Date: Mon Nov 13 2006 - 12:39:32 PST
Dear Madam or Sir: I have been tasked to collect empirical data on one of our parts. I/O Power_clamp, pull_up and Pull_down data collection According to the spec: It is permissible to use typical components and derated by voltage and temp and optionally apply the X% factor. Data can be derived form typical component measured over temp/voltage. What is meant by a typical part? 1. I have acquired 5 random parts from our inventory. I only need to test one part correct? 2. I will then run the Power_clamp, pull_up and Pull_down tests per the spec at Vin min Vin typ and Vin max room temp. 3. Repeat at min temp 4. Repeat at Hi temp. Am I interrupting this correctly? Keep in mind that I have never done modeling or simulations before. This is all new to me. Best Regards, Tim Kelpin Product Engineer Simtek Corporation WORK : (719)590-6546 HOME : (719) 651-2127 -------------------------------------------------------------------- |For help or to subscribe/unsubscribe, e-mail majordomo@eda-stds.org |with the appropriate command message(s) in the body: | | help | subscribe ibis <optional e-mail address, if different> | subscribe ibis-users <optional e-mail address, if different> | unsubscribe ibis <optional e-mail address, if different> | unsubscribe ibis-users <optional e-mail address, if different> | |or e-mail a request to ibis-request@eda-stds.org. | |IBIS reflector archives exist under: | | http://www.eda-stds.org/pub/ibis/email_archive/ Recent | http://www.eda-stds.org/pub/ibis/users_archive/ Recent | http://www.eda-stds.org/pub/ibis/email/ E-mail since 1993
