Characterization Conditions

From: Rob Eccles <rob.eccles@xilinx.com>
Date: Thu Dec 17 1998 - 09:54:34 PST

I have read with interest the latest version of the
IBIS cookbook. It details recommended characterization
conditions for simulating TTL, ECL, LVCMOS, etc. It
does not contain recommended conditions for measuring
newer I/Os, i.e. SSTL, HSTL, GTL, LVDS.

What are the recommended simulation conditions for these
I/Os?

Rob Eccles
Xilinx
rob.eccles@xilinx.com
Received on Thu Dec 17 10:00:16 1998

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