RE: [IBIS] C_comp testing question

Joe,
 
You are getting different results for the different
slopes because C_comp is also frequency dependent
and the frequency content of the slopes are different.
 
I would suggest that you use the frequency domain method
described in the IBIS cookbook in section 3.3, pg. 20.
 
http://www.vhdl.org/pub/ibis/cookbook/cookbook-v4.pdf
 
I hope that helps, 
 
Arpad
================================================================================

________________________________

From: owner-ibis@server.eda-stds.org [mailto:owner-ibis@server.eda-stds.org] On Behalf Of Yu-Shen Yang
Sent: Wednesday, July 19, 2006 2:19 PM
To: ibis@server.eda.org
Subject: [IBIS] C_comp testing question


Hi All,
 
For C_comp testing, if the pad is connected to supply voltage with a huge resistor and then followed a low pass filter. How do we test c_comp? I use a slow triangular pulse as input and take average of several points.(C=I*dt/dV) However, the result is not equivalent when the slope of pulse is changed. Is there any better way to test this structure? 
 
Joe

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