible?

The thing that flagged us to this problem was that our Pull-down curve 
(after subtracting the Power-clamp diode data from the initial pull-down 
data) gets brought down to close to 0 current when there's about a diode 
voltage above Vcc on the pin  (in our initial SPICE testing where we 
included a resistance between the I/O circuitry and the Pad).

Thanks in advance,
-Scott Schlachter
 Actel Corporation
 Sunnyvale, CA

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Subject: R_Pad?
To: ibis@vhdl.org, ibis-users@vhdl.org
Message-Id: <9610230330.AA03124@ricky.sun_net>
From: scotts@actel.com (Scott Schlachter)
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From owner-ibis  Wed Oct 23 09:53:49 1996
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To: ibis@vhdl.org, ibis-users@vhdl.org
Subject: R_Pad?
Date: Wed, 23 Oct 1996 09:43:04 -0700
From: Stephen Peters <speters@ichips.intel.com>


Hello Scott, and fellow IBISains:

    If I recall past conversations correctly, resistance 
between the pad and the active xsistors has been accounted 
for by including it's effects in the pullup and pullown curves.
At least, that is how I have done models before.  I'm
curious however -- do you see a reason why this resistance
should be called out seperatly?  It's a good question....

                    Regards,
                    Stephen Peters
                    Intel Corp.



Hello IBIS folk,

I'm participating in my companies initial developement stages of 
generating IBIS files, and currently we are simultaniously 
investigating generating them from both actual silicon, as well
as from spice netlists.  Were new to this email list, so
please excuse us if this has been discussed:

I have searched all of the documents that I could find, including 
searching through the email archives, but we are still having
trouble answering this one question:  How do we deal with a 
Pad resistance (CMOS)... R_comp would have been perfect for this.  It
seems that those who asked about R_comp in the past were told
to figure it into the R_package (or R_pin).  However, when the data
is collected from real silicon without the package (using a tester's
probe leads directly on the die's I/O pads), any resistance between the 
I/O pad and the I/O buffer circuitry gets included...  So 
the test yeilds Pull-up and Pull-down data that includes an effective
R_comp.  For those who have designs with a built-in resistance between
your pad and your I/O circuitry, how did you deal with this since the
specs don't allow for R_comp, and including this resistance in the 
R_package is (seems) impossible?  

The thing that flagged us to this problem was that our Pull-down curve
(after subtracting the Power-clamp diode data from the initial pull-down
data) gets brought down to close to 0 current when there's about a diode 
voltage above Vcc on the pin  (in our initial SPICE testing where we 
included a resistance between the I/O circuitry and the Pad).

Thanks in advance,
-Scott Schlachter
 Actel Corporation
 Sunnyvale, CA

From owner-ibis  Wed Oct 23 12:50:10 1996
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From: mellitz@eagle.ColumbiaSC.NCR.COM
>From: mellitz@eagle (Richard.Mellitz)
Content-Type: text
Message-Id: <9610231543.ZM17415@eagle>
Date: Wed, 23 Oct 1996 15:43:04 -0400
In-Reply-To: nahum@msil.sps.mot.com (Nachum Rozen)
        "Sould IBIS reflect SPEC or actual silicon?" (Oct 23,  4:18pm)
References: <9610231418.AA07452@msil.sps.mot.com>
X-Mailer: Z-Mail (2.1.4 02apr93)
To: ibis-users@vhdl.org
Subject: Re: Sould IBIS reflect SPEC or actual silicon?

I would think it also depends on whether you call the device that has been
subjected to electromigration defective. If not defective, then I vote for
using the lower current model for the weak case.  In short, the I feel the models
should reflect what will be put into products regardless of how you derive
them.

... Rich Mellitz, NCR
On Oct 23,  4:18pm, Nachum Rozen wrote:
> Subject: Sould IBIS reflect SPEC or actual silicon?
> 
> Hello IBIS folk:
> 
>    I've got a question regarding what IBIS file should reflect:
> The actual silicon parameters or spec parameters?   
> 
>   This might seem an odd question but - lets consider the 
> following case as an example:  Let say that some signal is able 
> to drive currents up to 10mA (this is its electrical characteristic). 
> Now because of electromigration limmitations the alowable current 
> in the spec is only 5mA.  In this case, what should the IBIS file
> reflect - the 10mA (the actual silicon characteristic) or thr 5mA
> (the SPEC limmitation)?
> 
>   Thanks in advace.
> 
> Nahum Rozen.
> Motorola Semiconductors.
>-- End of excerpt from Nachum Rozen



From owner-ibis  Thu Oct 24 11:23:21 1996
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Date: Thu, 24 Oct 96 11:14 PDT
From: bob@icx.com ( Bob Ross)
To: efboeckm@ingr.com, ibis-users@vhdl.org, ibis@vhdl.org
Subject: Re:  Rising Waveform Loading Effects

Ed:

Your concern about accuracy of IBIS models in simulation environments
is valid.  I do not want to get totally bogged down here in an 
accuracy debate, but I want to make a few points:

1. The IBIS models might be positioned at a higher level of abstraction
than Spice models.  IBIS models are based on actual measured or Spice
derived information.  So to the extent that the IBIS model is accurate
depends only on the source information.  IBIS models do not carry all
of the parameters that are contained in a Spice model.

2. IBIS models have performed very well in PCB design and simulation
environments.  The EDA vendors have algorithms which treat transmission
lines and vias and otehr effects very well.  Many times these elements
provide the dominant characteristics rather than the model details.

IBIS models are very suitable with large sized physical data bases (the
whole board) containing thousands of nets and many components.  Just
getting Spice models that are compatible (e.g., are of equal accuracy,
do not have conflicting options such as scaling factors, and are actually
available from the vendors, etc.) is in practice usually unrealistic.
Physical databases capture the layout of each net and locations of nearby
nets.  So board level analysis where random interactions can occur
is one area where IBIS models (or behavioral models in general) are
appropriate.

Spice analysis might be better for a detailed investigation of some
critical nets to validate a design or to really test some variations.
The network topology may be easier to describe here.

3. Regarding the Waveform extraction methodology, the objective is to
provide test loads which create the best model.  They need to be as
close as possible to the simulation enviroment.  In high speed applications
the transmission line load looks initially resistive, but may be at any
voltage from low state to high state (and beyond) based on the dynamic
reflection characteristics.  So I feel for CMOS technology that resistive
test loads to ground and Vcc of approximately 50 to 100 ohms (or whatever
the characteristic impedance) will provide the best model.  This set
spans the voltage range and provides the load resistance seen by the 
device.  Simulators properly handle any added capacitance and inductance
that is seen by the device.  

The IBIS mode architecture is a simplified representation of most 
devices for the purposes of modeling.  To the extent that the Spice model
architecture functions in the same manner, the IBIS model will be very
accurate.  A fixed percentage (such as 5%) accuracy when comparing
a Spice model and IBIS model directly under a test suite may not be
achieved, in my opinion, for many devices because of the internal non-linear
switching characteristics of actual Spice models (and devices).  However,
for timing and signal integrity analysis of real networks, the accuracy
is very good compared to a similar Spice analysis and measurements.

Best Regards,
Bob Ross
Interconnectix, Inc.

> Hello to all,

> I am concerned about the validity of using IBIS models for general
> printed circuit board signal analysis in an environment of various types
> of loads, transmission lines, vias, pads, connectors, various
> terminations, etc.

> According to the IBIS specification V2.1 dated Dec. 13, 1995,  for a
> rising waveform (for example), there are various loads specified as
> L_dut, R_dut, L_fixture, R_fixture, C_dut, and C_fixture.  In addition
> data is to be taken with the effects of C_comp included.  There is
> however no provision for generating curves with a transmission line load
> which is more typically the case, especially for high speed circuits. in
> actual circuit boards.

> It is well known however, that the ramp rate and levels reached will be
> affected by the loads. For example, changing  the values of R_fixture
> and V_fixture on a typical buffer. (The s2ibis2 program will generate
> different curves for different values of R_fixture, for example IBIS
> curves for  50 ohms and 100 ohms is generated from a command file that
> specified curves for 50 and 100 ohms.)

> My question is this:  If in an actual simulation environment we really
> have a different loading condition with transmission lines , vias, etc.,
> how can we legitimately use an IBIS model that was generated with a
> different lumped element loading condition ?

> I hope someone can help me to understand how the IBIS models will
> accurately produce the correct physical response with an arbitrary but
> realistic loading condition, different from the test fixture, at least
> to a level of accuracy close to that which would result from the
> original transistor level spice model, say within 5%.

> Ed Boeckmann,  "My comments reflect solely my own opinion!"
> Intergraph Corp.
> Huntsville AL 35894
> tel. (205)-730-6219
> fax (205)-730-6000
> email efboeckm@ingr.com





From owner-ibis  Fri Oct 25 13:55:12 1996
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To: bob@icx.com ( Bob Ross)
cc: efboeckm@ingr.com, ibis-users@vhdl.org, ibis@vhdl.org,
        brockh@mdhost.cse.tek.com
Subject: Re: Rising Waveform Loading Effects 
In-reply-to: Your message of "Thu, 24 Oct 1996 11:14:00 PDT."
             <m0vGUI4-000GjSC@icx.com> 
Date: Fri, 25 Oct 1996 13:43:49 -0700
From: Brock Hannibal <brockh@mdhost.cse.tek.com>


Hi all,

Let me add a thought. Ed Boeckman asks:

"I hope someone can help me to understand how the IBIS models will
accurately produce the correct physical response with an arbitrary but
realistic loading condition, different from the test fixture, at least
to a level of accuracy close to that which would result from the
original transistor level spice model, say within 5%."

I've found that board level simulation accuracy is difficult to quantify
as a percentage number. There are a number of contributing factors such
as etch width and thickness variations along the length of the interconnect
line, cross-section variations(dielectric thickness), dielectric constant
variation with frequency, humidity, temperature, etc. Most FR-4 type boards
are themselves about 10% components. Holding the boards to a tighter tolerance
is both expensive and difficult. 

It turns out that if the IBIS model is derived into a nominal resistive
load that is representative of the transmission line characteristic
impedance that the dominant effect in the simulation is usually the
transmission line formed by the interconnect. 

I have verified this by actual measurement in a number of cases. This is
not to say that the model is irrelevant, only that the model's  
output impedance curves and risetimes are not as critical as one might
think in predicting the performance of the system.

Brock Hannibal
Design Engineer
Tektronix, Inc.

From owner-ibis  Mon Oct 28 15:50:53 1996
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Date: Mon, 28 Oct 1996 09:10:36 -0800
From: Jon Powell <uunet!qdt.com!jonp@uunet.uu.net>
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To: Brock Hannibal <uunet!uunet!mdhost.cse.tek.com!brockh@uunet.uu.net>
Cc: Bob Ross <uunet!uunet!icx.com!bob@uunet.uu.net>,
        uunet!uunet!ingr.com!efboeckm@uunet.uu.net,
        uunet!uunet!vhdl.org!ibis-users@uunet.uu.net,
        uunet!uunet!vhdl.org!ibis@uunet.uu.net
Subject: Re: Rising Waveform Loading Effects
References: <199610252043.NAA07706@salope.cse.tek.com>
Content-Type: text/plain; charset=us-ascii
Content-Transfer-Encoding: 7bit

Brock Hannibal wrote:
> 
> Hi all,
> 
> Let me add a thought. Ed Boeckman asks:
> 
> "I hope someone can help me to understand how the IBIS models will
> accurately produce the correct physical response with an arbitrary but
> realistic loading condition, different from the test fixture, at least
> to a level of accuracy close to that which would result from the
> original transistor level spice model, say within 5%."
> 
> I've found that board level simulation accuracy is difficult to quantify
> as a percentage number. There are a number of contributing factors such
> as etch width and thickness variations along the length of the interconnect
> line, cross-section variations(dielectric thickness), dielectric constant
> variation with frequency, humidity, temperature, etc. Most FR-4 type boards
> are themselves about 10% components. Holding the boards to a tighter tolerance
> is both expensive and difficult.
> 
> It turns out that if the IBIS model is derived into a nominal resistive
> load that is representative of the transmission line characteristic
> impedance that the dominant effect in the simulation is usually the
> transmission line formed by the interconnect.
> 
> I have verified this by actual measurement in a number of cases. This is
> not to say that the model is irrelevant, only that the model's
> output impedance curves and risetimes are not as critical as one might
> think in predicting the performance of the system.
> 
> Brock Hannibal
> Design Engineer
> Tektronix, Inc.


I must disagree with this statement. Though accurate transmission line
characteristics are crucial for simulation, risetime and IV curve
accuracy is also important. The IV curve vs line impedance directly
determines the incident wave height (and thus incident switching and/or
number of round-trips to switch) and crosstalk and overshoot are a
function of risetime/falltime as much as line coupling and impedance.

Jon Powell
Quad Design

From owner-ibis  Mon Oct 28 18:14:12 1996
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To: Jon Powell <uunet!qdt.com!jonp@uunet.uu.net>
cc: Brock Hannibal <uunet!uunet!mdhost.cse.tek.com!brockh@uunet.uu.net>,
        Bob Ross <uunet!uunet!icx.com!bob@uunet.uu.net>,
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Subject: Re: Rising Waveform Loading Effects 
In-reply-to: Your message of "Mon, 28 Oct 1996 09:10:36 PST."
             <3274E90C.3F54BC7E@qdt.com> 
Date: Mon, 28 Oct 1996 17:01:28 -0800
From: Brock Hannibal <brockh@mdhost.cse.tek.com>


Hi all,

Well Jon, I don't think we fundamentally disagree. It's more a matter of degree.
For instance, if I can hold tolerance of characteristic Z, losses, L and C of
vias, L and C of package pins, stability of power supplies, etc. to really
tight tolerances then I can make use of extremely accurate IBIS models which
have V@t curves which are derived into my known load. Unfortunately all these
other factors are extremely difficult to hold to tight tolerances. All I
was saying was that an IBIS model derived into a resistive load is probably
sufficient for most signal integrity work. 

The current crop of IBIS models are a far cry from being accurate enough 
to really predict the kinds of things Jon is talking about, but many of
them are good enough to ensure that I don't drastically mis-terminate
the transmission lines on my boards.

Another question to think about: do Ibis models derived from Spice models
really have the kind of accuracy that Jon needs?

Brock Hannibal
Design Engineer
Tektronix, Inc.

Jon Powell says,

>I must disagree with this statement. Though accurate transmission line
>characteristics are crucial for simulation, risetime and IV curve
>accuracy is also important. The IV curve vs line impedance directly
>determines the incident wave height (and thus incident switching and/or
>number of round-trips to switch) and crosstalk and overshoot are a
>function of risetime/falltime as much as line coupling and impedance.

>Brock Hannibal wrote:
>> 
>> Hi all,
>> 
>> Let me add a thought. Ed Boeckman asks:
>> 
>> "I hope someone can help me to understand how the IBIS models will
>> accurately produce the correct physical response with an arbitrary but
>> realistic loading condition, different from the test fixture, at least
>> to a level of accuracy close to that which would result from the
>> original transistor level spice model, say within 5%."
>> 
>> I've found that board level simulation accuracy is difficult to quantify
>> as a percentage number. There are a number of contributing factors such
>> as etch width and thickness variations along the length of the interconnect
>> line, cross-section variations(dielectric thickness), dielectric constant
>> variation with frequency, humidity, temperature, etc. Most FR-4 type boards
>> are themselves about 10% components. Holding the boards to a tighter tolerance
>> is both expensive and difficult.
>> 
>> It turns out that if the IBIS model is derived into a nominal resistive
>> load that is representative of the transmission line characteristic
>> impedance that the dominant effect in the simulation is usually the
>> transmission line formed by the interconnect.
>> 
>> I have verified this by actual measurement in a number of cases. This is
>> not to say that the model is irrelevant, only that the model's
>> output impedance curves and risetimes are not as critical as one might
>> think in predicting the performance of the system.
>>

From owner-ibis  Tue Oct 29 06:34:53 1996
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Date: Tue, 29 Oct 1996 08:23:10 -0600
From: schumach@flare.convex.com (Richard A. Schumacher)
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To: brockh@mdhost.cse.tek.com, uunet!qdt.com!jonp@uunet.uu.net
Subject: Re: Rising Waveform Loading Effects
Cc: <uunet!uunet!icx.com!bob@uunet.uu.net>,
        <uunet!uunet!mdhost.cse.tek.com!brockh@uunet.uu.net>,
        Bob@mdhost.cse.tek.com, Brock@mdhost.cse.tek.com,
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        uunet!uunet!vhdl.org!ibis-users@uunet.uu.net,
        uunet!uunet!vhdl.org!ibis@uunet.uu.net


The current crop of IBIS models are a far cry from being accurate enough 
to really predict the kinds of things Jon is talking about, but many of
them are good enough to ensure that I don't drastically mis-terminate
the transmission lines on my boards.

	One almost does not need any models for that, IBIS or otherwise.
	If a simulator will not provide 200 mV and 500 psec accuracy 
	while simulating a situation complex enough to be non-intuitive
	then it's hardly worth the trouble.


Another question to think about: do Ibis models derived from Spice models
really have the kind of accuracy that Jon needs?

	I don't know. How do we know how accurate such IBIS models
	are? That uncertainty is why I'm not rushing to embrace IBIS
	as a substitute for SPICE or measurement-derived I-V curves 
	in simulation. When a vendor is willing to make direct 
	comparisions between simulations (using their own nominal 
	SPICE models, measured I-V curves and IBIS models) and 
	measurements of actual circuits, and demonstrate at least 
	200 mV/500 psec accuracy, then I'll start to have some 
	confidence. Such simulations must address realistic situations
	in multiple cases (heavy vs light loading, lumped vs 
	transmission line environments), and not merely 50 pF - 500 
	ohm test cases. Until then I'll continue to press vendors 
	for SPICE models or I-V curves, or generate my own. 


	Richard Schumacher

	I do not speak in any capacity for the Convex Division of the
	Hewlett Packard Company.

From owner-ibis  Tue Oct 29 11:14:14 1996
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Date: Tue, 29 Oct 96 10:39:00 PST
From: Arpad Muranyi <Arpad_Muranyi@ccm.fm.intel.com>
Message-ID: <Tue, 29 Oct 96 11:01:10 PST_15@ccm.fm.intel.com>
To: ibis-users@vhdl.org, ibis@vhdl.org
Subject: Re: Bird 35.2


Text item: 

Chris,


Probably not.  I have thought about modeling it with the V-t curves also.  I am 
frugal also, so I wouldn't want to add new syntax if we don't have to...

I was talking about two different features.  One of them would probably need 
that BIRD, but the other one might need something other than BIRD35.  I am not 
sure though, since I have not spent too much time on this yet.

For the time being, I am just following the conversation.

Arpad
================================================================================


Arpad,

In support of Dileep's comments, is it possible to model the
multi-stage effect with V-T curves?  In other words, if we
already have a technique for capturing the significant effects
of multi-stage drivers we should not add another method to do
the same thing.

I don't know the answer to this question, but I would like
to see a demonstration of the correct answer one way or another.
If Ibis can't model these drivers then we do need a technique
to handle them.

Chris Reid

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Subject: Bird 35.2
To: ibis-users@vhdl.org, ibis@vhdl.org
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From: Arpad Muranyi <Arpad_Muranyi@ccm.fm.intel.com>
Message-ID: <Tue, 29 Oct 96 10:57:34 PST_4@ccm.fm.intel.com>
To: ibis@vhdl.org, ibis-users@vhdl.org
Subject: Re: R_Pad?


Text item: 

Scott,

I agree with Stephen Peters, that the pad resistance is included in the I-V 
curves of the pullup and/or pulldown structures.

This is similar to the resistive properties of the diodes.  A pure diode I-V 
curve is exponential, and if you plot that equation, you will see currents in 
the Giga and Tera Ampere magnitude already at 1 Volt of forward bias.  The diode
equation in text books refers to junction voltage, not terminal voltage, and 
there is a significant series resistance between the junction and the terminals.

I have seen many SPICE models that ignore the resistive properties of the ESD 
diodes, yielding such large currents at 1 Volt of over or undershoot.  So much 
for the accuracy of the SPICE models... 

Real diodes do not have such I-V curves, they usually start out exponentially, 
but then straighten out when the resistive properties begin to limit the 
current.  So, between 1 and 5 volts of forward bias (if the device lets this) 
you would get a more or less linear I-V curve with a few Ohms slope.  Just like 
we don't separate this resistance, I don't think we need to separate the pad 
resistance.  It just simply modifies the shape of the transistor I-V curves.

Also, in most cases the effect of the pad resistance is so small that I don't 
think it would be noticable by just eyeballing the curve (in contrary to the 
diode example above).  From your EMAIL, it seems to me that you might have a 
different problem, if the pad resistance seemed to make such a big difference, 
or if the subtraction made an almost 0 pulldown curve.  I would be glad to help 
you with that problem, but you would have to supply more information.  (Your 
IBIS model might have beed incorrectly done also).

I hope this helps,

Arpad Muranyi
Intel Corporation
================================================================================

Hello Scott, and fellow IBISains:

    If I recall past conversations correctly, resistance
between the pad and the active xsistors has been accounted
for by including it's effects in the pullup and pullown curves.
At least, that is how I have done models before.  I'm
curious however -- do you see a reason why this resistance
should be called out seperatly?  It's a good question....

                    Regards,
                    Stephen Peters
                    Intel Corp.



Hello IBIS folk,

I'm participating in my companies initial developement stages of
generating IBIS files, and currently we are simultaniously
investigating generating them from both actual silicon, as well
as from spice netlists.  Were new to this email list, so
please excuse us if this has been discussed:

I have searched all of the documents that I could find, including
searching through the email archives, but we are still having
trouble answering this one question:  How do we deal with a
Pad resistance (CMOS)... R_comp would have been perfect for this.  It
seems that those who asked about R_comp in the past were told
to figure it into the R_package (or R_pin).  However, when the data
is collected from real silicon without the package (using a tester's
probe leads directly on the die's I/O pads), any resistance between the
I/O pad and the I/O buffer circuitry gets included...  So
the test yeilds Pull-up and Pull-down data that includes an effective
R_comp.  For those who have designs with a built-in resistance between
your pad and your I/O circuitry, how did you deal with this since the
specs don't allow for R_comp, and including this resistance in the
R_package is (seems) impossible?

The thing that flagged us to this problem was that our Pull-down curve
(after subtracting the Power-clamp diode data from the initial pull-down
data) gets brought down to close to 0 current when there's about a diode
voltage above Vcc on the pin  (in our initial SPICE testing where we
included a resistance between the I/O circuitry and the Pad).

Thanks in advance,
-Scott Schlachter
 Actel Corporation
 Sunnyvale, CA

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From: Stephen Peters <speters@ichips.intel.com>
Date: Wed, 23 Oct 1996 09:43:04 -0700
Subject: R_Pad?
To: ibis@vhdl.org, ibis-users@vhdl.org
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From owner-ibis  Tue Oct 29 14:39:37 1996
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From: dileep@contec.Apsimtech.COM (Dileep Divekar)
Message-Id: <9610292211.AA19636@contec13.contec.COM>
To: ibis@vhdl.org, ibis-users@vhdl.org
Subject: Re: R_Pad?
Cc: dileep@contec.Apsimtech.COM
X-Sun-Charset: US-ASCII

Arpad Muranyi, Intel Corporation wrote:
 
> I have seen many SPICE models that ignore the resistive properties of the ESD 
> diodes, yielding such large currents at 1 Volt of over or undershoot.  So much 
> for the accuracy of the SPICE models... 
> 

Please do not get confused between the model EQUATIONS and model PARAMETERS.
SPICE diode model equations have the provision for specifying the parasitic
resistance. Of course, if it is not specified in the model PARAMETERS,
it can produce large currents. IBIS models will exhibit similar unrealistic
behavior if the parasitic resistance is not taken into account while
making the ibis model from simulations. It is always possible to use a very
good model improperly to produce unrealistic results. SPICE is not to be
blamed for that.

------------------------------------------------------------
Dileep Divekar
Applied Simulation Technology, Inc.
2188 Bering Drive
San Jose, CA 95131

Phone - (408)-434-0967 x 100
Fax   - (408)-434-1003
Email - dileep@apsimtech.com
------------------------------------------------------------

From owner-ibis  Tue Oct 29 17:48:51 1996
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From: scotts@actel.com (Scott Schlachter)
Message-Id: <9610300138.AA06967@ricky.sun_net>
To: ibis@vhdl.org, ibis-users@vhdl.org
Subject: Re: R_Pad?
Cc: dileep@contec.Apsimtech.COM

Dileep and Arpad:

HSPICE will model the inherent CMOS diodes (D to Bulk) within the transistor 
model.  From what I can tell, there seems to be a fallback to this specification
of the model:  the diode saturation current equations do not appear to have
any way to include any parasitic resistance whatsoever.  I believe that you both 
have valid points here.  HSPICE can model the diode correctly, but it seems 
that the only way is to extract it from the said transistors, and model it 
seperately - a definate unexpected extra step.  When modeled this way, there 
is no problem assigning the appropriate parasitic impedances associated with 
the diodes.  However, in trying to keep the power and ground clamp diodes as 
being inherently modeled within the pull-up and pull-down transistors, there
seems to be a flaw with the HSPICE model.  Perhaps there is something that I'm 
overlooking with this, and if anyone knows how to deal with this in the
HSPICE transistor models, please respond.  Thanks,
-Scott Schlachter
 Actel Corporation 

 
> Arpad Muranyi, Intel Corporation wrote:
>  
> > I have seen many SPICE models that ignore the resistive properties of the ESD 
> > diodes, yielding such large currents at 1 Volt of over or undershoot.  So much 
> > for the accuracy of the SPICE models... 
> > 
> 
> Please do not get confused between the model EQUATIONS and model PARAMETERS.
> SPICE diode model equations have the provision for specifying the parasitic
> resistance. Of course, if it is not specified in the model PARAMETERS,
> it can produce large currents. IBIS models will exhibit similar unrealistic
> behavior if the parasitic resistance is not taken into account while
> making the ibis model from simulations. It is always possible to use a very
> good model improperly to produce unrealistic results. SPICE is not to be
> blamed for that.
> 
> ------------------------------------------------------------
> Dileep Divekar
> Applied Simulation Technology, Inc.
> 2188 Bering Drive
> San Jose, CA 95131
> 
> Phone - (408)-434-0967 x 100
> Fax   - (408)-434-1003
> Email - dileep@apsimtech.com
> ------------------------------------------------------------
> 

From owner-ibis  Wed Oct 30 08:42:00 1996
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From: Arpad Muranyi <Arpad_Muranyi@ccm.fm.intel.com>
Message-ID: <Wed, 30 Oct 96 08:29:17 PST_8@ccm.fm.intel.com>
To: ibis@vhdl.org, ibis-users@vhdl.org
cc: dileep@contec.Apsimtech.COM
Subject: Re[2]: R_Pad?


Text item: 

Scott,

There is no need to take out the parasitic diodes from the MOSFETs in order to 
model them correctly (i.e. to include their resistiveness).  You are right, that
the current equation itself does not include the resistance, but there is no 
need for it.  (If you included the resistance in the diode equation, you would 
end up with a transcendental equation which is a tough one to work with).

If you have access to an HSPICE manual, look up the RD, RDC, RS, RSC, etc. 
parameters.  Don't let yourself get confused that these are Drain and Source 
resistance numbers; the currents of parasitic diodes go through Drain, Source, 
and Bulk.  Notice that these resistances all default to zero.  This means that 
if someone doesn't specify them explicitly, there will be no resistive 
parasitics in the model.  (Which happens way to often, unfortunately).

Arpad
===============================================================================

Dileep and Arpad:

HSPICE will model the inherent CMOS diodes (D to Bulk) within the transistor
model.  From what I can tell, there seems to be a fallback to this
specification
of the model:  the diode saturation current equations do not appear to have
any way to include any parasitic resistance whatsoever.  I believe
that you both
have valid points here.  HSPICE can model the diode correctly, but it seems
that the only way is to extract it from the said transistors, and model it
seperately - a definate unexpected extra step.  When modeled this way, there
is no problem assigning the appropriate parasitic impedances associated with
the diodes.  However, in trying to keep the power and ground clamp diodes as
being inherently modeled within the pull-up and pull-down transistors, there
seems to be a flaw with the HSPICE model.  Perhaps there is something that I'm
overlooking with this, and if anyone knows how to deal with this in the
HSPICE transistor models, please respond.  Thanks,
-Scott Schlachter
 Actel Corporation


> Arpad Muranyi, Intel Corporation wrote:
>
> > I have seen many SPICE models that ignore the resistive properties
of the ESD
> > diodes, yielding such large currents at 1 Volt of over or undershoot.
 So much
> > for the accuracy of the SPICE models...
> >
>
> Please do not get confused between the model EQUATIONS and model PARAMETERS.
> SPICE diode model equations have the provision for specifying the parasitic
> resistance. Of course, if it is not specified in the model PARAMETERS,
> it can produce large currents. IBIS models will exhibit similar unrealistic
> behavior if the parasitic resistance is not taken into account while
> making the ibis model from simulations. It is always possible to use a very
> good model improperly to produce unrealistic results. SPICE is not to be
> blamed for that.
>
> ------------------------------------------------------------
> Dileep Divekar
> Applied Simulation Technology, Inc.
> 2188 Bering Drive
> San Jose, CA 95131
>
> Phone - (408)-434-0967 x 100
> Fax   - (408)-434-1003
> Email - dileep@apsimtech.com
> ------------------------------------------------------------
>

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Cc: dileep@contec.Apsimtech.COM
Subject: Re: R_Pad?
To: ibis@vhdl.org, ibis-users@vhdl.org
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From: scotts@actel.com (Scott Schlachter)
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From owner-ibis  Thu Oct 31 16:07:57 1996
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From: huq@rockie.nsc.com (Syed Huq)
Message-Id: <9610312357.AA24378@rockie.nsc.com>
To: ibis-users@vhdl.org
Subject: Open_drain and s2ibis(v1.3)
Cc: huq@rockie.nsc.com, slipa@eos.ncsu.edu

Hi,

I have been having some problems getting an Open_drain to work with
the s2ibis(Rev1.3). So I decided to check out the FAQ on NCSU website
and found the following
-----------------------------------------------------------------------------
QUESTION (7): "I'm having trouble getting s2ibis to deal with my open-drain 
               I/O pin!?!"
 
ANSWER:
       This is a problem with the IBIS v1.1 spec.  IBIS v1.1 sees open-drain
       pins as output only.  You need to go to a newer IBIS version.
----------------------------------------------------------------------------- 
My ouput is an I/O Open Drain. Since v1.1 does not support that, I tried to
model that as Open_drain only.

Has anyone run into this type of problems ? I think I can make it work by
manually editing the .spi file. 

Just wanted to know if anyone has a better work around ?

Regards
Syed
National Semiconductor Corp.

